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Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Volume: 17  Issue: 12   Date: Dec. 2009
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A Fast Built-in Redundancy Analysis for Memories With Optimal Repair Rate Using a Line-Based Search Tree

Woosik Jeong; Ilkwon Kang; Kyowon Jin; Sungho Kang
Page(s): 1665-1678
Digital Object Identifier 10.1109/TVLSI.2008.2005988
Abstract  | Full Text: PDF (1703 KB)
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Impact of Die-to-Die and Within-Die Parameter Variations on the Clock Frequency and Throughput of Multi-Core Processors

Bowman, K.A.; Alameldeen, A.R.; Srinivasan, S.T.; Wilkerson, C.B.
Page(s): 1679-1690
Digital Object Identifier 10.1109/TVLSI.2008.2006057
Abstract  | Full Text: PDF (713 KB)
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Hardware Acceleration for Media/Transaction Applications in Network Processors

Byeong Kil Lee; John, L.K.
Page(s): 1691-1697
Digital Object Identifier 10.1109/TVLSI.2008.2006847
Abstract  | Full Text: PDF (664 KB)
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A 2.5-GHz Built-in Jitter Measurement System in a Serial-Link Transceiver

Shu-Yu Jiang; Kuo-Hsing Cheng; Pei-Yi Jian
Page(s): 1698-1708
Digital Object Identifier 10.1109/TVLSI.2008.2006476
Abstract  | Full Text: PDF (1455 KB)
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Floating-Point FPGA: Architecture and Modeling

Chun Hok Ho; Chi Wai Yu; Leong, P.; Luk, W.; Wilton, S.
Page(s): 1709-1718
Digital Object Identifier 10.1109/TVLSI.2008.2006616
Abstract  | Full Text: PDF (1305 KB)
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Improved Pervasive Sensing With RFID: An Ultra-Low Power Baseband Processor for UHF Tags

Ricci, A.; Grisanti, M.; De Munari, I.; Ciampolini, P.
Page(s): 1719-1729
Digital Object Identifier 10.1109/TVLSI.2008.2006617
Abstract  | Full Text: PDF (2294 KB)
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Power Management Using Test-Pattern Ordering for Wafer-Level Test During Burn-In

Bahukudumbi, S.; Chakrabarty, K.
Page(s): 1730-1741
Digital Object Identifier 10.1109/TVLSI.2008.2006679
Abstract  | Full Text: PDF (763 KB)
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A Low-Power, Fast Acquisition, Data Recovery Circuit With Digital Threshold Decision for SFI-5 Application

Qingjin Du; Jingcheng Zhuang; Kwasniewski, T.
Page(s): 1742-1748
Digital Object Identifier 10.1109/TVLSI.2009.2017794
Abstract  | Full Text: PDF (1385 KB)
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Gated Decap: Gate Leakage Control of On-Chip Decoupling Capacitors in Scaled Technologies

Yiran Chen; Hai Li; Roy, K.; Cheng-Kok Koh
Page(s): 1749-1752
Digital Object Identifier 10.1109/TVLSI.2008.2007843
Abstract  | Full Text: PDF (630 KB)
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2009 Index IEEE Transactions on Very Large Scale Integration (VLSI) Systems Vol. 17

Page(s): 1753-1776
Digital Object Identifier 10.1109/TVLSI.2009.2036832
Abstract  | Full Text: PDF (237 KB)
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems society information

Page(s): C3-C3
Digital Object Identifier 10.1109/TVLSI.2009.2036689
Abstract  | Full Text: PDF (27 KB)
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