Schwartz, J.; Luongo, C.; Foley, C.
Page(s): 68- 68
Digital Object Identifier 10.1109/TASC.2005.849693 Abstract
| Full Text: PDF (26 KB)
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2004 Conference Organization Officers and Board Members for the Applied Superconductivity Conference
Fabrication process of planarized multi-layer Nb integrated circuits
Satoh, T.; Hinode, K.; Akaike, H.; Nagasawa, S.; Kitagawa, Y.; Hidaka, M.
Page(s): 78- 81
Digital Object Identifier 10.1109/TASC.2005.849698 Abstract
| Full Text: PDF (400 KB)
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Six-layer process for the fabrication of Nb/Al-AlOx/Nb Josephson junction devices
Cantor, R.; Hall, J.
Page(s): 82- 85
Digital Object Identifier 10.1109/TASC.2005.849699 Abstract
| Full Text: PDF (1240 KB)
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Direct measurement of the Josephson plasma resonance frequency from I-V Characteristics
Kleinsasser, A.W.; Johnson, M.W.; Delin, K.A.
Page(s): 86- 89
Digital Object Identifier 10.1109/TASC.2005.849700 Abstract
| Full Text: PDF (240 KB)
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Yohannes, D.; Sarwana, S.; Tolpygo, S.K.; Sahu, A.; Polyakov, Y.A.; Semenov, V.K.
Page(s): 90- 93
Digital Object Identifier 10.1109/TASC.2005.849701 Abstract
| Full Text: PDF (736 KB)
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Efficient fabrication process for superconducting integrated circuits using photosensitive polyimide insulation layers
Kikuchi, K.; Goto, M.; Nakagawa, H.; Segawa, S.; Tokoro, K.; Taino, T.; Myoren, H.; Takada, S.; Aoyagi, M.
Page(s): 94- 97
Digital Object Identifier 10.1109/TASC.2005.849702 Abstract
| Full Text: PDF (1216 KB)
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New selective anodization process for Nb Josephson junction with AlOx barrier
Morohashi, S.; Ikuta, M.; Miyoshi, T.; Matsumoto, D.; Ariyoshi, S.; Ukibe, M.; Ohkubo, M.; Matsuo, H.
Page(s): 98- 101
Digital Object Identifier 10.1109/TASC.2005.849703 Abstract
| Full Text: PDF (384 KB)
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Effect of photomask pattern shape for a junction counter-electrode on critical current uniformity and controllability in Nb/AlOx/Nb junctions
Akaike, H.; Kitagawa, Y.; Satoh, T.; Hinode, K.; Nagasawa, S.; Hidaka, M.
Page(s): 102- 105
Digital Object Identifier 10.1109/TASC.2005.849704 Abstract
| Full Text: PDF (288 KB)
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Structural testing of the HYPRES niobium process
Joseph, A.A.; Sese, J.; Flokstra, J.; Kerkhoff, H.G.
Page(s): 106- 109
Digital Object Identifier 10.1109/TASC.2005.849705 Abstract
| Full Text: PDF (888 KB)
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Fabrication and measurement of tall stacked arrays of SNS Josephson junctions
Hadacek, N.; Dresselhaus, P.D.; Chong, Y.; Benz, S.P.; Bonevich, J.E.
Page(s): 110- 113
Digital Object Identifier 10.1109/TASC.2005.849706 Abstract
| Full Text: PDF (496 KB)
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RF properties of overdamped SIS junctions
Lacquaniti, V.; Cagliero, C.; Maggi, S.; Steni, R.; Andreone, D.; Sosso, A.
Page(s): 114- 116
Digital Object Identifier 10.1109/TASC.2005.849707 Abstract
| Full Text: PDF (152 KB)
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A fast turn-around time process for fabrication of qubit circuits
Patel, V.; Wei Chen; Pottorf, S.; Lukens, J.E.
Page(s): 117- 120
Digital Object Identifier 10.1109/TASC.2005.849708 Abstract
| Full Text: PDF (392 KB)
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SINIS junction series arrays for the Josephson arbitrary waveform synthesizer
Kohlmann, J.; Muller, F.; Behr, R.; Hagedorn, D.; Niemeyer, J.
Page(s): 121- 124
Digital Object Identifier 10.1109/TASC.2005.849709 Abstract
| Full Text: PDF (288 KB)
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Dilute Al-Mn alloys for superconductor tunneling and other devices
Ruggiero, S.T.; Arnold, G.B.; Williams, A.; Clark, A.M.; Miller, N.A.; Ullom, J.N.
Page(s): 125- 128
Digital Object Identifier 10.1109/TASC.2005.849710 Abstract
| Full Text: PDF (200 KB)
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Fabrication and characteristics of multi-terminal SINIS devices
Nevirkovets, I.P.; Chernyashevskyy, O.; Ketterson, J.B.
Page(s): 129- 132
Digital Object Identifier 10.1109/TASC.2005.849712 Abstract
| Full Text: PDF (200 KB)
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Proximity effect in NiCu-based Josephson tunnel junctions
Latempa, R.; Parlato, L.; Peluso, G.; Pepe, G.P.; Ruotolo, A.; Barone, A.; Golubov, A.A.
Page(s): 133- 136
Digital Object Identifier 10.1109/TASC.2005.849713 Abstract
| Full Text: PDF (160 KB)
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Transport properties of Nb/yttria-stabilized-zirconia/Nb Josephson junctions
Lam, S.K.H.; Gnanarajan, S.
Page(s): 137- 140
Digital Object Identifier 10.1109/TASC.2005.849716 Abstract
| Full Text: PDF (216 KB)
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Analysis of the barrier in vertically-stacked interface-treated Josephson junctions
Inoue, M.; Yoshinaga, Y.; Wakita, K.; Taniike, K.; Kimura, T.; Fujimaki, A.; Hayakawa, H.
Page(s): 141- 144
Digital Object Identifier 10.1109/TASC.2005.849718 Abstract
| Full Text: PDF (1592 KB)
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Vertically-stacked Josephson junctions using YbBa2Cu3O7-x as a counter electrode for improving uniformity
Kimura, T.; Wakita, K.; Yoshinaga, Y.; Taniike, K.; Nishitani, T.; Inoue, M.; Fujimaki, A.; Hayakawa, H.
Page(s): 145- 148
Digital Object Identifier 10.1109/TASC.2005.849719 Abstract
| Full Text: PDF (616 KB)
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Study of closely spaced YBa2Cu3O7-δ Josephson junction pairs
Ke Chen; Cybart, S.A.; Dynes, R.C.
Page(s): 149- 152
Digital Object Identifier 10.1109/TASC.2005.849722 Abstract
| Full Text: PDF (416 KB)
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Improvement in reproducibility of multilayer and junction process for HTS SFQ circuits
Wakana, H.; Adachi, S.; Kamitani, A.; Nakayama, K.; Ishimaru, Y.; Oshikubo, Y.; Tarutani, Y.; Tanabe, K.
Page(s): 153- 156
Digital Object Identifier 10.1109/TASC.2005.849723 Abstract
| Full Text: PDF (184 KB)
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Fabrication of high-quality multilayer structure for HTS-SFQ circuits using surface treatments
Nakayama, K.; Ishimaru, Y.; Wakana, H.; Adachi, S.; Tarutani, Y.; Tanabe, K.
Page(s): 157- 160
Digital Object Identifier 10.1109/TASC.2005.849729 Abstract
| Full Text: PDF (520 KB)
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