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# IEEE Transactions on Reliability

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Displaying Results 1 - 13 of 13
• ### Using statistics of the extremes for software reliability analysis

Publication Year: 1999, Page(s):292 - 299
Cited by:  Papers (8)
| | PDF (616 KB)

This paper investigates the use of StEx (statistics of the extremes) [Castillo, Sarabia 1992; Gumbel 1958; Ang, Tang 1984; Castillo 1988; Castillo, Alvarez, Cobo 1993] for analyzing software failure data for highly reliable systems. StEx classifies most distributions into one of three asymptotic families. The asymptotic family to which a set of data belongs is derived graphically on Gumbel-type pr... View full abstract»

• ### Existence of invariant series consecutive-k-out-of-n:G systems

Publication Year: 1999, Page(s):306 - 308
Cited by:  Papers (6)
| | PDF (204 KB)

A consecutive-k-out-of-n:G line has an invariant optimal assignment if k⩽n⩽2k. This paper studies a system consisting of consecutive-ki-out-of-ni:G lines with ki⩽ni⩽2ki, completely characterizes the existence of an invariant optimal assignment View full abstract»

• ### Mean residual life and its association with failure rate

Publication Year: 1999, Page(s):262 - 266
Cited by:  Papers (13)
| | PDF (344 KB)

The life time distributions having decreasing, increasing, or upside-down bathtub shaped MRL (mean residual life) are used as models in many applications. Mi (1995) has shown that if a component has a bathtub shape failure rate function, then the MRL is unimodal but the converse does not hold. This paper develops sufficient conditions for the unimodal MRL to imply that the failure rate function ha... View full abstract»

• ### Comparison of software-reliability-growth predictions: neural networks vs parametric-recalibration

Publication Year: 1999, Page(s):285 - 291
Cited by:  Papers (47)
| | PDF (600 KB)

This paper compares empirically the predictive performance of two different methods of software reliability prediction: neural networks' and recalibration for parametric models'. Both methods were claimed to predict as good or better than the conventional parametric models that have been used-with limited results so far. Each method applied its own predictability measure, impeding a direct compa... View full abstract»

• ### Determining terminal-pair reliability based on edge expansion diagrams using OBDD

Publication Year: 1999, Page(s):234 - 246
Cited by:  Papers (78)
| | PDF (848 KB)

For calculating terminal-pair reliability, most published algorithms are based on the sum of disjoint products. However, these tree-based partitions lack the capability to avoid redundant computation due to the isomorphic sub-problems. To overcome these problems, an efficient methodology to evaluate the terminal-pair reliability, based on edge expansion diagrams using OBDD (ordered binary decision... View full abstract»

• ### Sensitivity-analysis and estimating number-of-faults in removal debugging

Publication Year: 1999, Page(s):300 - 305
Cited by:  Papers (6)
| | PDF (392 KB)

Estimating the number of faults in a computer program is important in software debugging. A martingale equation is used to estimate the number of faults in removal-debugging by assuming a known proportionality constant between the failure rate of a newly detected fault' and a seeded fault'. The sensitivity of the assumption is examined, and the results are generalized to allow an unknown proport... View full abstract»

• ### Maximum-shortest-path (MSP): an optimal routing policy for mesh-connected multicomputers

Publication Year: 1999, Page(s):247 - 255
Cited by:  Papers (9)
| | PDF (604 KB)

This paper presents a new routing policy maximum-shortest-path (MSP), within the class of shortest-path routing policies for mesh-connected topologies which include popular 2-D and 3-D meshes, 2-D and 3-D tori, and n-dimensional binary hypercubes (n-cubes). In MSP, the routing message is always forwarded to a neighbor from which there exists a maximum number of shortest paths to the destination. T... View full abstract»

• ### A separable method for incorporating imperfect fault-coverage into combinatorial models

Publication Year: 1999, Page(s):267 - 274
Cited by:  Papers (76)
| | PDF (576 KB)

This paper presents a new method for incorporating imperfect FC (fault coverage) into a combinatorial model. Imperfect FC, the probability that a single malicious fault can thwart automatic recovery mechanisms, is important to accurate reliability assessment of fault-tolerant computer systems. Until recently, it was thought that the consideration of this probability necessitated a Markov model rat... View full abstract»

• ### A fast Monte Carlo method for evaluating reliability indexes

Publication Year: 1999, Page(s):256 - 261
Cited by:  Papers (25)
| | PDF (472 KB)

This paper presents a fast Monte Carlo method, based on importance sampling (IS) distribution, for estimation of reliability indexes in hydroelectric systems. More precisely, it considers the case where the IS distribution comes from the same parametric family as the original (true) one and proposes a simulation-based optimization algorithm for selecting the parameters of the IS in an optimal way.... View full abstract»

• ### Optimal reliability of systems subject to imperfect fault-coverage

Publication Year: 1999, Page(s):275 - 284
Cited by:  Papers (41)
| | PDF (596 KB)

This paper maximizes the reliability of systems subjected to imperfect fault-coverage. The results include the effect of common-cause failures and `maximum allowable spare limit'. The generalized results are presented and then the policies for some specific systems are given. The systems considered include parallel, parallel-series, series parallel, k-out-of-n, and NMR (k-out-of-(2k-1)) systems. T... View full abstract»

• ### Common-cause failure models, data, quantification

Publication Year: 1999, Page(s):213 - 214
Cited by:  Papers (3)
| | PDF (184 KB)

First Page of the Article
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• ### Compensation-circuit to improve radiation-hardness in GaAs digital-circuits, based on X-ray studies

Publication Year: 1999, Page(s):215 - 223
| | PDF (636 KB)

Earlier results have shown that GaAs devices do not exhibit appreciable degradation up to a radiation dose of nearly 108 rad (GaAs). The results of this work suggest that GaAs devices and circuits are sensitive to radiation exposure at dose levels below 108 rad(GaAs). Degradation was observed in E-MESFET and D-MESFET parameters and in circuit performance for devices which wer... View full abstract»

• ### Performability analysis of common-channel signaling networks, based on signaling system 7

Publication Year: 1999, Page(s):224 - 233
Cited by:  Papers (2)
| | PDF (656 KB)

Within integrated services digital networks (ISDN), all inter-change signaling messages for ISDN and intelligent network (IN) call controls are carried through a common channel signaling network (CCSN) as a backbone signaling network. Since CCSN usually have very strict reliability requirements as well as good performance objectives, performance and reliability of CCSN need to be jointly analyzed.... View full abstract»

## Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

## Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu