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IEEE Transactions on Manufacturing Technology

Issue 3 • Date September 1977

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Displaying Results 1 - 4 of 4
  • Microprocessor Boards and Automatic Testers

    Publication Year: 1977, Page(s):47 - 50
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (481 KB)

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  • Reducing In-Circuit Testing Costs with Self-Correcting Program Generations

    Publication Year: 1977, Page(s):61 - 63
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  • Selecting Test Patterns for 4K RAMS

    Publication Year: 1977, Page(s):51 - 60
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (952 KB)

    The selection of 4K RAM test patterns for use in a Go/NoGo or characterization type test program requires consideration of several areas related to test program quality. Among all others, two of the most important of these areas are pattern execution time and failure modes tested for. The most popular test patterns for 4K RAM'S are graphically illustrated with step-by-step instructions on test pat... View full abstract»

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  • Detecting Races with a Production Environment Logic Simulator

    Publication Year: 1977, Page(s):40 - 46
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (760 KB)

    A logic simulator serves three functions: computing the output of a circuit board for a given set of input patterns, indicating faults which have been detected by a set of input patterns (tests), and predicting race conditions which may occur. Race detection is important because races prevent faults from being detected and produce unknown states during testing, causing failed boards to pass or goo... View full abstract»

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Aims & Scope

This Transaction ceased production in 1977. The current publication is titled IEEE Transactions on Components, Packaging, and Manufacturing Technology.

Full Aims & Scope