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# IEEE Transactions on Reliability

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Displaying Results 1 - 25 of 31
• ### Rituals - The Quick & Easy Way

Publication Year: 1996
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First Page of the Article
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• ### Comment on the Editorial: What Was Measured?!

Publication Year: 1996
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• ### A reliability-growth model in a Bayes-decision framework

Publication Year: 1996, Page(s):505 - 510
Cited by:  Papers (2)  |  Patents (1)
| | PDF (480 KB)

Market requirements demand testing programs in the development phase of complex repairable systems to be planned in order to improve system reliability. Thus, reliability-growth models are important. This paper proposes a nonparametric reliability-growth model which analyzes, in a Bayes-decision framework, failure data from repairable systems undergoing a test-find-test growth program. The failure... View full abstract»

• ### Fault injection for formal testing of fault tolerance

Publication Year: 1996, Page(s):443 - 455
Cited by:  Papers (19)
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This study addresses the use of fault injection for explicitly removing design/implementation faults in complex fault-tolerance algorithms and mechanisms (FTAM), viz, fault-tolerance deficiency faults. A formalism is introduced to represent the FTAM by a set of assertions. This formalism enables an execution tree to be generated, where each path from the root to a leaf of the tree is a well-define... View full abstract»

• ### Age-dependent models for evaluating risks and costs of surveillance and maintenance of components

Publication Year: 1996, Page(s):433 - 442
Cited by:  Papers (3)
| | PDF (648 KB)

To determine in a quantitative way how surveillance and maintenance activities are reflected in component reliability, some age-dependent models to determine risks and associated economic costs are presented which explicitly consider how activities affect the component age as a function of the maintenance effectiveness. The models are based on reliability parameters such as demand-failure probabil... View full abstract»

• ### A Bayes ranking of survival distributions using accelerated or correlated data

Publication Year: 1996, Page(s):499 - 504
Cited by:  Papers (1)
| | PDF (432 KB)

The high reliability of modern components requires accelerated testing to compare or predict survival or failure rates in the use condition. If the testing of highly reliable components is done in the use condition, the times to failure are too long to observe. Therefore, it is often required to compare or predict mean times to failure in the use condition when the only available data are from a h... View full abstract»

• ### A fast algorithm for repair-depot reliability-evaluation

Publication Year: 1996, Page(s):429 - 432
Cited by:  Papers (1)
| | PDF (256 KB)

The repair-depot (where failed items are replaced with spares and scheduled for repair) system-reliability (RDSR) is the probability that spares are immediately available to replace failed units during the time period of interest, and it is calculated in terms of the constant failure rate for parts under consideration, the number of spare units on-hand (s), and projected repair completion dates fo... View full abstract»

• ### Difficulties With Reliability Incentives

Publication Year: 1996
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First Page of the Article
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• ### Engineering notion of mean-residual-life and hazard-rate for finite populations with known distributions

Publication Year: 1996, Page(s):362 - 368
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This article overviews some foundation issues in reliability and argues that generally it does not make sense to use classical notions of the hazard rate (HR) and mean residual life (MRL) to describe the HR and MRL of a device (the HR and failure rate are interchangeable terms). It provides a new methodology, using engineering notions of HR and MRL, to describe the HR and MRL of a device. and disc... View full abstract»

• ### A cut-based method for terminal-pair reliability

Publication Year: 1996, Page(s):413 - 416
Cited by:  Papers (22)
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This paper assesses two categories of partition techniques for computing terminal-pair reliability (path-based and cut-based algorithms) by experimenting on published benchmarks; the criteria are the number of subproblems and the computation time. The cut-based algorithm is superior to the path-based algorithm with respect to the computation time for most benchmarks. A refinement of the cut-based ... View full abstract»

• ### A Bayes approach to step-stress accelerated life testing

Publication Year: 1996, Page(s):491 - 498
Cited by:  Papers (19)
| | PDF (572 KB)

This paper develops a Bayes model for step-stress accelerated life testing. The failure times at each stress level are exponentially distributed, but strict adherence to a time-transformation function is not required. Rather, prior information is used to define indirectly a multivariate prior distribution for the failure rates at the various stress levels. Our prior distribution preserves the natu... View full abstract»

• ### An efficient stiffness-insensitive method for transient analysis of Markov availability models

Publication Year: 1996, Page(s):426 - 428
Cited by:  Patents (2)
| | PDF (236 KB)

This paper proposes a hybrid approach (HybApp) for numerical transient solution of Markov availability models. It solves both stiff and nonstiff models using a heuristic that provides timely, inexpensive stiffness detection in the model. If the model is found stiff, then a stiff ordinary-differential-equation method is used to solve it from that point onwards, otherwise we continue to use uniformi... View full abstract»

• ### The use of precautionary loss functions in risk analysis

Publication Year: 1996, Page(s):400 - 403
Cited by:  Papers (1)
| | PDF (272 KB)

Risk analysis is discussed within a Bayes framework. Traditionally, Bayes parameter estimation is based on a quadratic loss-function. This paper introduces an alternative asymmetric precautionary loss-function, derives its main features, and presents a general class of precautionary loss-functions with the quadratic loss-function as a special case. These loss functions approach infinity near the o... View full abstract»

• ### Real Reliability

Publication Year: 1996
| | PDF (108 KB)

First Page of the Article
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• ### Hierarchical Bayes estimation for the exponential-multinomial model in reliability and competing risks

Publication Year: 1996, Page(s):477 - 484
Cited by:  Papers (1)  |  Patents (2)
| | PDF (404 KB)

The exponential-multinomial distribution arises from: (1) observing the system failure of a series system with p components having independent exponential lifetimes, or (2) a competing-risks model with p sources of failure, as well as (3) the Marshall-Olkin multivariate exponential distribution under a series sampling scheme. Hierarchical Bayes (HB) estimators of the component sub-survival functio... View full abstract»

• ### Proportional hazards modeling of time-dependent covariates using linear regression: a case study [mine power cable reliability]

Publication Year: 1996, Page(s):386 - 392
Cited by:  Papers (7)
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In the proportional hazards model, the effect of a covariate is assumed to be time-invariant. In this paper a graphical method based on a linear regression model (LRM) is used to test whether this assumption is realistic. The variation in the effect of a covariate is plotted against time. The slope of this plot indicates the nature of the influence of a covariate over time. A covariate is time-dep... View full abstract»

• ### Using neural networks to predict software faults during testing

Publication Year: 1996, Page(s):456 - 462
Cited by:  Papers (13)
| | PDF (604 KB)

This paper investigates the application of principal components analysis to neural-network modeling. The goal is to predict the number of faults. Ten software product measures were gathered from a large commercial software system. Principal components were then extracted from these measures. We trained two neural networks, one with the observed (raw) data, and one with principal components. We com... View full abstract»

• ### Some results on discrete mean residual life

Publication Year: 1996, Page(s):359 - 361
Cited by:  Papers (1)
| | PDF (168 KB)

Mean residual life (MRL) is important in reliability studies; it provides the engineer with an idea of how long a device of any particular age can be expected to survive. Components and systems are frequently characterized as having increasing or decreasing MRL. Over the past 10-15 years, several authors have discussed MRL for components or systems whose lifetimes are measured in discrete units (n... View full abstract»

• ### Estimating the cumulative downtime distribution of a highly reliable component

Publication Year: 1996, Page(s):369 - 374
Cited by:  Papers (2)
| | PDF (412 KB)

The distribution of the cumulative downtime for a highly reliable component over an interval of time is approximated using a compound Bernoulli process. Given a set of observed cumulative downtimes, the maximum likelihood (ML) and uniformly minimum variance unbiased (UMVU) estimator of the approximate cumulative downtime distribution are derived under the assumption of exponential repair times and... View full abstract»

• ### Applications and extensions of the chains-of-rare-events model

Publication Year: 1996, Page(s):417 - 421
Cited by:  Papers (2)
| | PDF (336 KB)

The chains-of-rare-events model (ChRE) is extended. The ChRE was originally introduced in order to analyze occurrences which can be produced with simple, double, triple, etc., multiplicity. In the original ChRE, each occurrence of multiplicity (i) is independently distributed according to a Poisson law with parameter λi ; and a simple relation for these parameters is considered. ... View full abstract»

• ### Predicting Field-Performance of Automotive Electronic Products

Publication Year: 1996
| | PDF (100 KB)

First Page of the Article
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• ### Time-constrained scheduling during high-level synthesis of fault-secure VLSI digital signal processors

Publication Year: 1996, Page(s):404 - 412
Cited by:  Papers (19)
| | PDF (948 KB)

Advances in VLSI technology are making it feasible to pack millions of transistors on a single chip. A consequent increase in the number of on-chip faults as well as the growing importance of quality-metrics such as reliability and fault-tolerance are making on-chip fault-tolerance mandatory. On-chip realization of a computation is fault-secure if an observable error in the computation is detected... View full abstract»

• ### Predictive Bayes design of Scram systems: related mathematics and philosophical implications

Publication Year: 1996, Page(s):485 - 490
| | PDF (392 KB)

The predictive Bayes approach to reliability provides a rational method for scoring different design solutions for systems which can fail. This statement is supported by solving the problem of optimal design of Scram systems (emergency systems) formed from constant-failure-rate components, and called into operation by plant-transients which occur according to a Poisson process. The lessons from th... View full abstract»

• ### A linear-time algorithm to find modules of fault trees

Publication Year: 1996, Page(s):422 - 425
Cited by:  Papers (38)
| | PDF (312 KB)

A module of a fault tree is a subtree whose terminal events do not occur elsewhere in the tree. Modules, which are independent subtrees, can be used to reduce the computational cost of basic operations on fault trees, such as the computation of the probability of the root event or the computation of the minimal cut sets. This paper presents a linear time algorithm to detect modules of a fault tree... View full abstract»

• ### Computational algebra applications in reliability theory

Publication Year: 1996, Page(s):393 - 399
Cited by:  Papers (2)
| | PDF (480 KB)

Reliability analysts are typically forced to choose between using an algorithmic programming language' or a reliability package' for analyzing their models and lifetime data. This paper shows that computational languages can be used to bridge the gap to combine the flexibility of a programming language with the ease of use of a package. Computational languages facilitate the development of new s... View full abstract»

## Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

## Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu