Issue 3 • September 1960
Message from the ChairmanPublication Year: 1960, Page(s):68 - 69| |PDF (212 KB)
Summary--The leakage resistance of capacitors as a function of time is a characteristic to be considered in the choice and control of capacitors, especially in many modern military electronics applications. This paper, by the use of transient circuit analysis, shows why most leakage resistance data accumulated in the electronics industry for capacitors are invalid. Valid data can be obtained by us... View full abstract»
Cited by: Papers (7)
Summary--This paper describes a recommended standard resistor-noise test system, with the theory of operation given in considerable detail. The system provides for the measurement of a definitive resistor-noise quality Index. This Index, the "microvolts-per-volt" Index, is a modified form of the "conversion gain" index formerly used at NBS. The Index is a decibel expression for the number of micro... View full abstract»
Summary--This article gives a description of the state of the art insofar as small tubular tantalum capacitors for military and industrial applications are concerned. Foil anode paste-electrolyte, sintered-anode liquid-electrolyte, and solid-tantalum capacitors are described and their performance characteristics discussed. Data on reliability of the various types are presented. View full abstract»
Aims & Scope
This Transaction ceased production in 1962. The current publication is titled IEEE Transactions on Components, Packaging, and Manufacturing Technology.