Notice
There is currently an issue with the citation download feature. Learn more

IEEE Design & Test of Computers

Issue 1 • Jan.-Feb. 2006

Filter Results

Displaying Results 1 - 21 of 21
  • [Front cover]

    Publication Year: 2006, Page(s): c1
    Request permission for commercial reuse | PDF file iconPDF (1264 KB)
    Freely Available from IEEE
  • Call for Papers

    Publication Year: 2006, Page(s): 1
    Request permission for commercial reuse | PDF file iconPDF (37 KB)
    Freely Available from IEEE
  • Table of contents

    Publication Year: 2006, Page(s):2 - 3
    Request permission for commercial reuse | PDF file iconPDF (515 KB)
    Freely Available from IEEE
  • Masthead

    Publication Year: 2006, Page(s): 4
    Request permission for commercial reuse | PDF file iconPDF (40 KB)
    Freely Available from IEEE
  • New beginnings, continued success

    Publication Year: 2006, Page(s):5 - 6
    Request permission for commercial reuse | PDF file iconPDF (168 KB) | HTML iconHTML
    Freely Available from IEEE
  • [Advertisement]

    Publication Year: 2006, Page(s): 7
    Request permission for commercial reuse | PDF file iconPDF (347 KB)
    Freely Available from IEEE
  • Automated source-level error localization in hardware designs

    Publication Year: 2006, Page(s):8 - 19
    Cited by:  Papers (24)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (192 KB) | HTML iconHTML

    Recent achievements in formal verification techniques allow for fault detection even in large real-world designs. Tool support for localizing the faulty statements is critical, because it reduces development time and overall project costs. Automated source-level debugging and a new and novel debugging model allow for source-level debugging of large VHDL designs at the granularity of statements and... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • MOSFET mismatch modeling: a new approach

    Publication Year: 2006, Page(s):20 - 29
    Cited by:  Papers (7)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (752 KB) | HTML iconHTML

    Digital and analog ICs generally rely on the concept of matched behavior between identically designed devices. Time-independent variations between identically designed transistors, called mismatch, affect the performance of most analog and even digital MOS circuits. This article focuses on the analysis of mismatch in MOS transistors resulting from random fluctuations of the dopant concentration, f... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Logic design for printability using OPC methods

    Publication Year: 2006, Page(s):30 - 37
    Cited by:  Papers (5)  |  Patents (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (696 KB) | HTML iconHTML

    The steps that create physical shape data in a typical logic device design-to-reticle flow are cell layout, place and route, tapeout, OPC or RET, data fracture, and reticle build. Here, we define OPC as the transformation of reticle data to compensate for lithographic and process distortions so that the final wafer pattern is as close to the target pattern-the designed layout-as possible. We defin... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Early, accurate dependability analysis of CAN-based networked systems

    Publication Year: 2006, Page(s):38 - 45
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (128 KB) | HTML iconHTML

    Many safety-critical applications today rely on computer-based systems in which several computing nodes communicate through a network backbone. As the complexity of the systems under analysis grows, designers must devise fault-injection models that strike a balance between two conflicting requirements: On the one hand, models should be as close as possible to a system's physical implementation to ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Source-synchronous testing of multilane PCI Express and HyperTransport buses

    Publication Year: 2006, Page(s):46 - 57
    Cited by:  Papers (11)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1512 KB) | HTML iconHTML

    This article presents a modular approach for testing multigigahertz, multilane digital devices with source-synchronous I/O buses. This approach is suitable for integration with existing ATE and can provide more than 100 independent differential-pair signals. We describe a specific application with 32 lanes of PCI Express, running at 2.5 gigabits per second (Gbps) per lane, and 32 data channels of ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Efficient parametric fault detection in switched-capacitor filters

    Publication Year: 2006, Page(s):58 - 66
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1088 KB) | HTML iconHTML

    Advances in technology and IC design techniques have allowed for sophisticated analog and digital functions in a single chip, in which switched-capacitor (SC) networks perform fundamental operations such as filtering and A/D and D/A conversion. As a result, considerable effort has gone into improving test coverage and testable circuit design in general and SC networks in particular. This article p... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Searching for clues: Diagnosing IC failures

    Publication Year: 2006, Page(s):67 - 68
    Request permission for commercial reuse | PDF file iconPDF (90 KB) | HTML iconHTML
    Freely Available from IEEE
  • Embedded systems and the kitchen sink

    Publication Year: 2006, Page(s):69 - 70
    Request permission for commercial reuse | PDF file iconPDF (168 KB) | HTML iconHTML
    Freely Available from IEEE
  • Conference Reports: 2005 International Test Conference

    Publication Year: 2006, Page(s): 71
    Request permission for commercial reuse | PDF file iconPDF (46 KB) | HTML iconHTML
    Freely Available from IEEE
  • 2006 IEEE Computer Society Professional Membership/Subscription Application

    Publication Year: 2006, Page(s):73 - 74
    Request permission for commercial reuse | PDF file iconPDF (399 KB)
    Freely Available from IEEE
  • IEEE Computer Society Digital Library Packages for Institutions

    Publication Year: 2006, Page(s): 75
    Request permission for commercial reuse | PDF file iconPDF (99 KB)
    Freely Available from IEEE
  • TTTC Newsletter

    Publication Year: 2006, Page(s):76 - 77
    Request permission for commercial reuse | PDF file iconPDF (29 KB)
    Freely Available from IEEE
  • DATC Newsletter

    Publication Year: 2006, Page(s): 78
    Request permission for commercial reuse | PDF file iconPDF (35 KB)
    Freely Available from IEEE
  • IEEE Computer Society Information

    Publication Year: 2006, Page(s): 79
    Request permission for commercial reuse | PDF file iconPDF (63 KB)
    Freely Available from IEEE
  • All about getting it

    Publication Year: 2006, Page(s): 80
    Request permission for commercial reuse | PDF file iconPDF (45 KB) | HTML iconHTML
    Freely Available from IEEE

Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty