Balachandran, B.; Kerby, J.; Cooley, L.; Green, M. A.
Page(s): 107-109
Digital Object Identifier 10.1109/TASC.2009.2020868 Abstract
| Full Text: PDF (1031 KB)
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Operation of Toggle Flip-Flop Circuits Up to 500 GHz Based on Vertically-Stacked High-Temperature Superconductor Josephson Junctions
Kimura, T.; Kajino, K.; Watanabe, M.; Horii, Y.; Inoue, M.; Fujimaki, A.
Page(s): 127-130
Digital Object Identifier 10.1109/TASC.2009.2018252 Abstract
| Full Text: PDF (1473 KB)
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Hydrogen-Inclusion-Induced Critical Current Deviation of Nb/AlOx/Nb Josephson Junctions in Superconducting Integrated Circuits
Hinode, K.; Satoh, T.; Nagasawa, S.; Hidaka, M.
Page(s): 131-134
Digital Object Identifier 10.1109/TASC.2009.2018804 Abstract
| Full Text: PDF (247 KB)
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Process-Induced Variability of ${rm Nb/Al}/{rm AlO}_{rm x}/{rm Nb}$ Junctions in Superconductor Integrated Circuits and Protection Against It
Tolpygo, S.K.; Amparo, D.; Yohannes, D.T.; Meckbach, M.; Kirichenko, A.F.
Page(s): 135-139
Digital Object Identifier 10.1109/TASC.2009.2018253 Abstract
| Full Text: PDF (1239 KB)
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Characterization of Nanometer Step Structure Formation During the Fabrication of Large-Scale Superconducting-Tunnel-Junction Array Detectors
Ukibe, M.; Kurokawa, A.; Ohkubo, M.
Page(s): 140-143
Digital Object Identifier 10.1109/TASC.2009.2018509 Abstract
| Full Text: PDF (1106 KB)
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Amorphous Nb-Si Barrier Junctions for Voltage Standard and Digital Applications
Olaya, D.; Dresselhaus, P.D.; Benz, S.P.; Bjarnason, J.; Grossman, E.N.
Page(s): 144-148
Digital Object Identifier 10.1109/TASC.2009.2018254 Abstract
| Full Text: PDF (191 KB)
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Multi-${rm J}_{rm c}$ (Josephson Critical Current Density) Process for Superconductor Integrated Circuits
Yohannes, D.T.; Inamdar, A.; Tolpygo, S.K.
Page(s): 149-153
Digital Object Identifier 10.1109/TASC.2009.2019195 Abstract
| Full Text: PDF (937 KB)
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Effect of Electrical Stress on Josephson Tunneling Characteristics of ${rm Nb/Al/AlO}_{x}/{rm Nb}$ Junctions
Amparo, D.; Tolpygo, S.K.
Page(s): 154-158
Digital Object Identifier 10.1109/TASC.2009.2019022 Abstract
| Full Text: PDF (283 KB)
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Fabrication of Submicrometer High Current Density ${hbox{ Nb/Al-AlN}}_{rm x}/{hbox{ Nb}}$ Junctions
Kerber, G.L.; Kleinsasser, A.W.; Bumble, B.
Page(s): 159-166
Digital Object Identifier 10.1109/TASC.2009.2017859 Abstract
| Full Text: PDF (2128 KB)
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Planarization Process for Fabricating Multi-Layer Nb Integrated Circuits Incorporating Top Active Layer
Satoh, T.; Hinode, K.; Nagasawa, S.; Kitagawa, Y.; Hidaka, M.; Yoshikawa, N.; Akaike, H.; Fujimaki, A.; Takagi, K.; Takagi, N.
Page(s): 167-170
Digital Object Identifier 10.1109/TASC.2009.2018188 Abstract
| Full Text: PDF (575 KB)
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SIS Mixer Fabrication for ALMA Band10
Kroug, M.; Endo, A.; Tamura, T.; Noguchi, T.; Kojima, T.; Uzawa, Y.; Takeda, M.; Wang, Z.; Shan, W.
Page(s): 171-173
Digital Object Identifier 10.1109/TASC.2009.2017856 Abstract
| Full Text: PDF (690 KB)
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Stornaiuolo, D.; Cedergren, K.; Born, D.; Bauch, T.; Barone, A.; Lombardi, F.; Tafuri, F.
Page(s): 174-177
Digital Object Identifier 10.1109/TASC.2009.2018546 Abstract
| Full Text: PDF (380 KB)
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Preparation of Narrowed ${rm YBa}_{2}{rm Cu}_{3}{rm O}_{7-{rm x}}$ Nanobridges Down to 30 nm With Reduced Degradation
Kajino, K.; Kimura, T.; Horii, Y.; Watanabe, M.; Inoue, M.; Fujimaki, A.
Page(s): 178-182
Digital Object Identifier 10.1109/TASC.2009.2018189 Abstract
| Full Text: PDF (2711 KB)
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YBCO Nanobridges: Simplified Fabrication Process by Using a Ti Hard Mask
Papari, G.; Carillo, F.; Born, D.; Bartoloni, L.; Gambale, E.; Stornaiuolo, D.; Pingue, P.; Beltram, F.; Tafuri, F.
Page(s): 183-186
Digital Object Identifier 10.1109/TASC.2009.2019023 Abstract
| Full Text: PDF (467 KB)
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Observation of Shapiro-Steps in AFM-Plough Micron-Size YBCO Planar Constrictions
Srinivasu, V.V.; Perold, W.J.
Page(s): 187-190
Digital Object Identifier 10.1109/TASC.2009.2018542 Abstract
| Full Text: PDF (349 KB)
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Periodic Peak Modulations in Bi-2212 Stacks Coupled to a Submicrometer Hole
Kim, S.-J.
Page(s): 191-194
Digital Object Identifier 10.1109/TASC.2009.2018193 Abstract
| Full Text: PDF (498 KB)
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The Behavior of Subgap Structures of Intrinsic Josephson Junctions in $({rm Bi},{rm Pb})_{2}{rm Sr}_{2}{rm CaCu}_{2}{rm O}_{rm y}$Under Magnetic Field and Microwave Irradiation
Kaneoya, H.; Irie, A.; Oya, G.-i.
Page(s): 195-198
Digital Object Identifier 10.1109/TASC.2009.2019031 Abstract
| Full Text: PDF (176 KB)
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Optimization of a Low-Tc DC SQUID Amplifier With Tightly Coupled Input Coils
Pleikies, J.; Usenko, O.; Frossati, G.; Flokstra, J.
Page(s): 199-205
Digital Object Identifier 10.1109/TASC.2009.2019662 Abstract
| Full Text: PDF (282 KB)
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DC SQUID Modulation Electronics for Operation With HTS DC SQUID Magnetometers in the Unshielded Environment
Burmistrov, E.V.; Slobodchikov, V.Yu.; Khanin, V.V.; Maslennikov, Yu.V.; Snigirev, O.V.
Page(s): 206-209
Digital Object Identifier 10.1109/TASC.2009.2019427 Abstract
| Full Text: PDF (657 KB)
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Characteristics of High-$T_{rm c}$ Josephson Junction Fabricated by Focused Ion Beam and Ion Damage
Chiu-Hsien Wu; Wei-Cheng Kuo; Yu-Te Chou; Jau-Han Chen; Hong-Chang Yang
Page(s): 210-213
Digital Object Identifier 10.1109/TASC.2009.2018366 Abstract
| Full Text: PDF (1024 KB)
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Spreads in Critical Current and Normal Conductance of High-$T_{rm c}$ dc SQUID
Jen-Tzong Jeng; Chih-Cheng Lu; Chih-Cheng Wang; Chiu-Hsien Wu
Page(s): 214-217
Digital Object Identifier 10.1109/TASC.2009.2018142 Abstract
| Full Text: PDF (360 KB)
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Higher Order HTSC Gradiometer for Measurements in Unshielded Environment
Seidel, P.; Becker, C.; Steppke, A.; Schinkel, U.; Hoefer, K.; Grosse, V.; Engmann, S.; Schmidl, F.; Redlich, L.
Page(s): 218-221
Digital Object Identifier 10.1109/TASC.2009.2018143 Abstract
| Full Text: PDF (942 KB)
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Pentalevel Resist Process for the Precise Fabrication of Small Area SIS Junctions
Lichtenberger, A.W.; Stronko, G.S.; Jie Wang; Cecil, T.W.; Zhang, J.Z.
Page(s): 222-225
Digital Object Identifier 10.1109/TASC.2009.2019282 Abstract
| Full Text: PDF (441 KB)
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