By Topic

IEEE Circuits and Devices Magazine

Issue 3 • Date May 2001

Filter Results

Displaying Results 1 - 15 of 15
  • VLSI designer's interface

    Publication Year: 2001, Page(s):6 - 7
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (78 KB)

    First Page of the Article
    View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • The physics of determining chip reliability

    Publication Year: 2001, Page(s):33 - 38
    Cited by:  Papers (13)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (918 KB) | HTML iconHTML

    We have indicated the necessity for using statistical models to determine the reliability of deep-submicron MOSFETs. We have presented a methodology by which the reliability can be determined from short-time tests if the defect generation statistics are linked to variations in defect activation energies. We have shown that enhanced latent failures follow from our model for deep-submicron MOSFETs. ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Shedding light on device crowding: custom lighting assemblies save space in hard-drive designs

    Publication Year: 2001, Page(s):53 - 54
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (190 KB) | HTML iconHTML

    A PC manufacturer, in search of the best status lighting arrangement for its new hard drive, has custom designed a lighting assembly. To save valuable space near the front of the hard drive, a group of three display lights was separated from the light source. The source, three surface-mount LEDs attached to a circuit board, was placed behind the hard drive. To deliver the light to the front of the... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Digital communication over fading channels [Book Review]

    Publication Year: 2001, Page(s): 57
    Request permission for commercial reuse | PDF file iconPDF (29 KB) | HTML iconHTML
    Freely Available from IEEE
  • Interconnects in VLSI design [Book Review]

    Publication Year: 2001, Page(s): 57
    Request permission for commercial reuse | PDF file iconPDF (29 KB) | HTML iconHTML
    Freely Available from IEEE
  • High accuracy CMOS smart temperature sensors [Book Review]

    Publication Year: 2001, Page(s):57 - 58
    Request permission for commercial reuse | PDF file iconPDF (58 KB) | HTML iconHTML
    Freely Available from IEEE
  • Gateway into electronics [Book Review]

    Publication Year: 2001, Page(s):58 - 59
    Request permission for commercial reuse | PDF file iconPDF (57 KB) | HTML iconHTML
    Freely Available from IEEE
  • Digital telephony, 3rd ed. [Book Review]

    Publication Year: 2001, Page(s): 59
    Request permission for commercial reuse | PDF file iconPDF (28 KB) | HTML iconHTML
    Freely Available from IEEE
  • Design, simulation and application of inductors and transformers for SI RF ICS [Book Review]

    Publication Year: 2001, Page(s): 59
    Request permission for commercial reuse | PDF file iconPDF (28 KB) | HTML iconHTML
    Freely Available from IEEE
  • Applied introductory circuit analysis [Book Review]

    Publication Year: 2001, Page(s): 60
    Request permission for commercial reuse | PDF file iconPDF (60 KB) | HTML iconHTML
    Freely Available from IEEE
  • Insights on memory technology and the market

    Publication Year: 2001, Page(s):12 - 18
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1268 KB) | HTML iconHTML

    In this article, the trends of the semiconductor memory market and the challenges of deep-submicron and nanometer silicon technology in the 21st century are introduced View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Pad de-embedding in RF CMOS

    Publication Year: 2001, Page(s):8 - 11
    Cited by:  Papers (14)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (852 KB) | HTML iconHTML

    In this article, we discuss techniques for RF pad layout and de-embedding, a topic of great interest particularly for implementing radio frequency (RF) circuits in mainstream CMOS technology View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Software and the web

    Publication Year: 2001, Page(s):55 - 56
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (60 KB)

    First Page of the Article
    View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • In the blink of a silicon eye

    Publication Year: 2001, Page(s):20 - 32
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1908 KB) | HTML iconHTML

    In this article, a new device structure called the neuron-bipolar junction transistor (νBJT) was presented. It has been successfully applied to the design of a silicon retina and large-neighborhood cellular neural networks (CNNs). The νBJT-based smoothing array for the silicon retina has a simple and compact structure, which is suitable for the VLSI implementation. It can be integrated with ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • FILTERD-Mathcad Worksheets for Analog Filter Design

    Publication Year: 2001, Page(s):4 - 5
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (204 KB)

    FILTERD-Mathcad Worksheets for Analog Filter Design-is a computer program that provides a multifeatured versatile design utility for the realization of active and passive analog filters. Some details of the capabilities of the program are presented in this paper View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.

Aims & Scope

IEEE Circuits and Devices Magazine (1985-2006) covers the design, implementation, packaging, and manufacture of micro-electronic and photonic devices, circuits and systems

 

This Magazine ceased publication in 2006.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Dr. Ronald W. Waynant
r.waynant@ieee.org