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IEEE Instrumentation & Measurement Magazine

Issue 3 • Date Aug. 2005

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Displaying Results 1 - 17 of 17
  • Synthetic instruments extract masked signal parameters

    Publication Year: 2005, Page(s):40 - 46
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (565 KB) | HTML iconHTML

    We have reviewed the signal conditioning required to obtain high-quality spectral measurements with an FFT-based spectrum analyzer. The conditioning includes data windowing and extended length. Folded windows are required at the input to the transform, and significant ensemble averaging of power spectrum and cross power spectrum at the output of the FFT is needed. We also commented on the effect o... View full abstract»

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  • How to produce better quality test software

    Publication Year: 2005, Page(s):34 - 38
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (507 KB) | HTML iconHTML

    LabWindows/CVI is a popular C compiler for writing automated test equipment (ATE) test software. Since C was designed as a portable assembly language, it uses many low-level machine operations that tend to be error prone, even for the professional programmer. Test equipment engineers also tend to underestimate the effort required to write high-quality software. Quality software has very few defect... View full abstract»

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  • Fault diagnosis in HVAC chillers

    Publication Year: 2005, Page(s):24 - 32
    Cited by:  Papers (17)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1255 KB) | HTML iconHTML

    In this article, we consider a data-driven approach for fault detection and isolation (FDI) of chillers in HVAC systems. To diagnose the faults of interest in the chiller, we employ multiway dynamic principal component analysis (MPCA), multiway partial least squares (MPLS), and support vector machines (SVMs). The simulation of a chiller under various fault conditions is conducted using a standard ... View full abstract»

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  • Future test systems architectures

    Publication Year: 2005, Page(s):16 - 21
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (497 KB) | HTML iconHTML

    The expanding number of test system architectural choices has caused confusion in the test engineering community. In this article, we explore the strengths and weaknesses of the existing test system architectures, including rack and stack systems with general-purpose interface bus (GPIB) instruments and modular systems. We provide a glimpse into an emerging new architecture: LAN-based test systems... View full abstract»

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  • DoD revamps testing organization

    Publication Year: 2005, Page(s):10 - 14
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (694 KB) | HTML iconHTML

    As a result of a GAO (general accounting office) audit, the U.S. Department of Defense (DoD) has designated the Navy as DoD's automatic test systems (ATS) ED, and a new joint ATS memorandum of agreement among the SAEs is in process. The DoD's policy for ATS acquisitions has remained fairly constant since its inception in 1994. However, emphasis has shifted to acquiring standard DoD ATS family test... View full abstract»

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  • Build better diagnostic decision trees

    Publication Year: 2005, Page(s):48 - 53
    Cited by:  Papers (2)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (909 KB) | HTML iconHTML

    Enhancing the ability to perform diagnostics on a system that has failed can significantly impact maintenance and repair costs. A good diagnostic tool enables a user to analyze a failed system and identify the failed components. While the field of diagnostics is not a modern one, the way in which system diagnostics are performed is continuously changing. The automatic diagnosis based on reliabilit... View full abstract»

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  • Welcone to AUTOTESTCON

    Publication Year: 2005, Page(s): 8
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  • AFDX-based flight test computer concept

    Publication Year: 2005, Page(s):55 - 58
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1310 KB) | HTML iconHTML

    With the introduction of the Airbus A380, the commercial aircraft industry was in the process of defining new standards that incorporate the latest digital information techniques, such as the avionics full-duplex switched Ethernet (AFDX) on-board, real-time network. The AFDX standard, a major innovation in aircraft technology first deployed on the Airbus A380, introduces telecom Ethernet-based tec... View full abstract»

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  • Advertising Index

    Publication Year: 2005, Page(s): 64
    Request permission for commercial reuse | PDF file iconPDF (49 KB)
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  • IEEE Instrumentation and Measurement Magazine - Aug 2005

    Publication Year: 2005, Page(s): 0_1
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    Freely Available from IEEE
  • Table of contents - Vol 8 No 3

    Publication Year: 2005, Page(s): 2
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    Freely Available from IEEE
  • Special issue and changes to the magazine [From the Editor's bench]

    Publication Year: 2005, Page(s): 4
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    Freely Available from IEEE
  • President's perspectives

    Publication Year: 2005, Page(s): 6
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    Freely Available from IEEE
  • Sensors'06 in New Orleans

    Publication Year: 2005, Page(s): 22
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    Freely Available from IEEE
  • IEEE IMtc/06 - Call for Papers

    Publication Year: 2005, Page(s): 60
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    Freely Available from IEEE
  • AUTOTESTCON 2006 - Call for Papers

    Publication Year: 2005, Page(s): 62
    Request permission for commercial reuse | PDF file iconPDF (131 KB)
    Freely Available from IEEE
  • Power to the people - IEEE Member Digital Library

    Publication Year: 2005, Page(s): 63
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    Freely Available from IEEE

Aims & Scope

The magazine is a bimonthly publication.

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Meet Our Editors

Editor-in-Chief
Prof. Wendy Van Moer

wendy.w.vanmoer@ieee.org
IandMMagazineEIC@ieee.org