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Circuits and Devices Magazine, IEEE

Issue 5 • Date Sept.-Oct. 2005

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Displaying Results 1 - 21 of 21
  • An Analog Electronics Companion- Basic Circuit Design for Engineers and Scientists [Book Review]

    Publication Year: 2005 , Page(s): 25
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    Freely Available from IEEE
  • Switch fabrics

    Publication Year: 2005 , Page(s): 12 - 17
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (708 KB) |  | HTML iconHTML  

    We examined a spectrum of (unbuffered) switching architectures and explored various design alternatives, where each is marked by its own merits and drawbacks. A number of trade-offs between the various switching architectures in terms of their characteristics (such as performance, implementation complexity, scalability, and cost) emerge. Hence, the wide variety of available switching fabrics means that no single architecture emerges as the only winning proposition. The ultimate decision is upon the switch architect, based on the overall system design requirements and specifications. View full abstract»

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  • Inkjet revolution

    Publication Year: 2005 , Page(s): 8 - 11
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (1777 KB) |  | HTML iconHTML  

    The use of inkjet technology for the application of thin-film-transistor liquid-crystal display manufacturing. View full abstract»

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  • Advertisers Index

    Publication Year: 2005 , Page(s): 32
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  • Introduction to PSPICE Using Orcad for Circuits and Electronics, 3rd Edition [Book Review]

    Publication Year: 2005 , Page(s): 26
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  • Mobility enhancement

    Publication Year: 2005 , Page(s): 18 - 23
    Cited by:  Papers (10)  |  Patents (2)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (778 KB) |  | HTML iconHTML  

    This article is targeted as an introduction to the physics of strained Si and the current state of the art in uniaxial strained Si MOSFET. The first part of the article explains how strain alters the valence and conduction band of Si as well as scattering rates. This is followed by a review of state-of-the-art strained techniques being implemented in 90- and 65-nm process technologies. Finally, we conclude with a discussion of the future scalability of strained Si MOSFETs in the ballistic regime and nanoscale CMOS. View full abstract»

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  • Analog Circuits and Devices [Book Review]

    Publication Year: 2005 , Page(s): 24
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    Freely Available from IEEE
  • Electric and Hybrid Vehicles, Design Fundamentals [Book Review]

    Publication Year: 2005 , Page(s): 26 - 27
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  • Microelectronic Circuits [Book Review]

    Publication Year: 2005 , Page(s): 24 - 25
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  • VLSI Designer's interface

    Publication Year: 2005 , Page(s): 3 - 6
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  • ULSI Semiconductor Technology Atlas [Book Review]

    Publication Year: 2005 , Page(s): 25
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    Freely Available from IEEE
  • IEEE Circuits and Devices - Sept/Oct 2005

    Publication Year: 2005 , Page(s): 0_1
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  • Power to the people - IEEE Member Digital Library

    Publication Year: 2005 , Page(s): 02
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    Freely Available from IEEE
  • Table of contents - Vol. 21 No. 5

    Publication Year: 2005 , Page(s): 1
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  • Editor from Editor - The tell me what you want

    Publication Year: 2005 , Page(s): 2
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  • Expand your technology horizons - The Proceedings of the IEEE [advertisement]

    Publication Year: 2005 , Page(s): 7
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  • Conference Spotlight - 2005 IEEE International Electron Devices Meeting

    Publication Year: 2005 , Page(s): 28
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    Freely Available from IEEE
  • Conference calendar

    Publication Year: 2005 , Page(s): 29 - 30
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  • IEEE In4mation - Member subscriptions [advertisement]

    Publication Year: 2005 , Page(s): 31
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  • Brain teaser challenge

    Publication Year: 2005 , Page(s): 0_3
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  • IEEE is invention [advertisement]

    Publication Year: 2005 , Page(s): 04
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Aims & Scope

IEEE Circuits and Devices Magazine (1985-2006) covers the design, implementation, packaging, and manufacture of micro-electronic and photonic devices, circuits and systems

 

This Magazine ceased publication in 2006.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Dr. Ronald W. Waynant
r.waynant@ieee.org