IEEE Design & Test of Computers

Issue 2 • April 1988

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Displaying Results 1 - 4 of 4
  • Designing circuits with partial scan

    Publication Year: 1988, Page(s):8 - 15
    Cited by:  Papers (83)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (706 KB)

    In this scan design methodology, only selected faults are targeted for detection. These faults are those not detected by the designer's functional vectors. The test generator decides exactly which flip-flops should be scanned using one of two methods. In the first method, all possible tests are generated for each target fault, and the set of tests requiring the fewest flip-flops is selected. In th... View full abstract»

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  • Real-world board test effectiveness

    Publication Year: 1988, Page(s):16 - 23
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (593 KB)

    In-circuit testing is commonly thought to be inefficient for a high level of quality control, and unable to match the high yields of functional testing. A quantitative study of 34,296 boards that represented the testing of 6,671,038 components reveals that in-circuit testing can produce high yields -96.9% in this case. The author looks at this study.<> View full abstract»

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  • 250-MHz advanced test systems

    Publication Year: 1988, Page(s):24 - 35
    Cited by:  Papers (3)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1153 KB)

    New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM.<> View full abstract»

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  • A workstation approach to IC process and device design

    Publication Year: 1988, Page(s):36 - 47
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1146 KB)

    IC designers are turning more and more to CAD tools to develop complex designs and to automate time-consuming tasks. Although there are a variety of integrated tools for many types of VLSI design, very few integrated systems have been built to address process and device design. Recognizing this need, researchers at MIT set out to define the requirements of a process and device design environment, ... View full abstract»

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Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

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Editor-in-Chief
Krishnendu Chakrabarty