Issue 3 • Date Sept. 2005
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Displaying Results 1 - 24 of 24
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Table of contents
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PDF (37 KB)
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IEEE Transactions on Reliability publication information
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PDF (32 KB)
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Parameter estimation for a modified Weibull distribution, for progressively type-II censored samples
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PDF (712 KB)
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The NBUT class of life distributions
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PDF (208 KB)
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Defect detection in analog and mixed circuits by neural networks using wavelet analysis
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PDF (408 KB)
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On constructing the minimum orthogonal convex polygon for the fault-tolerant routing in 2-D faulty meshes
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PDF (448 KB)
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Enhanced reliability of finite-state machines in FPGA through efficient fault detection and correction
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PDF (408 KB)
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Quality-reliability chain modeling for system-reliability analysis of complex manufacturing processes
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PDF (424 KB)
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Marginally monotonic maintenance policies for a multi-state deteriorating machine with probabilistic monitoring, and silent failures
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PDF (320 KB)
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New cumulative damage models for failure using stochastic processes as initial damage
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PDF (392 KB)
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Penalty function approach in heuristic algorithms for constrained redundancy reliability optimization
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PDF (464 KB)
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IEEE Transactions on Reliability information for authors
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PDF (51 KB)
Aims & Scope
IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.
Meet Our Editors
Editor-in-Chief
Way Kuo
University of Tennessee


