Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Table of Contents
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume: 15  Issue: 1   Date: Jan 1993
  Forthcoming: 
Year: 
Select: 
 
Search this issue: 
   
Printer Friendly
Submit to Manuscript Central
Select All   Deselect All
Perception of 3-D surfaces from 2-D contours

Ulupinar, F.; Nevatia, R.
Page(s): 3-18
Digital Object Identifier 10.1109/34.184771
Abstract  | Full Text: PDF (1480 KB)
Rights and Permissions
Generic object recognition: building and matching coarse descriptions from line drawings

Bergevin, R.; Levine, M.D.
Page(s): 19-36
Digital Object Identifier 10.1109/34.184772
Abstract  | Full Text: PDF (1772 KB)
Rights and Permissions
Unbiased estimation and statistical analysis of 3-D rigid motion from two views

Kanatani, K.
Page(s): 37-50
Digital Object Identifier 10.1109/34.184773
Abstract  | Full Text: PDF (976 KB)
Rights and Permissions
View variation of point-set and line-segment features

Burns, J.B.; Weiss, R.S.; Riseman, E.M.
Page(s): 51-68
Digital Object Identifier 10.1109/34.184774
Abstract  | Full Text: PDF (1564 KB)
Rights and Permissions
Efficient parallel processing of image contours

Chen, L.T.; Davis, L.S.; Kruskal, C.P.
Page(s): 69-81
Digital Object Identifier 10.1109/34.184775
Abstract  | Full Text: PDF (1292 KB)
Rights and Permissions
Direct estimation of range flow on deformable shape from a video rate range camera

Yamamoto, M.; Boulanger, P.; Beraldin, J.-A.; Rioux, M.
Page(s): 82-89
Digital Object Identifier 10.1109/34.184776
Abstract  | Full Text: PDF (796 KB)
Rights and Permissions
Threshold validity for mutual neighborhood clustering

Smith, S.P.
Page(s): 89-92
Digital Object Identifier 10.1109/34.184777
Abstract  | Full Text: PDF (296 KB)
Rights and Permissions
 


 
Pattern Analysis and Machine Intelligence, IEEE Transactions on
 
Learn more about IEEE Journal & Magazine subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved