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Proceedings of the IEEE

Issue 3 • Date March 1985

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Displaying Results 1 - 18 of 18
  • [Front cover and table of contents]

    Publication Year: 1985, Page(s): c1
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  • Scanning the issue

    Publication Year: 1985, Page(s): 387
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  • A review of electromagnetic compatibility/interference measurement methodologies

    Publication Year: 1985, Page(s):388 - 411
    Cited by:  Papers (29)  |  Patents (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2150 KB)

    This paper presents a review summary of radiated emission and susceptibility measurement methodologies currently used for assessing the electromagnetic compatibility/interference (EMC/EMI) characteristics of electronic devices and systems. In particular, measurement methods using open sites, transverse electromagnetic (TEM) cells, reverberating chambers, and anechoic chambers are discussed, in lig... View full abstract»

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  • Electron optical synthesis and optimization

    Publication Year: 1985, Page(s):412 - 418
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (593 KB)

    A novel approach to electron/ion optical synthesis and optimization is presented. Low-aberration field distributions are sought by dynamic programming or optimal control procedures in the form of continuous curves constructed of cubic splines. A very simple algorithm is proposed for the reconstruction of the electrodes or pole-pieces. High-quality electrostatic lens designs are shown as practical ... View full abstract»

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  • Design and performance of "1.25-µm" CMOS for digital applications

    Publication Year: 1985, Page(s):419 - 432
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (899 KB)

    This paper presents a detailed approach for the design and performance analysis of 1.25-µm CMOS digital circuit technology based on relatively simple sets of fundamental device parametric and circuit equations. As a start, a topological and "in-depth" baseline is assumed for this 1.25-µm CMOS technology, based, in part, on a set of achievable lithographic feature sizes and alignment tole... View full abstract»

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  • Robust techniques for signal processing: A survey

    Publication Year: 1985, Page(s):433 - 481
    Cited by:  Papers (328)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (4814 KB)

    In recent years there has been much interest in robustness issues in general and in robust signal processing schemes in particular. Robust schemes are useful in situations where imprecise a priori knowledge of input characteristics makes the sensitivity of performance to deviations from assumed conditions an important factor in the design of good signal processing schemes. In this survey we discus... View full abstract»

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  • On the modified nodal approach to network analysis

    Publication Year: 1985, Page(s):485 - 487
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (259 KB)

    An algorithm to reduce the size of MNA matrices for switched and nonswitched networks is proposed through the use of cutsets. The procedure is simple and eliminates all diagonal zeros. Closed switches and EMF sources are handled identically. The final size of the matrix may be reduced to the number of nodes when no current-controlled elements are present. View full abstract»

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  • Minimal realization of a symmetric transfer-function matrix using expansion about a general point "a"

    Publication Year: 1985, Page(s):487 - 488
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (171 KB)

    A procedure for the minimal realization of symmetric transfer function matrix by its expansion about an arbitrary point "a" is proposed. The procedure results in realizations leading to reciprocal network synthesis. View full abstract»

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  • Hall-effect measurements on short-channel devices using the van der Pauw Dual technique

    Publication Year: 1985, Page(s):489 - 490
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (215 KB)

    The van der Pauw dual technique is used to perform in situ Hall-effect measurements on short-channel GaAs field-effect transistors (GaAs FETs). The technique is briefly described and some practical and theoretical problems associated with this technique are discussed. View full abstract»

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  • Comment on "Graph-theoretic proof of a network theorem and some consequences"

    Publication Year: 1985, Page(s): 489
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  • Comments on "An accurate digital phase measurement scheme"

    Publication Year: 1985, Page(s):490 - 491
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  • Sensitivity analysis of power cable sheath circulating losses

    Publication Year: 1985, Page(s):491 - 492
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (196 KB)

    In this letter, the calculated normalized sensitivities of sheath losses of a 132-kV underground cable with respect to the conductor and sheath material resistivities, supply frequency, operating temperature, cable spacings, and geometrical dimensions are presented. View full abstract»

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  • The fifth generation

    Publication Year: 1985, Page(s):493 - 494
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  • FAST TRANSFORMS, algorithms, analysis, applications

    Publication Year: 1985, Page(s): 494
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  • Multirate digital signal processing

    Publication Year: 1985, Page(s): 494
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  • Laser theory

    Publication Year: 1985, Page(s): 494
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  • Book alert

    Publication Year: 1985, Page(s): 495
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  • [Back cover]

    Publication Year: 1985, Page(s): c4
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H. Joel Trussell
North Carolina State University