Issue 2 • Date April-June 1998
Filter Results
Displaying Results 1 - 10 of 10
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A D&T Roundtable: Testing Mixed Logic and DRAM Chipshigher throughput devices has put the integration of DRAM into a new spectrum.]
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PDF (339 KB)
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Tracing the thermal behavior of ICs
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PDF (320 KB)
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Functional fault models for analog circuits
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PDF (116 KB)
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The future: plug and pray?
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PDF (76 KB)
Aims & Scope
IEEE Design & Test of Computers was published between 1984 and 2012. The latest title for this publication is IEEE Design & Test.
Meet Our Editors
Editor-in-Chief
Krishnendu Chakrabarty


