IEEE Transactions on Reliability

Issue 5 • Dec 1991

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Displaying Results 1 - 19 of 19
  • An explicit solution for the number of minimal p-cutsequences in a consecutive-k-out of-n:F system

    Publication Year: 1991, Page(s):553 - 554
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (124 KB)

    R.C. Bollinger and A.A. Salvia (see ibid., vol. R-34, p. 43-5, Apr. 1985) proposed an approach to study the failure-time distribution of a consecutive-k-out-of-n:F system by studying the number of minimal p-cutsequences. They gave recursive equations to compute this number for independent identically distributed components. It is shown that the recursive equations have a... View full abstract»

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  • Estimators for type-II censored (log)normal samples

    Publication Year: 1991, Page(s):547 - 552
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (420 KB)

    Three common estimators for the parameters of the log-normal distribution are evaluated for censored samples. Correction factors which eliminate essentially all the bias, and formulas for the standard deviations of the estimators, are presented. It is reported that the Persson-Rootzen estimators are about as good as the maximum-likelihood estimators, without the penalty of requiring iterative (com... View full abstract»

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  • Optimum simple step-stress accelerated life-tests with competing causes of failure

    Publication Year: 1991, Page(s):622 - 627
    Cited by:  Papers (32)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (440 KB)

    Optimum simple step-stress accelerated life tests (ALTs) for products with competing causes of failure are presented. The life distribution of each failure cause, which is independent of the others, is assumed to be exponential with a mean that is a log-linear function of the stress, and a cumulative exposure model is assumed. Optimum plans for time-step and failure-step ALTs are obtained which mi... View full abstract»

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  • System failure-frequency analysis using a differential operator

    Publication Year: 1991, Page(s):601 - 609, 614
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (576 KB)

    A method for obtaining the failure frequency of any system whose structure function is coherent is introduced. The relationship of the availability to the failure frequency can be expressed as a unique differential operator. In this way, regardless of the form of expression, the failure frequency can be obtained by applying the differential operator to the availability expression. Some reduction t... View full abstract»

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  • Interval estimation of availability of a series system

    Publication Year: 1991, Page(s):541 - 546
    Cited by:  Papers (16)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (296 KB)

    For a system that consists of n independent subsystems connected in series, based on a sample of complete periods for each subsystem, an approximate interval estimate of the steady-state availability of the system is presented for three cases: when each lifetime and repair-time has an exponential distribution; when each lifetime has an exponential distribution and each repair-time has a l... View full abstract»

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  • Bayes estimation of hazard and acceleration in accelerated testing

    Publication Year: 1991, Page(s):615 - 621
    Cited by:  Papers (10)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (488 KB)

    In accelerated life testing, the time transformation function θ(t) is often unknown, even if that function is assumed to be linear. If θ(t) is known, data in the accelerated condition can be adjusted to provide information about the failure time distribution in the use condition. If θ(t) is unknown, the usual estimation procedures require data from the ... View full abstract»

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  • A probabilistic foundation for vagueness and imprecision in fault-tree analysis

    Publication Year: 1991, Page(s):563 - 571
    Cited by:  Papers (22)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (740 KB)

    Fault tree and reliability analyses frequently must rely on imprecise or vague input data. A theoretical framework, based on Dempster-Shafer theory (DST), that accommodates this vagueness and shows how imprecision can give rise to false-negative and false-positive inferences is proposed. DST assigns upper and lower bounds for the probability on elements of the state space. The author focuses on tw... View full abstract»

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  • Voting mechanisms in distributed systems

    Publication Year: 1991, Page(s):593 - 600
    Cited by:  Papers (15)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (528 KB)

    It is shown how voting mechanisms can be exploited to improve the reliability of decisions in a distributed system. A model of decision making in which several processors (nodes) are assigned to work independently on various aspects of a problem and each returns a binary answer to a coordinator node is assumed. The coordinator combines the answers, using a voting mechanism to arrive at a final ans... View full abstract»

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  • Confidence bounds for Pr{X>Y} in 1-way ANOVA random model

    Publication Year: 1991, Page(s):537 - 540
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (228 KB)

    Approximate confidence bounds for reliability, R=Pr{X >Y|X,Y}, are obtained, where X and Y are independent normal (Gaussian) random variables, and X and Y are vectors of measurements for X and Y, respectively. Balanced 1-way ANOVA (analysis of variants) random effect models are assumed for the po... View full abstract»

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  • A reliability model for connector contacts

    Publication Year: 1991, Page(s):513 - 523
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (900 KB)

    Connector contacts have a typical end-of-life behavior during accelerated life testing. A model that predicts the change in resistance (ΔR) for an aging contact is developed based on that behavior. The model shows that the duration of accelerated life tests can sometimes be reduced by up to 50%, resulting in substantial time and cost savings. Analysis of the model leads to several u... View full abstract»

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  • A heuristic approach to optimal assignment of components to a parallel-series network

    Publication Year: 1991, Page(s):555 - 558
    Cited by:  Papers (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (260 KB)

    In a parallel-series network the required n components are to be selected from the available m(⩾n) components and assigned to the n positions in the network with the objective of maximizing the reliability of the system. Any component can be assigned to any of the n positions, but the reliability of a component is affected by the position to which i... View full abstract»

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  • Counting the number of minimum cuts in undirected multigraphs

    Publication Year: 1991, Page(s):610 - 614
    Cited by:  Papers (10)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (372 KB)

    The problem of counting the number of cuts with the minimum cardinality in an undirected multigraph arises in various applications, such as testing the super-λ-ness of a graph, as described by F.T. Boesch (1986), and calculating upper and lower bounds on the probabilistic connectedness of a stochastic graph G in which edges are subject to failure. It is shown that the number |C... View full abstract»

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  • Estimation of network reliability using graph evolution models

    Publication Year: 1991, Page(s):572 - 581
    Cited by:  Papers (74)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (700 KB)

    Monte Carlo techniques for estimating various network reliability characteristics, including terminal connectivity, are developed by assuming that edges are subject to failures with arbitrary probabilities and nodes are absolutely reliable. The core of the approach is introducing network time-evolution processes and using certain graph-theoretic machinery, resulting in a considerable increase in a... View full abstract»

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  • Observation of electromigration at low temperature

    Publication Year: 1991, Page(s):524 - 530
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (788 KB)

    Electromigration and mean time-to-failure were investigated for unglassed thin Al stripes over the temperature range of 223 K to 347 K. Thermal effects are minimized by sinking heat from the linestrip through the substrate to a miniature cryogenic refrigerator. This test technique allows the investigation of structure and current interactions while suppressing the effects of an added temperature f... View full abstract»

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  • Optimal designs of {k,n-k+1}-out-of-n:F systems (subject to 2 failure modes)

    Publication Year: 1991, Page(s):559 - 562
    Cited by:  Papers (21)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (240 KB)

    The problem of achieving optimal system size (n) for {k,n-k+1}-out-of-n systems, assuming that failure may take either of two forms, is studied. It is assumed that components are independently identically distributed (i.i.d.) and that the two kinds of system failures can have different costs. The optimal k or n that maximizes mean syst... View full abstract»

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  • Reliability assessment based on accelerated degradation: a case study

    Publication Year: 1991, Page(s):499 - 506
    Cited by:  Papers (76)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (564 KB)

    An analysis strategy (experimental and analytic) for extracting reliability information from the measured degradation of devices subjected to elevated stress is described. The strategy is applied to the estimation of the reliability of an integrated logic family that is a component of a new generation of submarine cables. The experiment consisted of monitoring several electrical parameters while a... View full abstract»

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  • On computing reliability-measures of Boolean circuits

    Publication Year: 1991, Page(s):582 - 592
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (844 KB)

    Testability and reliability analyses of Boolean circuits require the computation of the following figures of merit: signal probability, detection probability, signal reliability, as well as signal detectability, signal maskability, and signal unreliability of two-rail and weighted self-checking circuits. The authors present a generic algorithm for computing these measures. Special cases of this ge... View full abstract»

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  • Material failure mechanisms and damage models

    Publication Year: 1991, Page(s):531 - 536
    Cited by:  Papers (87)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (632 KB)

    This work introduces a tutorial series on material failure mechanisms and damage models to familiarize nonspecialists with the fundamentals of failure mechanisms in engineering assemblies. Since failure is a complicated concept, four simple conceptual models for failure are discussed: stress-strength, damage-endurance, challenge-response, and tolerance-requirement. The specific failure mechanisms ... View full abstract»

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  • Estimating the reliability of electrical connectors

    Publication Year: 1991, Page(s):507 - 512
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (572 KB)

    Some current approaches to estimating the reliability of electrical contacts and connectors are discussed. These approaches center on the statistical analysis of test data and address the active degradation mechanisms, the determination of appropriate environmental tests with corresponding acceleration factors and exposures, the statistical analysis appropriate for the test data, and the establish... View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu