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Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume: 22  Issue: 6   Date: Jun 2000
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Exploring texture ensembles by efficient Markov chain Monte Carlo-Toward a “trichromacy” theory of texture

Zhu, S.C.; Liu, X.W.; Wu, Y.N.
Page(s): 554-569
Digital Object Identifier 10.1109/34.862195
Abstract  | Full Text: PDF (4700 KB)
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Evolutionary pursuit and its application to face recognition

Liu, C.; Wechsler, H.
Page(s): 570-582
Digital Object Identifier 10.1109/34.862196
Abstract  | Full Text: PDF (1296 KB)
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Classification with nonmetric distances: image retrieval and class representation

Jacobs, D.W.; Weinshall, D.; Gdalyahu, Y.
Page(s): 583-600
Digital Object Identifier 10.1109/34.862197
Abstract  | Full Text: PDF (1188 KB)
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Finding curvilinear features in spatial point patterns: principal curve clustering with noise

Stanford, D.C.; Raftery, A.E.
Page(s): 601-609
Digital Object Identifier 10.1109/34.862198
Abstract  | Full Text: PDF (276 KB)
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Fast and globally convergent pose estimation from video images

Lu, C.-P.; Hager, G.D.; Mjolsness, E.
Page(s): 610-622
Digital Object Identifier 10.1109/34.862199
Abstract  | Full Text: PDF (332 KB)
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Fractional-step dimensionality reduction

Lotlikar, R.; Kothari, R.
Page(s): 623-627
Digital Object Identifier 10.1109/34.862200
Abstract  | Full Text: PDF (192 KB)
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Bayesian graph edit distance

Myers, R.; Wison, R.C.; Hancock, E.R.
Page(s): 628-635
Digital Object Identifier 10.1109/34.862201
Abstract  | Full Text: PDF (572 KB)
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Precise candidate selection for large character set recognition by confidence evaluation

Liu, C.-L.; Nakagawa, M.
Page(s): 636-641
Digital Object Identifier 10.1109/34.862202
Abstract  | Full Text: PDF (220 KB)
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Ordering and parameterizing scattered 3D data for B-spline surface approximation

Cohen, F.S.; Ibrahim, W.; Pintavirooj, C.
Page(s): 642-648
Digital Object Identifier 10.1109/34.862203
Abstract  | Full Text: PDF (712 KB)
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