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Reliability, IEEE Transactions on

Issue 4 • Date Dec. 2000

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Displaying Results 1 - 10 of 10
  • Editorial Say What You Mean

    Publication Year: 2000 , Page(s): 333
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    Freely Available from IEEE
  • Editorial In Statistical Control - What Does it Mean?

    Publication Year: 2000 , Page(s): 334
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    Freely Available from IEEE
  • Commentary: reliability-past, present, and future

    Publication Year: 2000 , Page(s): 335 - 341
    Cited by:  Papers (5)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (53 KB)  

    The paper reviews the nature of reliability in relation to the causes of failures of engineering products, explains how most of the methods that have been developed and applied by reliability and quality specialists have been misleading and ineffective, and makes suggestions for the way ahead. View full abstract»

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  • Author index

    Publication Year: 2000 , Page(s): 383 - 384
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    Freely Available from IEEE
  • Subject index

    Publication Year: 2000 , Page(s): 384 - 388
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    Freely Available from IEEE
  • Lifetime-characteristics and inspection-schemes for Levy degradation processes

    Publication Year: 2000 , Page(s): 377 - 382
    Cited by:  Papers (6)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (128 KB)  

    Providing customers with efficient maintenance policies is of great interest to suppliers of complex industrial equipment and devices. Generally, developing such policies requires a great amount of data, and often these data are specific to each individual customer and each device “generation.” For a fairly general and useful class of degradation processes (Levy processes) this paper c... View full abstract»

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  • Fault-tolerant system dependability-explicit modeling of hardware and software component-interactions

    Publication Year: 2000 , Page(s): 363 - 376
    Cited by:  Papers (14)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (292 KB)  

    This paper presents a framework for modeling the dependability of hardware and software fault-tolerant systems, taking into account explicitly the dependence among the components. These dependencies can result from: (a) functional or structural interactions between the components or (b) interactions due to global system reconfiguration and maintenance strategies. Modeling is based on GSPN (general... View full abstract»

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  • A Gibbs-sampler approach to estimate the number of faults in a system using capture-recapture sampling [software reliability]

    Publication Year: 2000 , Page(s): 342 - 350
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (184 KB)  

    A new recapture debugging model is suggested to estimate the number of faults in a system, ν, and the failure intensity of each fault, φ. The Gibbs sampler and the Metropolis algorithm are used in this inference procedure. A numerical illustration suggests a notable improvement on the estimation of ν and φ compared with that of a removal debugging model View full abstract»

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  • Prediction intervals for system lifetime, based on component test data

    Publication Year: 2000 , Page(s): 351 - 354
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    This paper considers a monotonic system of statistically independent components whose lifetimes have a common exponential distribution. Prediction intervals are constructed for the lifetime of a monotonic system based on incomplete data. The results can be applied to related distributions View full abstract»

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  • Task-scheduling strategies for reliable TMR controllers using task grouping and assignment

    Publication Year: 2000 , Page(s): 355 - 362
    Cited by:  Papers (7)  |  Patents (2)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (164 KB)  

    Real-time computers are often used in embedded, life-critical applications where high reliability is important. A common approach to make such systems dependable is to vote on redundant processors executing multiple copies of the same task. The most popular redundant structure is triple modular redundancy (TMR). The processors that make up such systems are subject not only to independently occurri... View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

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Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong