Welcome to IEEE Xplore 2.0: Pattern Analysis and Machine Intelligence, IEEE Transactions on

Cart | Sitemap | Help

Table of Contents


	BROWSE	SEARCH	IEEE XPLORE GUIDE	SUPPORT

Pattern Analysis and Machine Intelligence, IEEE Transactions on

Volume: 13 Issue: 7 Date: Jul 1991

Forthcoming:

Year:

Select:

Search this issue:

Select All Deselect All

Surface reflection: physical and geometrical perspectives

Nayar, S.K.; Ikeuchi, K.; Kanade, T.
Page(s): 611-634
Digital Object Identifier 10.1109/34.85654
Abstract | Full Text: PDF (1884 KB)
Rights and Permissions

Constraining object features using a polarization reflectance model

Wolff, L.B.; Boult, T.E.
Page(s): 635-657
Digital Object Identifier 10.1109/34.85655
Abstract | Full Text: PDF (2116 KB)
Rights and Permissions

Surface identification using the dichromatic reflection model

Tominaga, S.
Page(s): 658-670
Digital Object Identifier 10.1109/34.85656
Abstract | Full Text: PDF (1104 KB)
Rights and Permissions

Reflections on shading

Forsyth, D.; Zisserman, A.
Page(s): 671-679
Digital Object Identifier 10.1109/34.85657
Abstract | Full Text: PDF (736 KB)
Rights and Permissions

Estimation of illuminant direction, albedo, and shape from shading

Zheng, Q.; Chellappa, R.
Page(s): 680-702
Digital Object Identifier 10.1109/34.85658
Abstract | Full Text: PDF (2468 KB)
Rights and Permissions

Dynamic 3D models with local and global deformations: deformable superquadrics

Terzopoulos, D.; Metaxas, D.
Page(s): 703-714
Digital Object Identifier 10.1109/34.85659
Abstract | Full Text: PDF (1004 KB)
Rights and Permissions

Closed-form solutions for physically based shape modeling and recognition

Pentland, A.; Sclaroff, S.
Page(s): 715-729
Digital Object Identifier 10.1109/34.85660
Abstract | Full Text: PDF (1596 KB)
Rights and Permissions

Recovery of nonrigid motion and structure

Pentland, A.; Horowitz, B.
Page(s): 730-742
Digital Object Identifier 10.1109/34.85661
Abstract | Full Text: PDF (1448 KB)
Rights and Permissions

Learn more about IEEE Journal & Magazine subscriptions

Help Contact Us Privacy & Security IEEE.org