Issue 3 • Date July-Sept. 1997
Filter Results
Displaying Results 1 - 16 of 16
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Built-in self-test for designers
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PDF (341 KB)
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Microprocessor architecture design with ATLAS
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PDF (184 KB)
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The future of test and DFT
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PDF (280 KB)
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The economics of system-level testing
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PDF (180 KB)
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Analyzing manufacturing test costs
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PDF (156 KB)
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Shmoo plotting: the black art of IC testing
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PDF (640 KB)
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Test economics in the 2lst Century
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PDF (124 KB)
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Diagnosing IC failures in a fast environment
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PDF (868 KB)
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A BIST and boundary-scan economics framework
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PDF (212 KB)
Aims & Scope
IEEE Design & Test of Computers was published between 1984 and 2012. The latest title for this publication is IEEE Design & Test.
Meet Our Editors
Editor-in-Chief
Krishnendu Chakrabarty


