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Reliability, IEEE Transactions on

Issue 1 • Date April 1991

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Displaying Results 1 - 25 of 25
  • Comments, with reply, on "Consecutive k-out-of-n:F system with sequential failures" by R.C. Bollinger

    Publication Year: 1991
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    The commenter considers the problem of finding the maximum number of failures that can occur when the system fails in R.C. Bollinger's system (see ibid., vol.R-34, no.1, p.43-5, 1985). A table is given which shows the difference in the values of M for various values of n when k=3. In replying, R.C. Bollinger thanks the commenter for calling attention to this problem.<> View full abstract»

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  • Comments, with reply, on "Evaluating fault trees (AND and OR gates only) with repeated events" by K.S. Brown

    Publication Year: 1991 , Page(s): 8 - 10
    Cited by:  Papers (3)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (378 KB)  

    The commenter summarizes his own approach to fault tree analysis (see ibid., vol.R-36, no.2, p.250-54, 1987) and wonders why K.S. Brown (see ibid., vol.39, no.2, p.226-35, 1990), did not compare his own approach with the commenter's approach. He asks Brown to comment on the latter and raises a number of questions about Brown's paper. Brown, in reply, points out the limitations of the commenter's approach and responds to each of the points he raises.<> View full abstract»

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  • Comments on "An efficient nonrecursive algorithm for computing the reliability of k-out-of-n systems" by A.K. Sarje and E.V. Prasad

    Publication Year: 1991 , Page(s): 60 - 61
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (192 KB)  

    The commenter points out that the iterative structure of the algorithm given in the above-titled paper (see ibid., vol.38, no.2, p.234-5, 1989) duplicates that of an earlier algorithm by the commenter. Furthermore, he shows that it does not have the best spatial or temporal complexity among existing algorithms.<> View full abstract»

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  • The mean time-to-failure of some special series-parallel arrays

    Publication Year: 1991 , Page(s): 20 - 21
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (144 KB)  

    A method for finding the mean time-to-failure (MTTF) of parallel-series and series-parallel arrays is presented. The system itself is subject to two modes of failure, open and short, and all components states are mutually independent. Each item has the same failure-time distribution, and the probability of short failure of an item, given the failure of the item, is a constant. It is shown that the distribution of the lifetime of the system is a linear combination of the distributions of lifetimes of systems each of which is an ordinary series or parallel system of mutually independent components View full abstract»

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  • Characterization of the Pearson family of distributions

    Publication Year: 1991 , Page(s): 75 - 77
    Cited by:  Papers (1)
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    The Pearson family of distributions is characterized in terms of the failure rates. Analogous results when failure time is discrete are presented. Theorems are proved which generalize some previously published results concerning the gamma and negative binomial distributions View full abstract»

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  • An efficient algorithm to solve integer-programming problems arising in system-reliability design

    Publication Year: 1991 , Page(s): 81 - 91
    Cited by:  Papers (19)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (688 KB)  

    A simple and efficient technique for solving integer-programming problems that normally arise in system-reliability design is introduced. It quickly solves even a very large system problem. It consists of a systematic search near the boundary of constraints and involves functional evaluations only. It can handle system-reliability design problems of any type in which the decision variables are restricted to integer values. Several illustrative examples are given to substantiate these assertions View full abstract»

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  • On the analysis of accelerated life-testing experiments

    Publication Year: 1991 , Page(s): 98 - 101
    Cited by:  Papers (1)
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    One simplification for a particular class of accelerated life-testing experiments is discussed. The efficacy of this simplification is compared with other alternatives. Evidence from simulation experiments shows that the presented simplification is superior. Several measures of precision for maximum-likelihood estimators of model parameters are analyzed. Asymptotically valid results provide a reasonable guide to the precision in these maximum-likelihood estimators View full abstract»

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  • Extrapolation of high-voltage stress measurements to low-voltage operation for thin silicon-oxide films

    Publication Year: 1991 , Page(s): 102 - 109
    Cited by:  Papers (9)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (636 KB)  

    Breakdown and wearout in MOS capacitors fabricated with 10 nm-thick silicon oxide films on p-type silicon are discussed. They have been stressed at high voltages. The high-voltage-stress-induced changes in the oxide properties are extrapolated to low operating voltages. The stress voltages ranged from -7.5 V to -14.5 V. The fluence during the stress was systematically varied front 2×10-5 C/cm2 to 6 C/cm2 by varying the stress time at each voltage. The number of interface traps generated by the stress increased as the stress voltage and fluence increased. However, the interface trap generation rate decreased as the fluence increased. The trap generation rate at low operating voltages was very high, but because the current through the oxide was small, the total number of traps generated was low. The trap generation rate was proportional to the inverse square root of the fluence with a voltage dependence that decreased as the fluence increased. Extrapolation of the high-voltage-stress measurements to 5 V shows that easily detectable changes in the oxide properties would only occur after several years of 5 V operation. Extrapolation of charge-to-breakdown and time-to-breakdown data to 5 V operation indicates that breakdown would occur after hundreds of years of device operation View full abstract»

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  • Communication and transportation network reliability using routing models

    Publication Year: 1991 , Page(s): 29 - 38
    Cited by:  Papers (11)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (860 KB)  

    A general framework is presented for calculating a reliability measure for several types of flow networks. This framework allows reliability analysis for complicated systems such as communication, electric power, and transportation networks. The analysis is based on the notion of routing and rerouting after a failure. Modeling approaches are discussed for each type of system surveyed. A mathematical description of the system, measures of performance, a mathematical model of failures, routing models, and (if available) routing algorithms are discussed for every system View full abstract»

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  • Automated analysis of phased-mission reliability

    Publication Year: 1991 , Page(s): 45 - 52, 55
    Cited by:  Papers (44)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (708 KB)  

    A method for automated analysis of phased mission reliability which considers the problem in terms of the construction of a continuous-time discrete-state Markov model and uses a standard Markov-chain solution technique that is adapted to the problem of phased missions is presented. The resulting state space is the union of the states in each independent phase, rather than the sum. This results in a model that can be substantially smaller than those required by other methods. A unified framework which is used for defining the separate phases using fault trees and for constructing and solving the resulting Markov model is discussed. The usual solution technique is altered to account for the phased nature of the problem. The framework is described for a previously published, simple three-component, three-phase system. An example in which a hypothetical two-phase application involving a fault-tolerant parallel processor is considered is given. The approach applies where the transition rates (failure and repair rates) are constant and where the phase change times are deterministic View full abstract»

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  • Cost-benefit analysis of a 2-unit priority-standby system with patience-time for repair

    Publication Year: 1991 , Page(s): 11 - 14
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    The cost of a one-server two-unit (one priority and the other ordinary) cold-standby system with two modes-normal and total failure-is analysed. Whenever the repair time of a failed priority unit exceeds some given maximum time, it is rejected and an order is placed for a new unit. Failure and delivery time distributions are negative exponentials, whereas repair and replacement time distributions are arbitrary. An analysis of the system is made to determine the reliability measures (MTSF (meantime to system failure), steady-state availability, busy period analysis of repairman, etc.) by using the regenerative point technique View full abstract»

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  • Bayes estimates under asymmetric loss

    Publication Year: 1991 , Page(s): 63 - 67
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    Bayes estimates under asymmetric loss are studied. Auxiliary results for asymmetric loss functions are derived. Examples of asymmetric loss functions are considered, and the resulting Bayes estimates differing from the posterior mean are given. The introduction of an asymmetric loss function with an asymmetric parameter gives additional possibilities to account for overestimation or underestimation. For practical applications, one value for a parameter can be treated more easily than a credibility interval. This Bayes estimate differs from the posterior mean in the direction of smaller increase of loss. Thus, an expedient of many engineers, correcting for values to the secure side, is formalized using Bayes methods View full abstract»

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  • Impact of network failures on the performance degradation of a class of cluster-based multiprocessors

    Publication Year: 1991 , Page(s): 39 - 44
    Cited by:  Papers (2)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (432 KB)  

    The impact of increased unreliability of network components on the performance of a cluster-based multiprocessor system (CBMS) is investigated. A generalized model which has been developed for computing the closed-form bandwidth expressions for fault-free as well as faulty systems is discussed. Performance curves are given which illustrate the degradation when unreliability is increased in terms of the number of cluster-network failures. The architecture of the CBMS along with background material for the analysis is described. A special case called private and favorite memory is discussed View full abstract»

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  • The effectiveness of adding standby redundancy at system and component levels

    Publication Year: 1991 , Page(s): 53 - 55
    Cited by:  Papers (3)
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    The effect of adding standby redundancy at the system and component levels is studied. Compared with parallel redundancy, standby redundancy is both easier to implement and more essential in the study of maintenance policies. However, standby redundancy at the component level is not always better than that at the system level, whereas it is always better for parallel redundancy. It is shown that for a series (parallel) system, standby redundancy is more effective at the component (system) level. A simple proof is given View full abstract»

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  • The effects of variables samples on component reliability

    Publication Year: 1991 , Page(s): 110 - 112
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    The effect of statistical quality control (SQC) by variables sampling on the probability distributions of controlled variables is considered and related quantitatively to measures of post-SQC reliability. The techniques permit the assessment of a particular SQC procedure with regard to the degree of protection obtained against the occurrence of specific defined events (e.g. failures), which constitutes a more direct assessment than those generally employed (e.g. producer and consumer risks). Assumptions regarding the statistics of controlled variables are not critical, provided that they are not clearly inappropriate, since the above assessment is on the basis of comparison of risks rather than absolute values. If certain comparative costs are known, or can be estimated, it is possible to determine optimum variables sampling plans, corresponding to minimum cost, on the basis of a cost balance between additional SQC and resulting reduction in risk of failure, or other malfunction View full abstract»

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  • Redundant-system demonstrated-reliability approximation using piece-part failure rates

    Publication Year: 1991 , Page(s): 15 - 19
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    A method of obtaining the reliability of a redundant system when only the part force-of-mortality estimates (hazard rates) for electronic parts are available is presented. Part failures are reported without specifying whether the parts are configured in series or in parallel. The sum of all the part failure rates in the system, recorded from the turn-on date of the system up to the present time of monitoring, and the sum of the failure rates of all the parts in the system recorded up to a certain previous time after the system turn-on date are calculated. The system reliability for a certain critical mission time, with or without redundancy, is calculated at that previous time. The method is useful in field-equipment reliability monitoring because exact computation is impossible without knowing whether the failed parts are configured in series or in parallel. Generally, Monte Carlo simulation should be used only to verify the results calculated through an analytic method, if such a method is available and is neither time consuming nor cost prohibitive. A dimensionless reliability parameter is introduced View full abstract»

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  • Maximum likelihood estimation of Weibull parameters for two independent competing risk

    Publication Year: 1991 , Page(s): 71 - 74
    Cited by:  Papers (3)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (252 KB)  

    A stable technique for obtaining the maximum-likelihood estimate of Weibull parameters of the life distributions of two components that form a series system is presented. The technique requires much more computation than the procedure of H. Kanie and Y. Nonaka (1985). Simulation results, however, show that the standard deviation of the estimated values of the Weibull parameters is greatly reduced. This technique does not require the concomitant indicator and can be applied not only for complete data but for randomly censored data View full abstract»

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  • Event-tree analysis by fuzzy probability

    Publication Year: 1991 , Page(s): 120 - 124
    Cited by:  Papers (17)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (328 KB)  

    A method is presented for dealing with event-tree analysis under uncertainty. Fuzzy-set logic is used to account for imprecision and uncertainty in data while employing event-tree analysis. The fuzzy event-tree logic allows the use of verbal statements for the probabilities and consequences, such as very high, moderate, and low probability. The technique permits an analysis of the qualitative evaluation of the event tree to gain the quantitative results. The application of fuzzy event trees is further demonstrated by using a set of event trees for an electric power protection system to assess the viability of the method in complex situations View full abstract»

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  • Reliability optimization in generalized stochastic-flow networks

    Publication Year: 1991 , Page(s): 92 - 97
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    A model and an algorithm for reliability optimization in generalized stochastic-flow networks are given. This algorithm uses the relationship of the k-weak-link sets and sets of failure events to the parameters of the generalized stochastic flow networks. This facilitates a fast location of the optimal capacity expansion for a system from the information obtained by the latest iteration and alleviates the dimension calamity on computation. Consequently, this reliability optimization method is powerful for large systems. As an example, the IEEE Reliability Test System with 24 nodes and 70 components was tested, revealing the components and their capacity values which should be enhanced. The computation results show that the algorithm can be applied to practical problems View full abstract»

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  • Extended behavioral decomposition for estimating ultrahigh reliability

    Publication Year: 1991 , Page(s): 22 - 28
    Cited by:  Papers (5)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (516 KB)  

    Limitations of some analytic techniques in approximating the reliability of life-critical electronic systems are discussed, and a framework for the specification of recovery and fault- handling submodels is suggested. The framework makes full use of the instantaneous jump theorem by viewing the collection of interfering, premature exits from any fault handling and recovery submodel as defining a new, competing process submodel. This approach allows a greater flexibility in submodel representation, since submodels may contain arbitrary entrance arcs, exit arcs, and competing, interfering transitions with arbitrary destinations. Since the effects of near-coincident faults need not be represented as system failure events, reliability estimates produced by this approach need not be unduly conservative. Comparisons on small models, where exact results can be computed, show substantial improvement in accuracy over earlier techniques. Implementation of the technique in an X Windows-based system, XHARP, is described. The dual top-down/bottom-up interface of XHARP provides added flexibility by allowing an automated behavioral decomposition that is based on the suggested framework View full abstract»

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  • A class of shrinkage estimators for the scale parameter of the exponential distribution

    Publication Year: 1991 , Page(s): 68 - 70
    Cited by:  Papers (1)
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    A class of shrinkage estimators for the scale parameter of the exponential distribution is suggested. It includes some previously published estimators as special cases. An analogous estimator based on censored samples is considered. An example is given View full abstract»

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  • Nonparametric confidence bounds, using censored data, on the mean residual life

    Publication Year: 1991 , Page(s): 78 - 80
    Cited by:  Papers (1)
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    An approach to inverting confidence bounds on the failure rate to obtain conservative nonparametric confidence statements about the mean residual life (MRL) for type I and II censoring and random right (left) censoring is described. A mild nonparametric condition of increasing (or decreasing) MRL is used. The condition of increasing (or decreasing) MRL is not required for the whole time axis. All example which uses type II censored data is included View full abstract»

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  • Redundancy optimization of k-out-of-n systems with common-cause failures

    Publication Year: 1991 , Page(s): 56 - 59
    Cited by:  Papers (5)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (224 KB)  

    The problem of determining the optimal number of redundant units in k-out-of-n systems with common-cause failures (CCFs) is discussed. The mean cost rate is obtained, its behavior is examined considering both CCFs and random failures of the units, and the number of redundant units minimizing the mean cost rate is shown to be finite and unique. For the problem of determining the optimal number of redundant units and inspection period, the mean cost rate is obtained and a solution procedure is presented. Numerical studies are given which indicate that CCFs tend to reduce the optimal number of redundant units View full abstract»

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  • Reliability demonstration testing for software

    Publication Year: 1991 , Page(s): 117 - 119
    Cited by:  Papers (6)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (244 KB)  

    Reliability demonstration testing for software conducted to demonstrate whether the specified reliability has been achieved in a software product is studied. The software-reliability demonstration test is based on two risks. This procedure determines a test time and a maximum number of software failures during the test under prespecified producer and consumer risks. A procedure for zero software-failure reliability demonstration testing is proposed where the software product is accepted only if no failures occur in a specified testing time. The procedure based on two types of risk is identical to that for hardware items. The formulation for the zero software-failure reliability demonstration testing is identical to zero failure reliability demonstration testing for hardware items View full abstract»

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  • Reliability prediction of solid dielectrics using electrical Noise as a screening parameter

    Publication Year: 1991 , Page(s): 113 - 116
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (488 KB)  

    The use of electrical noise for the screening of dielectric sheet material for reliability is studied. Results are presented which indicate that high-noise units have a greater failure rate compared to low-noise units when subjected to identical voltage and temperature stresses. Data for the various solid dielectric sheet materials and small transformers tested are presented View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong