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IEEE Transactions on Parts, Materials and Packaging

Issue 3 • Date September 1966

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Displaying Results 1 - 6 of 6
  • Who's Who in G-PMP

    Publication Year: 1966, Page(s): 50
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    Freely Available from IEEE
  • Microinhomogeneity Problems in Silicon

    Publication Year: 1966, Page(s):51 - 58
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1373 KB)

    A survey evaluation of the quality of commercial silicon used in the preparation of p-n junction devices has been made, with emphasis on the detection and characterization of micro-inhomogeneities. The examination techniques included transmission electron microscopy, special etching techniques with optical microscopy, and microresistivity determination. These investigations have shown that almost ... View full abstract»

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  • Current Topics in the Surface Chemistry of Electric Contacts

    Publication Year: 1966, Page(s):59 - 67
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1673 KB)

    This paper describes recent work in the science of the separable electronic pressure contact with emphasis on chemical factors in performance. The following topics are discussed: growth and morphology of sulfide tarnish films which creep across the interface between gold plate and silver or copper alloys and degrade contact performance; the formation and structure of corrosion solids on porous gol... View full abstract»

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  • Current Ideas in the Philosophy of Testing Electrical Contacts

    Publication Year: 1966, Page(s):68 - 70
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (477 KB)

    In computer equipment, the large number of connector type contacts alone require a very reliable component. There is a definite need for obtaining a better understanding of the modes of failure in real-life environments so that new and better test methods can be developed. This paper reviews testing methods and the philosophy of evaluating electrical contacts. View full abstract»

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  • Recent Studies on the Physics of Electrical Connector Surfaces

    Publication Year: 1966, Page(s):71 - 75
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (785 KB)

    The manner in which two conductors touch to form an electrical contact is described, and the influence of the phenomena occurring at the interface on the engineering properties of the connector is discussed. In the last ten years, significant advances have been made in our knowledge of the mechanical, electrical, and thermal aspects of the contact between surfaces. These have led to a better under... View full abstract»

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  • Recent Advances in Sliding Contacts including Space Applications

    Publication Year: 1966, Page(s):76 - 79
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (703 KB)

    Drastic wear under very dry high altitude or space conditions is considered to be due to a lack of a contact film. When this film is absent, electron exchange between metallic members can produce metallic bonds which are of the same order of magnitude in strength as those of soft metals. The contact between a metal and graphite also exhibits considerable bond strength. Such bonds result in galling... View full abstract»

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Aims & Scope

This Transaction ceased production in 1971. The current publication is titled IEEE Transactions on Components, Packaging, and Manufacturing Technology.

Full Aims & Scope