An automatic wafer inspection system using pipelined image
processing techniques
Yoda, H.; Ohuchi, Y.; Taniguchi, Y.; Ejiri, M.
Page(s): 4-16
Digital Object Identifier 10.1109/34.3863 Abstract
| Full Text: PDF (1212 KB)
Rights and Permissions
Measuring photolithographic overlay accuracy and critical
dimensions by correlating binarized Laplacian of Gaussian convolutions
Nishihara, H.K.; Crossley, P.A.
Page(s): 17-30
Digital Object Identifier 10.1109/34.3864 Abstract
| Full Text: PDF (1964 KB)
Rights and Permissions
Automatic solder joint inspection
Bartlett, S.L.; Besl, P.J.; Cole, C.L.; Jain, R.; Mukherjee, D.; Skifstad, K.D.
Page(s): 31-43
Digital Object Identifier 10.1109/34.3865 Abstract
| Full Text: PDF (1340 KB)
Rights and Permissions
Structured highlight inspection of specular surfaces
Sanderson, A.C.; Weiss, L.E.; Nayar, S.K.
Page(s): 44-55
Digital Object Identifier 10.1109/34.3866 Abstract
| Full Text: PDF (1068 KB)
Rights and Permissions
A rule based approach for visual pattern inspection
Darwish, A.M.; Jain, A.K.
Page(s): 56-68
Digital Object Identifier 10.1109/34.3867 Abstract
| Full Text: PDF (1008 KB)
Rights and Permissions
A system for PCB automated inspection using fluorescent light
Hara, Y.; Doi, H.; Karasaki, K.; Iida, T.
Page(s): 69-78
Digital Object Identifier 10.1109/34.3868 Abstract
| Full Text: PDF (736 KB)
Rights and Permissions
Automated X-ray inspection of aluminum castings
Boerner, H.; Strecker, H.
Page(s): 79-91
Digital Object Identifier 10.1109/34.3869 Abstract
| Full Text: PDF (1564 KB)
Rights and Permissions
Texture measures for carpet wear assessment
Siew, L.H.; Hodgson, R.M.; Wood, E.J.
Page(s): 92-105
Digital Object Identifier 10.1109/34.3870 Abstract
| Full Text: PDF (932 KB)
Rights and Permissions
A monolithic Hough transform processor based on restructurable VLSI
Rhodes, F.M.; Dituri, J.J.; Chapman, G.H.; Emerson, B.E.; Soares, A.M.; Raffel, J.I.
Page(s): 106-110
Digital Object Identifier 10.1109/34.3873 Abstract
| Full Text: PDF (508 KB)
Rights and Permissions
A pipelined image analysis system using custom integrated circuits
A line extraction method for automated SEM inspection of VLSI
resist
Shu, D.B.; Li, C.C.; Mancuso, J.F.; Sun, Y.N.
Page(s): 117-120
Digital Object Identifier 10.1109/34.3875 Abstract
| Full Text: PDF (384 KB)
Rights and Permissions
A real-time processor for the Hough transform
Hanahara, K.; Maruyama, T.; Uchiyama, T.
Page(s): 121-125
Digital Object Identifier 10.1109/34.3876 Abstract
| Full Text: PDF (520 KB)
Rights and Permissions
Cart
