By Topic

IEEE Design & Test of Computers

Issue 4 • July-Aug. 2004

Filter Results

Displaying Results 1 - 17 of 17
  • [Front cover]

    Publication Year: 2004, Page(s): c1
    Request permission for commercial reuse | PDF file iconPDF (291 KB)
    Freely Available from IEEE
  • Table of contents

    Publication Year: 2004, Page(s):266 - 267
    Request permission for commercial reuse | PDF file iconPDF (190 KB)
    Freely Available from IEEE
  • Masthead

    Publication Year: 2004, Page(s): 268
    Request permission for commercial reuse | PDF file iconPDF (40 KB)
    Freely Available from IEEE
  • From the EIC: Manufacturing test woes

    Publication Year: 2004, Page(s):269 - 270
    Request permission for commercial reuse | PDF file iconPDF (152 KB) | HTML iconHTML
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Looking back, looking around [electronic design automation]

    Publication Year: 2004, Page(s):271 - 273
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (152 KB) | HTML iconHTML

    During the late 1980s, there was a widespread belief that engineering workstations, widely distributed through development organizations and connected through local area networks, would become the dominant, if not the only, platform for EDA tools and electronic design. Despite early skepticism, logic synthesis began making serious inroads into the design process in the late 1980s and has now enter... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates

    Publication Year: 2004, Page(s):274 - 276
    Request permission for commercial reuse | PDF file iconPDF (130 KB) | HTML iconHTML
    Freely Available from IEEE
  • Testing Gbps interfaces without a gigahertz tester

    Publication Year: 2004, Page(s):278 - 286
    Cited by:  Papers (16)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (472 KB) | HTML iconHTML

    As device manufacturers scale their silicon technology, and processor speeds rise above 1 GHz, it's becoming common for every processor company to tout gigahertz processors. To continually improve system-level performance, system designers have begun increasing I/O performance. Some of these changes are evolutionary; some are revolutionary. The latter necessitate a change in test methodology and i... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Multiplexing ATE channels for production testing at 2.5 Gbps

    Publication Year: 2004, Page(s):288 - 301
    Cited by:  Papers (6)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1120 KB) | HTML iconHTML

    We describe two versions of a multiplexing test system for multigigahertz devices. Our approach leverages test resources available in existing ATE, and achieves higher rates with added multiplexing logic. In the prototype, 32 high-speed differential-pair signals each support data at 2 Gbps to 2.5 Gbps. An updated system uses water cooling to better maintain the test electronics temperature. This s... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Jitter models for the design and test of Gbps-speed serial interconnects

    Publication Year: 2004, Page(s):302 - 313
    Cited by:  Papers (39)  |  Patents (13)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3968 KB) | HTML iconHTML

    We present a comprehensive analysis of jitter causes and types, and develops accurate jitter models for design and test of high-speed interconnects. The recent deployment of gigabit-per-second (Gbps) serial I/O interconnects aims at overcoming data transfer bottlenecks resulting from the limited ability to increase chip pin counts in parallel bus architectures. The traditional measure of a communi... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • On-chip digital jitter measurement, from megahertz to gigahertz

    Publication Year: 2004, Page(s):314 - 321
    Cited by:  Papers (46)  |  Patents (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (176 KB) | HTML iconHTML

    One of the challenges of testing at multiGbps rates is jitter characterization. We introduce a new technique that allows for attaining on-chip measurements at a substantial level of accuracy. We propose new algorithms that allow a wide frequency range, supporting the desired accuracy while guaranteeing signal integrity and low overhead. One advantage of this approach is that we can reliably simula... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A built-in parametric timing measurement unit

    Publication Year: 2004, Page(s):322 - 330
    Cited by:  Papers (15)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (488 KB) | HTML iconHTML

    On-chip timing-measurement units are needed because accessibility to internal nodes in SoCs is very limited, and performing time interval measurements using automatic test equipment is very difficult and expensive. We present a parametric timing measurement solution, which uses self-timed techniques and delivers high linearity and improved accuracy, at low risk of measurement error. Performing the... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Design & Test Education in Asia

    Publication Year: 2004, Page(s):331 - 338
    Request permission for commercial reuse | PDF file iconPDF (78 KB) | HTML iconHTML
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Conference Reports

    Publication Year: 2004, Page(s):339 - 341
    Request permission for commercial reuse | PDF file iconPDF (102 KB) | HTML iconHTML
    Freely Available from IEEE
  • Panel Summaries

    Publication Year: 2004, Page(s): 342
    Cited by:  Papers (2)
    Request permission for commercial reuse | PDF file iconPDF (48 KB)
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Design automation Technical Committee Newsletter

    Publication Year: 2004, Page(s): 343
    Request permission for commercial reuse | PDF file iconPDF (33 KB) | HTML iconHTML
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Test at Gbps: Megaproblem or micromanagement?

    Publication Year: 2004, Page(s): 344
    Request permission for commercial reuse | PDF file iconPDF (46 KB) | HTML iconHTML
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • [Inside back cover]

    Publication Year: 2004, Page(s): c3
    Request permission for commercial reuse | PDF file iconPDF (68 KB)
    Freely Available from IEEE

Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty