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IEEE Aerospace and Electronic Systems Magazine

Issue 6 • Date June 2001

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Displaying Results 1 - 12 of 12
  • Peter Swerling: March 4, 1929 - August 25, 2000

    Publication Year: 2001, Page(s): 24A
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  • How I met Peter Swerling

    Publication Year: 2001, Page(s): 24C
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  • Intrepid digital microwave. A new approach to bistatic radar

    Publication Year: 2001, Page(s):37 - 42
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1388 KB) | HTML iconHTML

    Southwest Microwave, Inc. (SMI) introduced the world's first commercially viable bistatic microwave intrusion detection sensor in 1971. Bistatic microwave has become the paradigm for high security perimeters, and SMI products have become industry standards. With the introduction of the Intrepid Digital Microwave, SMI brings the latest in Digital Signal Processing (DSP) and power and data networkin... View full abstract»

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  • A remembrance of peter swerling

    Publication Year: 2001, Page(s): 24B
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  • ROSA Rotorcraft Open Systems Avionics

    Publication Year: 2001, Page(s):31 - 36
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    Commercial standards adopted from the volume-driven electronics markets provide improved processing capacities over those widely used military standards and at reduced cost. Desired future capabilities and advanced functions, such as RPA, require the throughput, bandwidth, and memory provided by commercial processors and data buses. The primary issues needing resolution prior to implementation are... View full abstract»

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  • Changing safety-critical software

    Publication Year: 2001, Page(s):25 - 30
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (492 KB) | HTML iconHTML

    Changing software to implement new features, correct problems, update functions, or replace obsolete hardware components (e.g., microprocessors) is a way of life in today's industry. A systematic software change process is essential for the maintenance and reuse of safety-critical software. This paper presents activities to consider when changing software in safety-critical systems. The focus is o... View full abstract»

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  • Boundary-scan bursts into the modern production facility

    Publication Year: 2001, Page(s):21 - 24
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (344 KB) | HTML iconHTML

    The IEEE 1149.1 boundary-scan standard was adopted ten years ago to solve anticipated problems in printed circuit board testing as board densities and complexities continued to escalate. We can see today that the foresight of the original JTAG committee was excellent. For several years after adoption of the standard, relatively few users had implemented boundary-scan solutions in their production ... View full abstract»

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  • Nanotechnology-based molecular test equipment (MTE)

    Publication Year: 2001, Page(s):15 - 19
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (684 KB) | HTML iconHTML

    This paper describes original research efforts in the design, simulation, and development of nanotechnology-based molecular test equipment (MTE). This is a research effort for testing printed circuit boards independent of traditional automatic test equipment (ATE) through the fabrication of MTE within integrated circuits (ICs). The MTE is embedded within the IC substrate and encapsulated within na... View full abstract»

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  • Next generation functional test program development system

    Publication Year: 2001, Page(s):43 - 46
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (356 KB) | HTML iconHTML

    While superior-quality functional board test has been a goal for most high reliability electronics manufacturers, the time and effort for generating such test programs using today's tools and processes makes this difficult to achieve in a cost effective manner. This paper will introduce a revolutionary approach to functional board test program development that combines the comprehensiveness of sof... View full abstract»

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  • The multifaceted peter swerling

    Publication Year: 2001, Page(s):24B - 24C
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  • Designing a parallel, distributed test system

    Publication Year: 2001, Page(s):3 - 6
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (548 KB) | HTML iconHTML

    The increasing use of parallel architectures and networking technologies has enabled test systems to break free from their traditional structure. Today's systems run multiple parallel tasks, distribute testing among many computers, and publish live data through the Internet to achieve faster performance, better reliability, and increased connectivity with enterprise-wide systems. Specifically, sof... View full abstract»

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  • Data fusion system engineering

    Publication Year: 2001, Page(s):7 - 14
    Cited by:  Papers (13)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1000 KB) | HTML iconHTML

    The paper reports on methods for the cost-effective development and integration of multi-sensor fusion technology. The methods presented extend the Project Correlation Data Fusion Engineering Guidelines with significant evolution. The key new insight is in formulating the system engineering process as a resource management problem; allowing the application of the Bowman's model of the duality betw... View full abstract»

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IEEE Aerospace and Electronic Systems Magazine is a monthly magazine that publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments as well as news and information of interest to IEEE Aerospace and Electronic Systems Society members.

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Editor-in-Chief
Maria Sabrina Greco
Dept. of Information Engineering
University of Pisa
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56122 Pisa, Italy
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