Process simulation of reactive DC magnetron sputtering for thin film deposition of niobium-titanium nitride
Maezawa, H.; Sato, T.; Noguchi, T.
Page(s): 3520- 3523
Digital Object Identifier 10.1109/TASC.2005.849027 Abstract
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Gallium ion implantation into niobium thin films using a focused-ion beam
Datesman, A.M.; Schultz, J.C.; Cecil, T.W.; Lyons, C.M.; Lichtenberger, A.W.
Page(s): 3524- 3527
Digital Object Identifier 10.1109/TASC.2005.849029 Abstract
| Full Text: PDF (584 KB)
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Tuning of tungsten thin film superconducting transition temperature for fabrication of photon number resolving detectors
Lita, A.E.; Rosenberg, D.; Nam, S.; Miller, A.J.; Balzar, D.; Kaatz, L.M.; Schwall, R.E.
Page(s): 3528- 3531
Digital Object Identifier 10.1109/TASC.2005.849033 Abstract
| Full Text: PDF (168 KB)
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In-situ resistance measurements of RHQT processed Nb3Al superconductors
Tan, K.S.; Hopkins, S.C.; Pong, I.; Stearn, R.J.; Glowacki, B.A.; Kikuchi, A.; Takeuchi, T.; Inoue, K.
Page(s): 3532- 3535
Digital Object Identifier 10.1109/TASC.2005.849352 Abstract
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Fabrication of V-based Laves phase compound multifilamentary wires by applying a rapidly-heating/quenching process to PIT precursors and using a V tube
Hishinuma, Y.; Kikuchi, A.; Iijima, Y.; Yoshida, Y.; Takeuchi, T.; Nishimura, A.; Inoue, K.
Page(s): 3536- 3539
Digital Object Identifier 10.1109/TASC.2005.849353 Abstract
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Trial manufacture of a 2.5 km class long-length of Nb-matrix jelly-roll Nb/Al precursor wire for RHQT process
Tagawa, K.; Takeuchi, T.; Banno, N.; Iijima, Y.; Kikuchi, A.; Kitaguchi, H.; Iwaki, G.; Sakurai, Y.
Page(s): 3540- 3543
Digital Object Identifier 10.1109/TASC.2005.849354 Abstract
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Fabrication and superconducting properties of ex-situ PIT processed A15 type tape conductors
Kumakura, H.; Matsumoto, A.; Kitaguchi, H.; Yamada, H.; Hirakawa, M.; Tachikawa, K.
Page(s): 3544- 3547
Digital Object Identifier 10.1109/TASC.2005.849355 Abstract
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Mechanical properties of YBaCuO formed on Ni-based alloy substrates with IBAD buffer layers
Shikimachi, K.; Kashima, N.; Nagaya, S.; Muroga, T.; Miyata, S.; Watanabe, T.; Yamada, Y.; Izumi, T.; Shiohara, Y.
Page(s): 3548- 3551
Digital Object Identifier 10.1109/TASC.2005.849356 Abstract
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Effect of mechanical loading on the Ic degradation behavior of Bi-2223 tapes
Baldan, C.A.; Shigue, C.Y.; Filho, E.R.; Oliveira, U.R.
Page(s): 3552- 3555
Digital Object Identifier 10.1109/TASC.2005.849357 Abstract
| Full Text: PDF (400 KB)
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Fatigue behavior and its influence on the critical current of externally reinforced Bi-2223 superconducting tape
Hyung-Seop Shin; Dizon, J.R.C.; Ki-Hyun Kim; Sang-Soo Oh; Dong-Woo Ha
Page(s): 3556- 3559
Digital Object Identifier 10.1109/TASC.2005.849358 Abstract
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Compressive pre-strain in high-niobium-fraction Nb3Sn superconductors
Ekin, J.W.; Cheggour, N.; Abrecht, M.; Clickner, C.; Field, M.; Seung Hong; Parrell, J.; Youzhu Zhang
Page(s): 3560- 3563
Digital Object Identifier 10.1109/TASC.2005.849360 Abstract
| Full Text: PDF (184 KB)
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Large Tc, Bc2 and Ic enhancement effect due to the prebending treatment for bronze route Nb3Sn wires
Watanabe, K.; Awaji, S.; Oguro, H.; Nishijima, G.; Miyoshi, K.; Meguro, S.
Page(s): 3564- 3567
Digital Object Identifier 10.1109/TASC.2005.849361 Abstract
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Deformation behavior of Nb3Sn type superconductors
Chen, J.; Ke Han; Kalu, P.N.; Markiewicz, W.D.
Page(s): 3568- 3571
Digital Object Identifier 10.1109/TASC.2005.849362 Abstract
| Full Text: PDF (744 KB)
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Modeling of the effect of Nb3Sn strand composition on thermal strains and superconducting performance
Mitchell, N.
Page(s): 3572- 3576
Digital Object Identifier 10.1109/TASC.2005.849363 Abstract
| Full Text: PDF (400 KB)
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Magnetic-field dependence of the reversible axial-strain effect in Y-Ba-Cu-O coated conductors
Cheggour, N.; Ekin, J.W.; Thieme, C.L.H.
Page(s): 3577- 3580
Digital Object Identifier 10.1109/TASC.2005.849364 Abstract
| Full Text: PDF (200 KB)
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Reversible strain dependence of critical current in 100 a class coated conductors
Sugano, M.; Osamura, K.; Prusseit, W.; Semerad, R.; Kuroda, T.; Itoh, K.; Kiyoshi, T.
Page(s): 3581- 3584
Digital Object Identifier 10.1109/TASC.2005.849365 Abstract
| Full Text: PDF (640 KB)
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Nanohardness and crack resistance of HTS YBCO thin films
Verdyan, A.; Soifer, Y.M.; Azoulay, J.; Rabkin, E.; Kazakevich, M.
Page(s): 3585- 3588
Digital Object Identifier 10.1109/TASC.2005.849366 Abstract
| Full Text: PDF (256 KB)
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Temperature dependence of intermodulation distortion in YBCO: understanding nonlinearity
Oates, D.E.; Park, S.-H.; Agassi, D.; Koren, G.; Irgmaier, K.
Page(s): 3589- 3595
Digital Object Identifier 10.1109/TASC.2005.849367 Abstract
| Full Text: PDF (272 KB)
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Investigation into microwave power dependence of high quality Tl-1223 thin films on LSAT substrate
Jacob, M.V.; Sundaresan, A.; Mazierska, J.; Tanaka, Y.
Page(s): 3596- 3599
Digital Object Identifier 10.1109/TASC.2005.849368 Abstract
| Full Text: PDF (312 KB)
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Effects of grain boundaries on microwave surface resistance of superconducting films
Mawatari, Y.
Page(s): 3600- 3603
Digital Object Identifier 10.1109/TASC.2005.849369 Abstract
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Effects of non-uniform columnar defect distribution on the microwave properties of Y-Ba-Cu-O coplanar resonators
Ghigo, G.; Gozzelino, L.; Laviano, F.; Andreone, D.; Mezzetti, E.
Page(s): 3604- 3607
Digital Object Identifier 10.1109/TASC.2005.849370 Abstract
| Full Text: PDF (352 KB)
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A current-density scale for characterizing nonlinearity in high-Tc superconductors
Leong, K.T.; Booth, J.C.; Schima, S.A.
Page(s): 3608- 3611
Digital Object Identifier 10.1109/TASC.2005.849371 Abstract
| Full Text: PDF (176 KB)
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Nonlinearity in the microwave properties of MgB2 thin films: power dependence and intermodulation distortion
Andreone, A.; Aurino, M.; Cifariello, G.; Di Gennaro, E.; Lamura, G.; Orgiani, P.; Vaglio, R.; Xi, X.X.
Page(s): 3612- 3615
Digital Object Identifier 10.1109/TASC.2005.849372 Abstract
| Full Text: PDF (176 KB)
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Unexpected effect of field angle in magnetoresistance measurements of high-purity Nb
Goodrich, L.F.; Stauffer, T.C.; Splett, J.D.; Vecchia, D.F.
Page(s): 3616- 3619
Digital Object Identifier 10.1109/TASC.2005.849373 Abstract
| Full Text: PDF (144 KB)
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Development of a low-temperature electro-mechanical testing device
Mbaruku, A.L.; Trociewitz, U.P.; Schwartz, J.
Page(s): 3620- 3623
Digital Object Identifier 10.1109/TASC.2005.849374 Abstract
| Full Text: PDF (1632 KB)
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