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IEEE Instrumentation & Measurement Magazine

Issue 3 • Date Sept. 2001

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Displaying Results 1 - 12 of 12
  • Microsystems and I&M - mutual interest, demonstrated impact, and potential [Guest Editorial]

    Publication Year: 2001, Page(s): 6
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    Freely Available from IEEE
  • Integrated silicon microspectrometers

    Publication Year: 2001, Page(s):34 - 38
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3075 KB) | HTML iconHTML

    Microspectrometers, which read color and the results from analytical chemistry, are used for quality inspection in industry and agriculture. They read the chromatography results by measuring the IR absorption of the chemical constituent between the IR source and the grating. Micromachining can implement the dispersion and detection elements in a silicon microspectrometer so that it can analyze the... View full abstract»

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  • Java as a teaching tool

    Publication Year: 2001, Page(s): 42
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (43 KB)

    First Page of the Article
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  • Java as a teaching tool

    Publication Year: 2001, Page(s): 46
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    First Page of the Article
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  • IEEE instrumentation and measurement society awards

    Publication Year: 2001, Page(s): 59
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    Freely Available from IEEE
  • Molecular nanotechnology

    Publication Year: 2001, Page(s):11 - 20
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (6720 KB) | HTML iconHTML

    Molecular nanotechnology is an interdisciplinary field combining the sciences of molecular chemistry and physics with the engineering principles of mechanical design, structural analysis, computer science, electrical engineering, and systems engineering. Molecular manufacturing is a method conceived for the processing and rearrangement of atoms to fabricate custom products. It relies on the use of... View full abstract»

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  • Packaging of microsystems for harsh environments

    Publication Year: 2001, Page(s):30 - 33
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1768 KB) | HTML iconHTML

    Micromachined devices have great potential but using these fragile structures in aggressive environments can pose a challenge. Mechanical shock, chemical exposure, and temperature extremes can damage delicate microsystems. Also, substantial effort is often put forth to develop a device concept only to find later that the device is difficult or expensive to package suitably in a consumer or automot... View full abstract»

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  • Microtechnology and microsystems in measurement applications

    Publication Year: 2001, Page(s):21 - 23
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (296 KB) | HTML iconHTML

    Microtechnology has made inroads into metrology. MEMS structures in thermal RMS-to-DC conversion are at a mature stage. Many more applications are in their infancy and require more basic and applied research. Next to metrology, these may open doors to the higher performance instruments. A characteristic of MEMS is the reproducibility of the structure, which is important in metrology. Standard micr... View full abstract»

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  • Opportunities for microtechnology in metrology

    Publication Year: 2001, Page(s):24 - 29
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (728 KB) | HTML iconHTML

    The vast infrastructure of the microelectronic and microtechnological processing industry has yielded highly reproducible devices through reliable, reproducible, and fabrication-compatible processing techniques. Much development has occurred in bulk and surface micromachining, as well as in thin-film deposition techniques. Nevertheless, only a limited number of metrological applications have benef... View full abstract»

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  • Giving meaning to measurement

    Publication Year: 2001, Page(s):41 - 45
    Cited by:  Papers (2)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (264 KB)

    Measurement provides the transformation that represents the relationship between one domain and another. Measurement in isolation is meaningless. It must fit into the understanding of a system, which has relational, interacting components. Measurement always has a reference from which it establishes a relationship between domains. We have a colloquial expression in America, “Don't miss the f... View full abstract»

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  • Measuring radiation

    Publication Year: 2001, Page(s):47 - 48
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    The author discusses his favourite experiment conducted during his youth which comprised detecting alpha radiation with a spinthariscope. He also describes how one can construct such an instrument nowadays View full abstract»

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  • Gyroscopes

    Publication Year: 2001, Page(s):49 - 52
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (152 KB)

    I describe the path that I took to develop a gyroscope-balancing machine, the principles of which still apply today. The nature of the design and development challenge is summarised. Allowable drift tolerances, measurement implementation and imbalance correction techniques, governed by what was practically achievable, became the performance requirements for the gyroscope balancing machine View full abstract»

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The magazine is a bimonthly publication.

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Meet Our Editors

Editor-in-Chief
Prof. Wendy Van Moer

wendy.w.vanmoer@ieee.org
IandMMagazineEIC@ieee.org