By Topic

Proceedings of the IEEE

Issue 11 • Date Nov 1990

Filter Results

Displaying Results 1 - 4 of 4
  • Design and performance analysis of adaptive optical telescopes using lasing guide stars

    Publication Year: 1990, Page(s):1721 - 1743
    Cited by:  Papers (7)  |  Patents (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1900 KB)

    The use of adaptive optical systems using electrically deformable mirrors to compensate for turbulence effects is discussed. Since these systems require bright reference sources adjacent to the object of interest and can be used only to observe the brightest stars, artificial guide stars suitable for controlling an adaptive imaging system must be created in the upper atmosphere by using a laser to... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Runlength-limited sequences

    Publication Year: 1990, Page(s):1745 - 1759
    Cited by:  Papers (38)  |  Patents (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1196 KB)

    Runlength-limited (RLL) sequences are formally defined, and the runlength distribution and spectral properties of ideal RLL sequences are analyzed. A detailed description is furnished of the limiting properties of RLL sequences, and a comprehensive review is given of the practical aspects involved in the translation of arbitrary data into RLL sequences. Examples of code implementation are presente... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Advances in bipolar VLSI

    Publication Year: 1990, Page(s):1707 - 1719
    Cited by:  Papers (9)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1020 KB)

    Bipolar IC processes are reviewed, and the impact of BiCMOS technology on bipolar VLSI is discussed. The discussion covers standard emitter-coupled-logic (ECL) circuit configuration, on-chip line driving, output circuitry, series gating, ECL versus CML (current-mode logic), differential logic, noise margins, interconnect capacitance, bipolar VLSI transistor design and scaling, and processes for EC... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Challenges to manufacturing submicron, ultra-large scale integrated circuits

    Publication Year: 1990, Page(s):1687 - 1705
    Cited by:  Papers (13)  |  Patents (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1700 KB)

    It is argued that the cost of manufacturing submicron, ultra-large-scale integration (ULSI) integrated circuits (ICs) (which is scaling upward at least in inverse proportion to the downward scaling of device feature sizes) is driven by a parameter budget crisis associated with the technological and complexity limits of IC design and fabrication. This budget crisis is defined for technologies assoc... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.

Aims & Scope

The most highly-cited general interest journal in electrical engineering and computer science, the Proceedings is the best way to stay informed on an exemplary range of topics.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
H. Joel Trussell
North Carolina State University