Issue 4 • Date Dec. 2005
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Displaying Results 1 - 13 of 13
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Table of contents
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PDF (30 KB)
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IEEE Transactions on Reliability publication information
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PDF (37 KB)
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Optimal release time for software systems considering cost, testing-effort, and test efficiency
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PDF (408 KB)
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Optimal testing resource allocation, and sensitivity analysis in software development
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PDF (616 KB)
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Nonparametric bootstrapping of the reliability function for multiple copies of a repairable item modeled by a birth process
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PDF (240 KB)
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IEEE Transactions on Reliability information for authors
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PDF (51 KB)
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2005 Index
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PDF (113 KB)
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Explore IEL IEEE's most comprehensive resource
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PDF (341 KB)
Aims & Scope
IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.
Meet Our Editors
Editor-in-Chief
Way Kuo
University of Tennessee


