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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Volume: 23  Issue: 8   Date: Aug. 2004
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A divide-and-conquer algorithm for 3-D capacitance extraction

Weiping Shi; Fangqing Yu
Page(s):  1157- 1163
Digital Object Identifier 10.1109/TCAD.2004.831595
Abstract  | Full Text: PDF (464 KB)
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Transition reduction in memory buses using sector-based encoding techniques

Aghaghiri, Y.; Fallah, F.; Pedram, M.
Page(s):  1164- 1174
Digital Object Identifier 10.1109/TCAD.2004.831589
Abstract  | Full Text: PDF (320 KB)
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Register binding-based RTL power management for control-flow intensive designs

Jiong Luo; Lin Zhong; Yunsi Fei; Jha, N.K.
Page(s):  1175- 1183
Digital Object Identifier 10.1109/TCAD.2004.831597
Abstract  | Full Text: PDF (408 KB)
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Optimal integer delay-budget assignment on directed acyclic graphs

Bozorgzadeh, E.; Ghiasi, S.; Takahashi, A.; Sarrafzadeh, M.
Page(s):  1184- 1199
Digital Object Identifier 10.1109/TCAD.2004.829812
Abstract  | Full Text: PDF (736 KB)
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The spectral grid method: a novel fast Schrodinger-equation solver for semiconductor nanodevice simulation

Qing Huo Liu; Candong Cheng; Massoud, H.Z.
Page(s):  1200- 1208
Digital Object Identifier 10.1109/TCAD.2004.831592
Abstract  | Full Text: PDF (392 KB)
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Efficient simulation of coupled circuit-field problems: generalized Falk method

Loc Vu-Quoc; Yuhu Zhai; Ngo, K.D.T.
Page(s):  1209- 1219
Digital Object Identifier 10.1109/TCAD.2004.832640
Abstract  | Full Text: PDF (432 KB)
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Fault testing for reversible circuits

Patel, K.N.; Hayes, J.P.; Markov, I.L.
Page(s):  1220- 1230
Digital Object Identifier 10.1109/TCAD.2004.831576
Abstract  | Full Text: PDF (368 KB)
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Statistical clock skew analysis considering intradie-process variations

Agarwal, A.; Zolotov, V.; Blaauw, D.T.
Page(s):  1231- 1242
Digital Object Identifier 10.1109/TCAD.2004.831573
Abstract  | Full Text: PDF (560 KB)
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Logic of constraints: a quantitative performance and functional constraint formalism

Xi Chen; Hsieh, H.; Balarin, F.; Watanabe, Y.
Page(s):  1243- 1255
Digital Object Identifier 10.1109/TCAD.2004.831575
Abstract  | Full Text: PDF (336 KB)
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Interconnect coupling-aware driver modeling in static noise analysis for nanometer circuits

Xiaoliang Bai; Chandra, R.; Dey, S.; Srinivas, P.V.
Page(s):  1256- 1263
Digital Object Identifier 10.1109/TCAD.2004.831568
Abstract  | Full Text: PDF (496 KB)
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Computation of signal-threshold crossing times directly from higher order moments

Ismail, Y.I.; Amin, C.S.
Page(s):  1264- 1276
Digital Object Identifier 10.1109/TCAD.2004.829795
Abstract  | Full Text: PDF (1544 KB)
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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems information for authors

Page(s):  c4- c4
Digital Object Identifier 10.1109/TCAD.2004.834667
Abstract  | Full Text: PDF (25 KB)
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