Instrumentation and Measurement, IEEE Transactions on
Issue 6 • Date Dec. 1999
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Displaying Results 1 - 25 of 54
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High-performance front-end electronics for frequency-modulated continuous-wave interferometers
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PDF (114 KB)
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Author index
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PDF (257 KB)
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Subject index
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PDF (337 KB)
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The estimation of subsample time delay of arrival in the discrete-time measurement of phase delay
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PDF (92 KB)
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On-wafer measurements of noise temperature
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PDF (184 KB)
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A microcontroller-based data acquisition system for solar radiation and environmental monitoring
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PDF (112 KB)
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Substrate noise measurement by using noise-selective voltage comparators in analog and digital mixed-signal integrated circuits
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PDF (132 KB)
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On the determination of dynamic errors for rise time measurement with an oscilloscope
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PDF (112 KB)
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Accurate determination of the balance point of a current comparator bridge for resistance standards measurements
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PDF (124 KB)
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Cavity perturbation technique for the measurement of permittivity tensor of uniaxially anisotropic dielectrics
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PDF (148 KB)
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VLBI phase-calibration system suitable for very-wide-band and ultra-high-frequency operation
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PDF (176 KB)
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Stability of some DC reference standards
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PDF (104 KB)
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A virtual instrument for time-frequency analysis
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PDF (1384 KB)
Aims & Scope
IEEE Transactions on Instrumentation and Measurement provides innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications.
Meet Our Editors
Editor-in-Chief
Prof. Alessandro Ferrero
Dipartimento di Elettrotecnica
