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Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Volume: 16  Issue: 6   Date: June 2008
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Guest Editorial Special Section on Low-Power Electronics and Design

Marculescu, D.; Henkel, J.
Page(s): 609-610
Digital Object Identifier 10.1109/TVLSI.2008.2000343
Abstract  | Full Text: PDF (390 KB)
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Robust Multiple-Phase Switched-Capacitor DC–DC Power Converter With Digital Interleaving Regulation Scheme

Dongsheng Ma; Feng Luo
Page(s): 611-619
Digital Object Identifier 10.1109/TVLSI.2008.2000245
Abstract  | Full Text: PDF (1044 KB)
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Novel Video Memory Reduces 45% of Bitline Power Using Majority Logic and Data-Bit Reordering

Fujiwara, H.; Nii, K.; Noguchi, H.; Miyakoshi, J.; Murachi, Y.; Morita, Y.; Kawaguchi, H.; Yoshimoto, M.
Page(s): 620-627
Digital Object Identifier 10.1109/TVLSI.2008.2000249
Abstract  | Full Text: PDF (2139 KB)
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L-CBF: A Low-Power, Fast Counting Bloom Filter Architecture

Safi, E.; Moshovos, A.; Veneris, A.
Page(s): 628-638
Digital Object Identifier 10.1109/TVLSI.2008.2000244
Abstract  | Full Text: PDF (1584 KB)
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Dynamic Thermal Clock Skew Compensation Using Tunable Delay Buffers

Chakraborty, A.; Duraisami, K.; Sathanur, A.; Sithambaram, P.; Benini, L.; Macii, A.; Macii, E.; Poncino, M.
Page(s): 639-649
Digital Object Identifier 10.1109/TVLSI.2008.2000248
Abstract  | Full Text: PDF (2779 KB)
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Selective Writeback: Reducing Register File Pressure and Energy Consumption

Balkan, D.; Sharkey, J.; Ponomarev, D.; Ghose, K.
Page(s): 650-661
Digital Object Identifier 10.1109/TVLSI.2008.2000243
Abstract  | Full Text: PDF (1925 KB)
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GOP-Level Dynamic Thermal Management in MPEG-2 Decoding

Wonbok Lee; Patel, K.; Pedram, M.
Page(s): 662-672
Digital Object Identifier 10.1109/TVLSI.2008.2000251
Abstract  | Full Text: PDF (1094 KB)
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Self-Timed Regenerators for High-Speed and Low-Power On-Chip Global Interconnect

Singh, P.; Seo, J.-s.; Blaauw, D.; Sylvester, D.
Page(s): 673-677
Digital Object Identifier 10.1109/TVLSI.2008.2000250
Abstract  | Full Text: PDF (530 KB)
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A Current-Recycling Technique for Shadow-Match-Line Sensing in Content-Addressable Memories

Jian-Wei Zhang; Yi-Zheng Ye; Bin-Da Liu
Page(s): 677-682
Digital Object Identifier 10.1109/TVLSI.2008.2000247
Abstract  | Full Text: PDF (237 KB)
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Variability Driven Gate Sizing for Binning Yield Optimization

Davoodi, A.; Srivastava, A.
Page(s): 683-692
Digital Object Identifier 10.1109/TVLSI.2008.2000252
Abstract  | Full Text: PDF (513 KB)
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Enhancement of Fault Injection Techniques Based on the Modification of VHDL Code

Baraza, J.-C.; Gracia, J.; Blanc, S.; Gil, D.; Gil, P.-J.
Page(s): 693-706
Digital Object Identifier 10.1109/TVLSI.2008.2000254
Abstract  | Full Text: PDF (840 KB)
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Data Handling Limits of On-Chip Interconnects

Singhal, R.; Gwan Choi; Mahapatra, R.N.
Page(s): 707-713
Digital Object Identifier 10.1109/TVLSI.2008.2000255
Abstract  | Full Text: PDF (889 KB)
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Intelligent Robustness Insertion for Optimal Transient Error Tolerance Improvement in VLSI Circuits

Chong Zhao; Yi Zhao; Dey, S.
Page(s): 714-724
Digital Object Identifier 10.1109/TVLSI.2008.2000256
Abstract  | Full Text: PDF (915 KB)
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Test Set Development for Cache Memory in Modern Microprocessors

Al-Ars, Z.; Hamdioui, S.; Gaydadjiev, G.; Vassiliadis, S.
Page(s): 725-732
Digital Object Identifier 10.1109/TVLSI.2008.2000257
Abstract  | Full Text: PDF (800 KB)
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Integrated Floorplanning, Module-Selection, and Architecture Generation for Reconfigurable Devices

Smith, A.M.; Constantinides, G.A.; Cheung, P.
Page(s): 733-744
Digital Object Identifier 10.1109/TVLSI.2008.2000259
Abstract  | Full Text: PDF (927 KB)
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Accelerated Modeling of Massively Coupled RLC Interconnects Using the Relative Inductance Extraction Method

Shakeri, K.; Meindl, J.D.
Page(s): 745-754
Digital Object Identifier 10.1109/TVLSI.2008.2000365
Abstract  | Full Text: PDF (1975 KB)
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Diagnosis Framework for Locating Failed Segments of Path Delay Faults

Ying-Yen Chen; Jing-Jia Liou
Page(s): 755-765
Digital Object Identifier 10.1109/TVLSI.2008.2000367
Abstract  | Full Text: PDF (711 KB)
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Modeling of On-Chip Bus Switching Current and Its Impact on Noise in Power Supply Grid

Tuuna, S.; Li-Rong Zheng; Isoaho, J.; Tenhunen, H.
Page(s): 766-770
Digital Object Identifier 10.1109/TVLSI.2008.2000258
Abstract  | Full Text: PDF (256 KB)
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Timing Jitter and Power Spectral Density of Random Walk Noise in VCO

Shizhong Mei
Page(s): 770-774
Digital Object Identifier 10.1109/TVLSI.2008.2000362
Abstract  | Full Text: PDF (197 KB)
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Higher Radix and Redundancy Factor for Floating Point SRT Division

Anane, M.; Bessalah, H.; Issad, M.; Anane, N.; Salhi, H.
Page(s): 774-779
Digital Object Identifier 10.1109/TVLSI.2008.2000363
Abstract  | Full Text: PDF (310 KB)
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems information for authors

Page(s): 780-780
Digital Object Identifier 10.1109/TVLSI.2008.2000801
Abstract  | Full Text: PDF (27 KB)
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