IEEE Design & Test of Computers

Issue 6 • Dec. 1990

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  • Design synthesis and silicon compilation

    Publication Year: 1990, Page(s):8 - 23
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1284 KB)

    An overview is given of silicon compilation, which involves translating a high-level design description into layout. Levels of compilers are differentiated, and compilation is shown as a process of synthesis coupled with physical design at each level. The major tasks involved at each level are described, and examples are given to illustrate them. A typical design system based on synthesis and sili... View full abstract»

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  • A model-based expert system for digital system design

    Publication Year: 1990, Page(s):24 - 40
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1226 KB)

    An expert system that generates digital system design from high-level specifications is described. It is called MBESDSD, short for model-based expert system for automated digital systems. The system is based on a three-phase model of digital system design. First, the high-level behavioral specifications are translated into a sequence of primitive behavioral operations. Next, these primitive operat... View full abstract»

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  • Dynamic functional testing for VLSI circuits

    Publication Year: 1990, Page(s):42 - 49
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (753 KB)

    The author discusses the two main problems of dynamic testing (i.e. testing while the simulator is running), namely the design of a high-level vector-generation language and the design of the interface between the vector generator and the simulator. He offers guidelines for designing a high-level vector-generation language as well as several examples written in FHDL, a driver language developed at... View full abstract»

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This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

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