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Aerospace and Electronic Systems Magazine, IEEE

Issue 6 • Date June 2001

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Displaying Results 1 - 12 of 12
  • Peter Swerling: March 4, 1929 - August 25, 2000

    Page(s): 24A
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    Freely Available from IEEE
  • How I met Peter Swerling

    Page(s): 24C
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  • Boundary-scan bursts into the modern production facility

    Page(s): 21 - 24
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    The IEEE 1149.1 boundary-scan standard was adopted ten years ago to solve anticipated problems in printed circuit board testing as board densities and complexities continued to escalate. We can see today that the foresight of the original JTAG committee was excellent. For several years after adoption of the standard, relatively few users had implemented boundary-scan solutions in their production lines. Now, however, for a number of reasons, interest in boundary-scan has rapidly intensified: (i) IC manufacturers have accepted boundary-scan as a feature that must be included in new ICs; (ii) Advances in board and IC Packaging technologies have accelerated, making new test strategies imperative; and (iii) Standard tools for engineering and production are now available to support boundary-scan, dramatically reducing test development effort, capital investments, along with a corresponding reduction in time to market. As a result, virtually every manufacturer of modern electronic boards has either adopted boundary-scan or faces difficult problems in manufacturing that could be resolved through boundary-scan. This presentation examines recent developments in boundary-scan technology as it relates to the development and production environments. Advanced tools, packaged to meet the needs of these environments, have brought boundary-scan into its prime. A detailed description of life-cycle implementation of boundary-scan is provided covering R&D, the factory, and service View full abstract»

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  • Designing a parallel, distributed test system

    Page(s): 3 - 6
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    The increasing use of parallel architectures and networking technologies has enabled test systems to break free from their traditional structure. Today's systems run multiple parallel tasks, distribute testing among many computers, and publish live data through the Internet to achieve faster performance, better reliability, and increased connectivity with enterprise-wide systems. Specifically, software technologies and techniques will be examined for developing and running parallel, distributed automated tests and distributing test data between applications or across the Internet. If used correctly, the result of these techniques is a higher performance, more robust test system. In addition, we will examine technologies that make creating these parallel, distributed systems possible for not only the advanced test program developer, but also the novice user View full abstract»

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  • A remembrance of peter swerling

    Page(s): 24B
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  • ROSA Rotorcraft Open Systems Avionics

    Page(s): 31 - 36
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    Commercial standards adopted from the volume-driven electronics markets provide improved processing capacities over those widely used military standards and at reduced cost. Desired future capabilities and advanced functions, such as RPA, require the throughput, bandwidth, and memory provided by commercial processors and data buses. The primary issues needing resolution prior to implementation are related to operations in military rotorcraft environment, reliability, redundancy management, and fault and battle damage tolerance. In addition, some required network components presently do not exist in the preferred form factors. The ROSA project is providing effective laboratory demonstrations of COTS products and open systems specifications and standards to rotorcraft avionics. Preliminary cost estimates forecast large potential savings and create a compelling business case for follow-on research and transition to production systems. In addition, the project is developing a Rotorcraft Technical Architecture with the participation of many industry partners and will promote the resulting documentation as background materials for the JTA-A View full abstract»

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  • Nanotechnology-based molecular test equipment (MTE)

    Page(s): 15 - 19
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    This paper describes original research efforts in the design, simulation, and development of nanotechnology-based molecular test equipment (MTE). This is a research effort for testing printed circuit boards independent of traditional automatic test equipment (ATE) through the fabrication of MTE within integrated circuits (ICs). The MTE is embedded within the IC substrate and encapsulated within nanoprobes that connect between the surface and the substrate of the IC at various functional areas. A process is followed whereby IC device simulation is performed to assess the electrical, chemical, and structural properties of integrated and adjacent substrate devices. Through this approach the nominal and failed device performance parameters of interest to substrate-based MTE are found. Discussion of the development and application of MTE within IC architectures is provided, including such topics as the effect of substrate composition on the design and realization of MTE, interfaces between MTE and IC devices, and reporting of MTE results to the IC surface and technician. Potential application areas within different device functions will also be identified. A chemical structure diagram is also provided to illustrate the implementation of MTE using discrete device configurations with MTE-augmented logic View full abstract»

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  • Data fusion system engineering

    Page(s): 7 - 14
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    The paper reports on methods for the cost-effective development and integration of multi-sensor fusion technology. The methods presented extend the Project Correlation Data Fusion Engineering Guidelines with significant evolution. The key new insight is in formulating the system engineering process as a resource management problem; allowing the application of the Bowman's model of the duality between data fusion and resource management View full abstract»

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  • The multifaceted peter swerling

    Page(s): 24B - 24C
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  • Intrepid digital microwave. A new approach to bistatic radar

    Page(s): 37 - 42
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    Southwest Microwave, Inc. (SMI) introduced the world's first commercially viable bistatic microwave intrusion detection sensor in 1971. Bistatic microwave has become the paradigm for high security perimeters, and SMI products have become industry standards. With the introduction of the Intrepid Digital Microwave, SMI brings the latest in Digital Signal Processing (DSP) and power and data networking to this proven sensor technology View full abstract»

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  • Changing safety-critical software

    Page(s): 25 - 30
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    Changing software to implement new features, correct problems, update functions, or replace obsolete hardware components (e.g., microprocessors) is a way of life in today's industry. A systematic software change process is essential for the maintenance and reuse of safety-critical software. This paper presents activities to consider when changing software in safety-critical systems. The focus is on the aviation industry; however, the concepts are also applicable to other safety-critical domains, such as medical or nuclear View full abstract»

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  • Next generation functional test program development system

    Page(s): 43 - 46
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    While superior-quality functional board test has been a goal for most high reliability electronics manufacturers, the time and effort for generating such test programs using today's tools and processes makes this difficult to achieve in a cost effective manner. This paper will introduce a revolutionary approach to functional board test program development that combines the comprehensiveness of software-based simulation with the speed and simplicity of hardware emulation. The result is a functional Test Program Set development system that can produce high fault coverage, diagnostic test programs in a fraction of the time it takes using traditional techniques, and at a lower unit cost. In this paper we will first provide a brief background on the strengths and weaknesses of current software and hardware TPS development techniques-simulation hot mock-up. Next, the new approach is described in detail and contrasted against the existing techniques. Finally, actual experience to date using a prototyped system is presented View full abstract»

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The IEEE Aerospace and Electronic Systems Magazine publishes articles and tutorials concerned with the various aspects of systems for space, air, ocean, or ground environments.

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