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IEEE Transactions on Dependable and Secure Computing

Issue 2 • April-June 2004

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Displaying Results 1 - 8 of 8
  • [Front cover]

    Publication Year: 2004, Page(s): c1
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  • [Inside front cover]

    Publication Year: 2004, Page(s): c2
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  • Checkpointing for peta-scale systems: a look into the future of practical rollback-recovery

    Publication Year: 2004, Page(s):97 - 108
    Cited by:  Papers (85)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (944 KB) | HTML iconHTML

    Over the past two decades, rollback-recovery via checkpoint-restart has been used with reasonable success for long-running applications, such as scientific workloads that take from few hours to few months to complete. Currently, several commercial systems and publicly available libraries exist to support various flavors of checkpointing. Programmers typically use these systems if they are satisfac... View full abstract»

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  • Reflections on industry trends and experimental research in dependability

    Publication Year: 2004, Page(s):109 - 127
    Cited by:  Papers (35)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1200 KB) | HTML iconHTML

    Experimental research in dependability has evolved over the past 30 years accompanied by dramatic changes in the computing industry. To understand the magnitude and nature of this evolution, this paper analyzes industrial trends, namely: 1) shifting error sources, 2) explosive complexity, and 3) global volume. Under each-of these trends, the paper explores research technologies that are applicable... View full abstract»

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  • Characterization of soft errors caused by single event upsets in CMOS processes

    Publication Year: 2004, Page(s):128 - 143
    Cited by:  Papers (235)  |  Patents (15)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1128 KB) | HTML iconHTML

    Radiation-induced single event upsets (SEUs) pose a major challenge for the design of memories and logic circuits in high-performance microprocessors in technologies beyond 90nm. Historically, we have considered power-performance-area trade offs. There is a need to include the soft error rate (SER) as another design parameter. In this paper, we present radiation particle interactions with silicon,... View full abstract»

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  • [Advertisement]

    Publication Year: 2004, Page(s): 144
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  • TDSC Information for authors

    Publication Year: 2004, Page(s): c3
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  • [Back cover]

    Publication Year: 2004, Page(s): c4
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Aims & Scope

The purpose of TDSC is to publish papers in dependability and security, including the joint consideration of these issues and their interplay with system performance.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Elisa Bertino
CS Department
Purdue University