IEEE Design & Test of Computers

Issue 1 • Jan-Feb 2004

Filter Results

Displaying Results 1 - 25 of 25
  • Paperless design and test

    Publication Year: 2004, Page(s): 72
    Request permission for commercial reuse | PDF file iconPDF (191 KB) | HTML iconHTML
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Calendar

    Publication Year: 2004, Page(s): 69
    Request permission for commercial reuse | PDF file iconPDF (225 KB)
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • IEEE Computer Society

    Publication Year: 2004, Page(s): 67
    Request permission for commercial reuse | PDF file iconPDF (211 KB)
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Panel summeries

    Publication Year: 2004, Page(s):65 - 66
    Request permission for commercial reuse | PDF file iconPDF (207 KB)
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Society

    Publication Year: 2004, Page(s): 4
    Request permission for commercial reuse | PDF file iconPDF (189 KB)
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Low-power design using multiple channel lengths and oxide thicknesses

    Publication Year: 2004, Page(s):56 - 63
    Cited by:  Papers (26)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (287 KB) | HTML iconHTML

    Two CMOS design techniques use dual threshold voltages to reduce power consumption while maintaining high performance. Simulation results show power savings of 21% for one technique at low activity, and for the other, 19% at high activity and 38% at tow activity. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Predictability in design and manufacturing

    Publication Year: 2004, Page(s): 1
    Request permission for commercial reuse | PDF file iconPDF (252 KB) | HTML iconHTML
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Seamless test of digital components in mixed-signal paths

    Publication Year: 2004, Page(s):44 - 55
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (407 KB) | HTML iconHTML

    For today's large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. We offer an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • 2004 IEEE Computer Society professional membership/subscription application

    Publication Year: 2004, Page(s):7 - 8
    Request permission for commercial reuse | PDF file iconPDF (217 KB)
    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Crosstalk-aware placement

    Publication Year: 2004, Page(s):24 - 32
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (294 KB) | HTML iconHTML

    With today's rapidly shrinking process geometries, designers must address crosstalk, electromigration, IR drop, and other effects earlier in the design cycle to achieve signal integrity. We present a new placement algorithm that minimizes crosstalk and increases design speed 8% on average, in comparison with a traditional timing-driven, congestion-aware placement flow. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Efficient and economical test equipment setup using procorrelation

    Publication Year: 2004, Page(s):34 - 43
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (311 KB) | HTML iconHTML

    The procorrelation system (PCS) obtains a high-quality correlation between die failures on a premanufactured recorded correlation wafer and the test equipment setup for the current wafer lot. PCS greatly reduces analysis time and test cost, compared with conventional full-wafer probing and offers significant benefits for deep-submicron ICs. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • An integrated environment for technology closure of deep-submicron IC designs

    Publication Year: 2004, Page(s):14 - 22
    Cited by:  Papers (40)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (334 KB) | HTML iconHTML

    With larger chip images and increasingly aggressive technologies, key design processes must interoperate, PDS, a physical-synthesis system, accomplishes technology closure through interacting processes of logic optimization, placement, timing, clock insertion, and routing, all using a common infrastructure with robust variable-accuracy analysis abstractions. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Guest editors' introduction: RTL to GDSII - from foilware to standard practice

    Publication Year: 2004, Page(s):9 - 12
    Cited by:  Papers (4)
    Request permission for commercial reuse | PDF file iconPDF (239 KB) | HTML iconHTML
    Freely Available from IEEE
  • IEEE Design & Test

    Publication Year: 2004, Page(s): C1
    Request permission for commercial reuse | PDF file iconPDF (354 KB)
    Freely Available from IEEE
  • New for 2004

    Publication Year: 2004, Page(s): C2
    Request permission for commercial reuse | PDF file iconPDF (311 KB)
    Freely Available from IEEE
  • Table of contents

    Publication Year: 2004, Page(s):2 - 3
    Request permission for commercial reuse | PDF file iconPDF (305 KB)
    Freely Available from IEEE
  • IEEE Design & Test of Computers Editorial Calendar

    Publication Year: 2004, Page(s): 5
    Request permission for commercial reuse | PDF file iconPDF (181 KB)
    Freely Available from IEEE
  • Not a member yet?

    Publication Year: 2004, Page(s): 6
    Request permission for commercial reuse | PDF file iconPDF (180 KB)
    Freely Available from IEEE
  • Special issue on exploring synergies for design verification

    Publication Year: 2004, Page(s): 13
    Request permission for commercial reuse | PDF file iconPDF (187 KB)
    Freely Available from IEEE
  • Free for members

    Publication Year: 2004, Page(s): 23
    Request permission for commercial reuse | PDF file iconPDF (1204 KB)
    Freely Available from IEEE
  • Get the power of the IEEE Computer Society [advertisement]

    Publication Year: 2004, Page(s): 33
    Request permission for commercial reuse | PDF file iconPDF (708 KB)
    Freely Available from IEEE
  • Conference Reports

    Publication Year: 2004, Page(s): 68
    Request permission for commercial reuse | PDF file iconPDF (195 KB) | HTML iconHTML
    Freely Available from IEEE
  • Test technology TC newsletter

    Publication Year: 2004, Page(s):70 - 71
    Request permission for commercial reuse | PDF file iconPDF (179 KB)
    Freely Available from IEEE
  • IEEE Design & Test of Computers

    Publication Year: 2004, Page(s): C3
    Request permission for commercial reuse | PDF file iconPDF (354 KB)
    Freely Available from IEEE
  • IEEE Computer Society library subscription plan-electronic

    Publication Year: 2004, Page(s): 04
    Request permission for commercial reuse | PDF file iconPDF (337 KB)
    Freely Available from IEEE

Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty