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Design & Test of Computers, IEEE

Issue 4 • Date Wiinter 1995

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Displaying Results 1 - 13 of 13
  • Management perspectives in EDA

    Publication Year: 1995
    Request Permissions | Click to expandAbstract | PDF file iconPDF (359 KB)  

    First Page of the Article
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  • Guest Editor's Introduction: Multimedia Drives Changes

    Publication Year: 1995
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    Freely Available from IEEE
  • Transitioning desktops to set tops

    Publication Year: 1995 , Page(s): 8 - 17
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1547 KB)  

    Video provides the greatest realism in multimedia and also demands the most from computer systems. Innovations already enable conventional desktops, such as RISC workstations, to handle compressed audio and low-resolution video signals. Similarly, interactive, real-time, 3D animation graphics produce data processing and transmission challenges. Meeting these challenges will transition desktop syst... View full abstract»

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  • Simulating multimedia systems with MVPSIM

    Publication Year: 1995 , Page(s): 18 - 27
    Cited by:  Papers (1)  |  Patents (1)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (3285 KB)  

    MVPSIM allows highly integrated system level simulations of complex, high-speed multimedia systems. It also aids multimedia software development by providing a uniform working environment to hardware architects and algorithm developers. MediaStation 5000 designers used MVPSIM to compare different architectures, testing and refining their design with various system level scenarios. MVPSIM can detec... View full abstract»

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  • Automatically assessing MPEG coding fidelity

    Publication Year: 1995 , Page(s): 28 - 33
    Cited by:  Papers (2)  |  Patents (1)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1671 KB)  

    As the market and number of products for multimedia applications grow, the need for testing methods and fidelity metrics becomes critical. Testing devices are important for the development and evaluation of multimedia products. This article describes a testing method and prototype that can be used for assessing MPEG coding fidelity. View full abstract»

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  • Testing multimedia transmission systems

    Publication Year: 1995 , Page(s): 34 - 44
    Cited by:  Papers (2)  |  Patents (2)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (2124 KB)  

    Digital television and the convergence of television and telecommunications challenges the television engineer to develop new test methods and new ways of using older methods. Supporting multimedia capabilities makes compressed data transmission an important issue. This article outlines a layered model for systems and testing analogous to the OSI model for communications systems and discusses spec... View full abstract»

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  • Testing defects in scan chains

    Publication Year: 1995 , Page(s): 45 - 51
    Cited by:  Papers (5)  |  Patents (4)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1263 KB)  

    Applying scan-based DFT, I/sub DDQ/ testing, or both to sequential circuits does not ensure bridging-fault detection, which depends on the resistance of the fault and circuit level parameters. With a "transparent" scan chain, however, the tester can use both methods to detect manufacturing process defects effectively-including difficult-to-detect shorts in the scan chain. The author presents a str... View full abstract»

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  • Timing-driven partial scan

    Publication Year: 1995 , Page(s): 52 - 59
    Cited by:  Papers (1)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1860 KB)  

    This partial scan approach reduces area overhead and performance degradation caused by test logic. Given an initial design that meets a target speed, the authors' algorithm selects a set of scan flip-flops that allows the circuit to meet performance requirements after the scan logic is added. If no such set exists, the algorithm selects a set that minimizes the total area increase caused by the sc... View full abstract»

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  • I/sub DDQ/ test and diagnosis of CMOS circuits

    Publication Year: 1995 , Page(s): 60 - 67
    Cited by:  Papers (21)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (2419 KB)  

    Designers must target realistic faults if they desire high-quality test and diagnosis of CMOS circuits. The authors propose a strategy for generating high-quality I/sub DDQ/ test patterns for bridging faults. They use a standard ATPG tool for stuck-at faults that adapts to target bridging faults via I/sub DDQ/ testing. The authors discuss I/sub DDQ/ test set diagnosis capability and specifically g... View full abstract»

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  • Testing and diagnosing managed networks

    Publication Year: 1995 , Page(s): 68 - 80
    Cited by:  Papers (1)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (2623 KB)  

    Computer and networking suppliers face a considerable challenge in verifying their equipment's functionality, both during manufacture and after installation. Users increasingly find the problem exacerbated when such equipment forms part of a heterogeneous network constructed of diverse products produced by various suppliers. The ISO/ITU test management protocol alleviates this problem by standardi... View full abstract»

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  • Shared-I/O scan test

    Publication Year: 1995 , Page(s): 81 - 83
    Cited by:  Papers (1)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1021 KB)  

    The IEEE P1149.2 standard seeks to implement several new features, such as shared-I/O cells, an optional parallel-update stage, and a high-impedance input pin. Although aspects of these features are incompatible with IEEE Std 1149.1, the working group strives to make P1149.2 consistent with the existing standard's primary goals. View full abstract»

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  • AD&T Roundtable Low-Power Design

    Publication Year: 1995
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1992 KB)  

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  • IEEE Design & Test of Competers: Annual Index, Volume 12

    Publication Year: 1995
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    Freely Available from IEEE

Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

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Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty