Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Table of Contents
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Volume: 10  Issue: 2   Date: Apr 2002
  Forthcoming: 
Year: 
Select: 
 
Search this issue: 
   
Printer Friendly
Submit to Manuscript Central
Select All   Deselect All
Guest editorial: low-power electronics and design

Macii, E.; Verbauwhede, I.
Page(s): 69-70
Digital Object Identifier 10.1109/TVLSI.2002.994976
Abstract  | Full Text: PDF (153 KB)
Rights and Permissions
Energy-efficient noise-tolerant dynamic styles for scaled-down CMOS and MTCMOS technologies

Anis, M.H.; Allam, M.W.; Elmasry, M.I.
Page(s): 71-78
Digital Object Identifier 10.1109/92.994977
Abstract  | Full Text: PDF (332 KB)
Rights and Permissions
Duet: an accurate leakage estimation and optimization tool for dual-Vt circuits

Sirichotiyakul, S.; Edwards, T.; Chanhee Oh; Panda, R.; Blaauw, D.
Page(s): 79-90
Digital Object Identifier 10.1109/92.994980
Abstract  | Full Text: PDF (345 KB)
Rights and Permissions
Analysis of dual-VT SRAM cells with full-swing single-ended bit line sensing for on-chip cache

Hamzaoglu, F.; Ye, Y.; Keshavarzi, A.; Zhang, K.; Narendra, S.; Borkar, S.; Stan, M.; De, V.
Page(s): 91-95
Digital Object Identifier 10.1109/92.994983
Abstract  | Full Text: PDF (270 KB)
Rights and Permissions
Layout-driven memory synthesis for embedded systems-on-chip

Benini, L.; Macchiarulo, L.; Macii, A.; Poncino, M.
Page(s): 96-105
Digital Object Identifier 10.1109/92.994985
Abstract  | Full Text: PDF (301 KB)
Rights and Permissions
Memory power models for multilevel power estimation and optimization

Schmidt, E.; von Colln, G.; Kruse, L.; Theeuwen, F.; Nebel, W.
Page(s): 106-109
Digital Object Identifier 10.1109/92.994987
Abstract  | Full Text: PDF (237 KB)
Rights and Permissions
Power-optimal encoding for a DRAM address bus

Wei-Chung Cheng; Pedram, M.
Page(s): 109-118
Digital Object Identifier 10.1109/92.994988
Abstract  | Full Text: PDF (405 KB)
Rights and Permissions
Power-aware operating systems for interactive systems

Yung-Hsiang Lu; Benini, L.; De Micheli, G.
Page(s): 119-134
Digital Object Identifier 10.1109/92.994989
Abstract  | Full Text: PDF (478 KB)
Rights and Permissions
Energy scalable system design

Sinha, A.; Wang, A.; Chandrakasan, A.
Page(s): 135-145
Digital Object Identifier 10.1109/92.994990
Abstract  | Full Text: PDF (472 KB)
Rights and Permissions
Cycle-accurate energy measurement and characterization with a case study of the ARM7TDMI [microprocessors]

Naehyuck Chang; Kwanho Kim; Hyung Gyu Lee
Page(s): 146-154
Digital Object Identifier 10.1109/92.994992
Abstract  | Full Text: PDF (452 KB)
Rights and Permissions
Power estimation methods for analog circuits for architectural exploration of integrated systems

Lauwers, E.; Gielen, G.
Page(s): 155-162
Digital Object Identifier 10.1109/92.994993
Abstract  | Full Text: PDF (296 KB)
Rights and Permissions
A low-power high-speed class-AB buffer amplifier for flat-panel-display application

Chih-Wen Lu; Chung Len Lee
Page(s): 163-168
Digital Object Identifier 10.1109/92.994994
Abstract  | Full Text: PDF (305 KB)
Rights and Permissions
On the design of low-voltage, low-power CMOS analog multipliers for RF applications

Debono, C.J.; Maloberti, F.; Micallef, J.
Page(s): 168-174
Digital Object Identifier 10.1109/92.994995
Abstract  | Full Text: PDF (397 KB)
Rights and Permissions
Guest editorial - system-level interconnect prediction

Stroobandt, D.
Page(s): 175-176
Digital Object Identifier 10.1109/TVLSI.2002.994996
Abstract  | Full Text: PDF (154 KB)
Rights and Permissions
Toward better wireload models in the presence of obstacles

Chung-Kuan Cheng; Kahng, A.B.; Bao Liu; Stroobandt, D.
Page(s): 177-189
Digital Object Identifier 10.1109/92.994997
Abstract  | Full Text: PDF (519 KB)
Rights and Permissions
 


 
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
 
Learn more about IEEE Journal & Magazine subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved