Instrumentation and Measurement, IEEE Transactions on
Issue 6 • Date Dec. 2001
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Displaying Results 1 - 25 of 62
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Guest editorial
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PDF (11 KB)
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Author index
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Subject index
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Measurement of frequency response functions using periodic excitations, corrupted by correlated input/output errors
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PDF (258 KB)
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A voltage-controlled resistor in CMOS technology using bisection of the voltage range
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PDF (149 KB)
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Optical fiber interface for distributed measurement and control in metrology setups: application to current sensing with fA resolution
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PDF (106 KB)
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Testing of a microanalysis system
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PDF (79 KB)
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A CMOS optical microspectrometer with light-to-frequency converter, bus interface, and stray-light compensation
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PDF (434 KB)
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Combining signal processing and machine learning techniques for real time measurement of raindrops
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PDF (161 KB)
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A simple interface circuit to measure very small capacitance changes in capacitive sensors
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PDF (61 KB)
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Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography
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PDF (82 KB)
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Comparison of methods for uniform laser scanning of centrifuged blood tubes for data acquisition in a hematology analyzer
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PDF (54 KB)
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Fault tolerance in systems design in VLSI using data compression under constraints of failure probabilities
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PDF (495 KB)
Aims & Scope
IEEE Transactions on Instrumentation and Measurement provides innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications.
Meet Our Editors
Editor-in-Chief
Prof. Alessandro Ferrero
Dipartimento di Elettrotecnica
