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Nuclear Science, IEEE Transactions on

Issue 1 • Date Feb. 1999

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Displaying Results 1 - 9 of 9
  • Comments On The Editorial Process

    Publication Year: 1999 , Page(s): 1 - 4
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (387 KB)  

    First Page of the Article
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  • List of 1998 reviewers

    Publication Year: 1999 , Page(s): 5 - 6
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    Freely Available from IEEE
  • A novel self-biased linear silicon drift detector

    Publication Year: 1999 , Page(s): 19 - 27
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (644 KB)  

    A novel linear silicon drift detector (SDD) is proposed in which the proper potential profile is established by the voltage drop along a unique p+ cathode implanted across the surfaces. This p+ implant, arranged in a zigzag shape, acts at the same time as voltage divider and field cathode and allows us to increase the sensitive area, improving also the uniformity of the thermal distribution and thus minimizing the fluctuation of the electron mobility on the sensitive zone of the SDD. The perturbations of the drift field due to the asymmetry of the strips constituting the zigzag cathode have been evaluated by solving analytically Poisson's equation for a simplified model of the structure. Three-dimensional numerical simulations have been carried out to prove the negligible amount of the perturbation and the effectiveness of the proposed structure. Based on this principle, a prototype has been manufactured at Canberra Semiconductor Company. Dynamic measurements of the time-of-flight of an injected charge prove that the linearity of the prototype and the drift uniformity in the anode direction are very high View full abstract»

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  • The processing electronics system for the pointed mode operation of IXAE on the Indian satellite IRS-P3

    Publication Year: 1999 , Page(s): 42 - 52
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    Indian Remote Sensing Satellite-P3 (IRS-P3: 1996-017A) was launched into a near-Earth, polar, Sun-synchronous orbit by India's Polar Satellite Launch Vehicle (PSLV-D3) on March 21, 1996. The Indian X-ray Astronomy Experiment (IXAE) is one of the prime payloads onboard IRS-P3. IXAE has two sets of detectors: three pointed-mode proportional counters (PPCs) and one X-ray Sky Monitor (XSM). IRS-P3 is configured to operate in two modes, namely, Earth-pointing mode and stellar-pointing mode. In Earth-pointing mode the remote sensing payloads are in operation; in addition, XSM maps the sky for bright X-ray sources and X-ray transients. In stellar mode, the PPCs observe several Galactic, bright X-ray, and extragalactic sources. The microprocessor-based processing electronics system was designed and developed for PPC data-handling and telemetering the stored data to the ground station. The system has been working well from the day the IXAE was commissioned. The processing electronics system for the PPCs, its interfaces, and the in-orbit instrument performance are described. Some results of the pointed mode observations are also presented View full abstract»

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  • Diminished electron cloud broadening in a silicon drift detector by sawtooth p+ strips

    Publication Year: 1999 , Page(s): 53 - 58
    Cited by:  Papers (4)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (516 KB)  

    Already in 1993, sawtooth-shaped p+ strips were proposed to diminish lateral diffusion in linear multi-anode silicon drift detectors. The sawtooth structure generates small electric fields directed parallel to the detector surface and perpendicular to the drift direction. These fields confine the drifting electrons within a sawtooth period, In this paper the authors present for the first time experimental proof of the applicability of the concept. For a sawtooth period of 500 μm, we have tested the confinement of electron clouds as a function of injected charge up to 5×106 electrons. The maximum number of electrons for which full confinement is achieved has been measured as a function of the potential gutter depth generated by different sawtooth angles View full abstract»

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  • Noniterative unfolding algorithm for neutron spectrum measurements with Bonner spheres

    Publication Year: 1999 , Page(s): 28 - 35
    Cited by:  Papers (2)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (164 KB)  

    The use of detectors moderated by Bonner spheres of different diameters is a relatively easy and inexpensive method of measuring the energy spectrum of neutron emission sources. Because the number of counts for each sphere diameter can be obtained by integration of the spectrum multiplied by a two-dimensional kernel, the spectrum is obtained from measurement data by means of a deconvolution or “unfolding” algorithm. Algorithms capable of solving this ill-posed “inverse” problem are based on iteration, requiring an initial spectrum estimate, extensive computation, and considerable experience on the part of the user. This paper presents a noniterative algorithm based on spectrum models with undetermined parameters. It computes the set of parameters that minimizes the error between the actual Bonner counts measured and those predicted by integration of the resulting spectrum. Examples based on ideal data show that to avoid large spectrum errors caused by small measurement errors, the number of parameters involved must be small, much less than the number of sphere diameters employed. This restriction limits resolution in the spectrum, but the limitation is believed to be inherent in the physical characteristics of the Bonner system, not a defect of the algorithm. The method appears effective, fast, and easy to use View full abstract»

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  • XA readout chip characteristics and CdZnTe spectral measurements

    Publication Year: 1999 , Page(s): 7 - 18
    Cited by:  Papers (7)  |  Patents (1)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (424 KB)  

    The authors report on the performance of a CdZnTe (CZT) array readout by an XA (X-ray imaging chip produced at the AMS foundry) application specific readout chip (ASIC). The array was designed and fabricated at NASA/Goddard Space Flight Center (GSFC) as a prototype for the Burst Arc-Second Imaging and Spectroscopy gamma-ray instrument. The XA ASIC was obtained from Integrated Detector and Electronics (IDE), in Norway. Performance characteristics and spectral data for 241Am are presented both at room temperature and at -20°C. The measured noise (σ) was 2.5 keV at 60 keV at room temperature. This paper represents a progress report on work with the XA ASIC and CZT detectors. Work is continuing and in particular, larger arrays are planned for future NASA missions View full abstract»

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  • Heavy ion linear energy transfer measurements during single event upset testing of electronic devices

    Publication Year: 1999 , Page(s): 59 - 69
    Cited by:  Papers (9)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (284 KB)  

    A heavy ion beam diagnostic system installed at the Brookhaven Single Event Upset Test Facility is described. Calibration of the system with the help of a-particles, essential for linear energy transfer (LET) measurements, is discussed. Measured LET values for 20 different ions, including 7Li, 9B, 12C, 16O, 19F, 28Si, 32S, 35Cl, 40Ca, 45Sc, 48Ti, 56Fe, 58Ni, 63Cu, 74Ge, 79Br, 107Ag, 127I, 197Au, and 235U, with energies between 0.5 and 8.5 MeV/AMU but not exceeding 400 MeV for the heaviest ions, are presented in both graphical and numerical forms. Results are compared to predictions of the TRIM-90 simulation program, with an average difference between the measured and calculated values of 2±6% View full abstract»

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  • Region-of-interest microtomography for component inspection

    Publication Year: 1999 , Page(s): 36 - 41
    Cited by:  Papers (4)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (460 KB)  

    The authors describe a novel technique for the nondestructive evaluation of microelectronic components using X-ray microtomography. Existing microtomography systems have spatial resolution of order 1 μm but require X-ray source brilliance that would become unachievable at higher resolutions. The authors describe an imaging method that reduces the number of X-ray photons required from the source without degrading the resolution. The feasibility of the technique is demonstrated through a series of computer simulations. The results are verified with real data from synchrotron experiments View full abstract»

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IEEE Transactions on Nuclear Science focuses on all aspects of the theory and applications of nuclear science and engineering, including instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.

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