Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Table of Contents
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume: 22  Issue: 1   Date: Jan 2000
  Forthcoming: 
Year: 
Select: 
 
Search this issue: 
   
Printer Friendly
Submit to Manuscript Central
Select All   Deselect All
The 20th anniversary of the IEEE transactions on pattern analysis and machine intelligence

Bowyer, K.; Flynn, P.; Kasturi, R.
Page(s): 1-3
Digital Object Identifier 10.1109/TPAMI.2000.824818
Abstract  | Full Text: PDF (124 KB)
Rights and Permissions
Statistical pattern recognition: a review

Jain, A.K.; Duin, R.P.W.; Jianchang Mao
Page(s): 4-37
Digital Object Identifier 10.1109/34.824819
Abstract  | Full Text: PDF (1708 KB)
Rights and Permissions
Twenty years of document image analysis in PAMI

Nagy, G.
Page(s): 38-62
Digital Object Identifier 10.1109/34.824820
Abstract  | Full Text: PDF (1344 KB)
Rights and Permissions
Online and off-line handwriting recognition: a comprehensive survey

Plamondon, R.; Srihari, S.N.
Page(s): 63-84
Digital Object Identifier 10.1109/34.824821
Abstract  | Full Text: PDF (1216 KB)
Rights and Permissions
Medical image analysis: progress over two decades and the challenges ahead

Duncan, J.S.; Ayache, N.
Page(s): 85-106
Digital Object Identifier 10.1109/34.824822
Abstract  | Full Text: PDF (1372 KB)
Rights and Permissions
Looking at people: sensing for ubiquitous and wearable computing

Pentland, A.
Page(s): 107-119
Digital Object Identifier 10.1109/34.824823
Abstract  | Full Text: PDF (812 KB)
Rights and Permissions
Angular bisector network, a simplified generalized Voronoi diagram: application to processing complex intersections in biomedical images

Cloppet, F.; Oliva, J.-M.; Stamon, G.
Page(s): 120-128
Digital Object Identifier 10.1109/34.824824
Abstract  | Full Text: PDF (364 KB)
Rights and Permissions
 


 
Pattern Analysis and Machine Intelligence, IEEE Transactions on
 
Learn more about IEEE Journal & Magazine subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved