IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | Sign In

Author Search^beta | Advanced Search | Preferences | | More Search Options

Browse Journals & Magazines > Computers and Digital Techniqu ... Volume 136 Issue 6

Computers and Digital Techniques, IEE Proceedings E

| Create Account

IEEE Account

Change Username/Password
Update Address

Purchase Details

Payment Options
Order History
Access Purchased Documents

Profile Information

Communications Preferences
Profession and Education
Technical Interests

Need Help?

US & Canada: +1 800 678 4333
Worldwide: +1 732 981 0060
Contact & Support

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.

Please enter a valid username or password.

For Institutional Users:

More Search Options

Computers and Digital Techniques, IEE Proceedings E

Issue 6 • Date Nov 1989

Filter Results

You have selected:

You have selected:

Title History

Availability analysis of a certain class of distributed computer systems under the influence of hardware and software faults

Deductive fault diagnosis in digital circuits: a survey

Hough technique for 3D object recognition

Design of graphics interface for computer-based biomedical applications

Convex hull of chain-coded blob

Advanced VLSI validated input security device employing data and hardware validation features

Real-time collision avoidance system for multiple robots operating in shared work-space

Reconfigurable testable bit-serial multiplier for DSP applications

Three-dimensional cellular automata and VLSI applications

Automated acquisition of knowledge for an expert system for process control

Design of algorithm-based fault-tolerant VLSI array processor

Design of synchronisers: a review

Systolic architecture for finite field exponentiation

Optimal number of disc clock tracks for block-oriented rotating associative processors

Fault-tolerant loops for distributed measurement systems

Parallel VLSI algorithm for stable inversion of dense matrices

SST: scan self-test for sequential machines

Aims & Scope

Further Links

IEEE Account

Purchase Details

Profile Information

Need Help?