By Topic

IEEE Transactions on Reliability

Issue 4 • Date Dec. 2005

Filter Results

Displaying Results 1 - 13 of 13
  • Table of contents

    Publication Year: 2005, Page(s): c1
    Request permission for commercial reuse | PDF file iconPDF (30 KB)
    Freely Available from IEEE
  • IEEE Transactions on Reliability publication information

    Publication Year: 2005, Page(s): c2
    Request permission for commercial reuse | PDF file iconPDF (37 KB)
    Freely Available from IEEE
  • On some recent modifications of Weibull distribution

    Publication Year: 2005, Page(s):561 - 562
    Cited by:  Papers (25)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (77 KB) | HTML iconHTML

    Since the turn of the century, several papers have appeared in reliability journals (including the IEEE Transactions on Reliability) which claim to have proposed new modifications of the traditional Weibull distribution. It is pointed out here that the proposed distributions are either not new, or arise from a representation suggested by Gurvich et al. . A modification is suggested that contains a... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Reply to “On Some Recent Modifications of Weibull Distribution”

    Publication Year: 2005, Page(s): 563
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (24 KB) | HTML iconHTML

    First Page of the Article
    View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A generic model of equipment availability under imperfect maintenance

    Publication Year: 2005, Page(s):564 - 571
    Cited by:  Papers (28)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (320 KB) | HTML iconHTML

    This paper explores the impact of imperfect repair on the availability of repairable equipment. Kijima's first virtual age model is used to describe the imperfect repair process. Due to the complexity of the underlying assumptions of this model, we are unable to derive a closed-form equation for availability. Therefore, simulation modeling & analysis are used to evaluate equipment availability. Ba... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A new model for repairable systems with bounded failure intensity

    Publication Year: 2005, Page(s):572 - 582
    Cited by:  Papers (19)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (481 KB) | HTML iconHTML

    This paper proposes a new model, called the 2-parameter Engelhardt-Bain process (2-EBP) model, to describe the failure pattern of complex repairable systems subjected to reliability deterioration with the operating time, and showing a finite bound for the intensity function. The characteristics of the 2-EBP model are discussed, and the physical meaning of its parameters is derived. The 2-EBP model... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Optimal release time for software systems considering cost, testing-effort, and test efficiency

    Publication Year: 2005, Page(s):583 - 591
    Cited by:  Papers (48)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (408 KB) | HTML iconHTML

    In this paper, we study the impact of software testing effort & efficiency on the modeling of software reliability, including the cost for optimal release time. This paper presents two important issues in software reliability modeling & software reliability economics: testing effort, and efficiency. First, we propose a generalized logistic testing-effort function that enjoys the advantage of relat... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Optimal testing resource allocation, and sensitivity analysis in software development

    Publication Year: 2005, Page(s):592 - 603
    Cited by:  Papers (31)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (616 KB) | HTML iconHTML

    We consider two kinds of software testing-resource allocation problems. The first problem is to minimize the number of remaining faults given a fixed amount of testing-effort, and a reliability objective. The second problem is to minimize the amount of testing-effort given the number of remaining faults, and a reliability objective. We have proposed several strategies for module testing to help so... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Nonparametric bootstrapping of the reliability function for multiple copies of a repairable item modeled by a birth process

    Publication Year: 2005, Page(s):604 - 611
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (240 KB) | HTML iconHTML

    Nonparametric bootstrap inference is developed for the reliability function estimated from censored, nonstationary failure time data for multiple copies of repairable items. We assume that each copy has a known, but not necessarily the same, observation period; and upon failure of one copy, design modifications are implemented for all copies operating at that time to prevent further failures arisi... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A simple procedure for Bayesian estimation of the Weibull distribution

    Publication Year: 2005, Page(s):612 - 616
    Cited by:  Papers (36)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (760 KB) | HTML iconHTML

    Practical use of Bayesian estimation procedures is often associated with difficulties related to elicitation of prior information, and its formalization into the respective prior distribution. The two-parameter Weibull distribution is a particularly difficult case, because it requires a two-dimensional joint prior distribution of the Weibull parameters. The novelty of the procedure suggested here ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • IEEE Transactions on Reliability information for authors

    Publication Year: 2005, Page(s):617 - 618
    Request permission for commercial reuse | PDF file iconPDF (51 KB) | HTML iconHTML
    Freely Available from IEEE
  • 2005 Index

    Publication Year: 2005, Page(s):619 - 627
    Request permission for commercial reuse | PDF file iconPDF (113 KB)
    Freely Available from IEEE
  • Explore IEL IEEE's most comprehensive resource

    Publication Year: 2005, Page(s): 628
    Request permission for commercial reuse | PDF file iconPDF (341 KB)
    Freely Available from IEEE

Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu