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IEEE Transactions on Reliability

Issue 3 • Date Sept. 2003

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Displaying Results 1 - 15 of 15
  • Editorials - from 1978

    Publication Year: 2003, Page(s):273 - 276
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    Freely Available from IEEE
  • Editorials - from 1979

    Publication Year: 2003, Page(s):277 - 280
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    Freely Available from IEEE
  • Editorials - from 1980

    Publication Year: 2003, Page(s):281 - 284
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    Freely Available from IEEE
  • Editorials - from 1981

    Publication Year: 2003, Page(s):285 - 288
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    Freely Available from IEEE
  • Reliable heterogeneous applications

    Publication Year: 2003, Page(s):330 - 339
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (495 KB) | HTML iconHTML

    This paper explores the notion of computational resiliency to provide reliability in heterogeneous distributed applications. This notion provides both software fault-tolerance and the ability to tolerate information-warfare attacks. This technology seeks to strengthen a military mission, rather than to protect its network infrastructure using static defense measures such as network security, intru... View full abstract»

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  • Solving dependability/performability irreducible Markov models using regenerative randomization

    Publication Year: 2003, Page(s):319 - 329
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (826 KB) | HTML iconHTML

    Markov models are commonly used to asses the dependability/performability of fault-tolerant systems. Computation of many dependability/performability measures for repairable fault-tolerant systems requires the transient analysis of irreducible Markov models. Examples of such measures are the unavailability at time t and the s-expected interval unavailability at time t. Randomization (also called u... View full abstract»

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  • Preprocessing minpaths for sum of disjoint products

    Publication Year: 2003, Page(s):289 - 295
    Cited by:  Papers (17)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (415 KB) | HTML iconHTML

    Network reliability algorithms which produce sums of disjoint products (SDP) are sensitive to the order in which the minimal pathsets are analyzed. The minpaths are preprocessed by choosing this order in the hope that an SDP algorithm will then provide a relatively efficient analysis. The most commonly used preprocessing strategy is to list the minpaths in order of increasing size. This paper give... View full abstract»

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  • Availability of a periodically inspected system, maintained under an imperfect-repair policy

    Publication Year: 2003, Page(s):311 - 318
    Cited by:  Papers (20)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (609 KB) | HTML iconHTML

    A periodically inspected system is maintained through a fixed number of imperfect-repairs before being replaced or perfectly repaired. The lifetime distribution of the system in its new and imperfectly repaired states is arbitrary. The times required for imperfect repairs and for perfect repair or replacement are random. The repaired system is restored to operation at the next scheduled inspection... View full abstract»

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  • Computing consecutive-type reliabilities nonrecursively

    Publication Year: 2003, Page(s):367 - 372
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (326 KB) | HTML iconHTML

    The reliability of consecutive-type systems has been approached from various angles. A new method is presented for deriving exact expressions for the generating functions and the reliabilities of various consecutive-type systems. This method, based on Feller's run theory, is easy to implement, and leads to both recursive and nonrecursive formulas for the reliability. The nonrecursive expression is... View full abstract»

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  • Reliability of multi-state systems with two failure-modes

    Publication Year: 2003, Page(s):340 - 348
    Cited by:  Papers (15)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (709 KB) | HTML iconHTML

    Systems with two failure modes (STFM) consist of devices, which can fail in either of two modes. For example, switching systems can not only fail to close when commanded to close but can also fail to open when commanded to open. This paper considers systems consisting of different elements characterized by nominal performance level in each mode. Such systems are multi-state because they have multi... View full abstract»

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  • Extending integrated-circuit yield-models to estimate early-life reliability

    Publication Year: 2003, Page(s):296 - 300
    Cited by:  Papers (20)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (328 KB) | HTML iconHTML

    The integrated yield-reliability model for integrated circuits allows one to estimate the yield, following both wafer probe and burn-in testing. The model is based on the long observed clustering of defects and the experimentally verified relation between defects causing wafer probe failures, and defects causing infant mortality failures. The 2-parameter negative binomial distribution is used to d... View full abstract»

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  • A condition-based failure-prediction and processing-scheme for preventive maintenance

    Publication Year: 2003, Page(s):373 - 383
    Cited by:  Papers (47)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (680 KB) | HTML iconHTML

    Preventive maintenance (PM) is an effective approach for reliability enhancement. Time-based and condition-based maintenance are two major approaches for PM. In contrast, condition-based maintenance can be a better and more cost-effective type of maintenance than time-based maintenance. However, irrespective of the approach adopted for PM, whether a failure can be detected early or even predicted ... View full abstract»

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  • Increasing the immunity to electromagnetic interferences of CMOS OpAmps

    Publication Year: 2003, Page(s):349 - 353
    Cited by:  Papers (14)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (360 KB) | HTML iconHTML

    This paper presents the successful design of a CMOS operational amplifier with enhanced immunity to electromagnetic interferences. Thanks to its strongly symmetrical topology, the amplifier exhibits an intrinsic robustness to interferences arising from a wide class of sources. Such a scheme, for the first time in the authors' knowledge, proves the effectiveness of symmetrical topologies to minimiz... View full abstract»

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  • Importance measures for noncoherent-system analysis

    Publication Year: 2003, Page(s):301 - 310
    Cited by:  Papers (45)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (635 KB) | HTML iconHTML

    Component importance analysis is a key part of the system reliability quantification process. It enables the weakest areas of a system to be identified and indicates modifications, which will improve the system reliability. Although a wide range of importance measures have been developed, the majority of these measures are strictly for coherent system analysis. Noncoherent systems can occur and ac... View full abstract»

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  • Optimal information-dispersal for fault-tolerant communication over a burst-error channel

    Publication Year: 2003, Page(s):354 - 366
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1377 KB) | HTML iconHTML

    The (m,n) wireless information dispersal scheme (WIDS) is useful for fault-tolerant parallel wireless communications, where it can be used to tolerate up to n-m path (sub-channel) failures. This paper constructs a performance model of (m,n) WIDS used in wireless communications, and proposes an algorithm to find the optimal set of (m,n) with the highest reliability. This algorithm reduces the compl... View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu