Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Table of Contents
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume: 11  Issue: 10   Date: Oct 1989
  Forthcoming: 
Year: 
Select: 
 
Search this issue: 
   
Printer Friendly
Submit to Manuscript Central
Select All   Deselect All
Image flow segmentation and estimation by constraint line clustering

Schunck, B.G.
Page(s): 1010-1027
Digital Object Identifier 10.1109/34.42834
Abstract  | Full Text: PDF (2064 KB)
Rights and Permissions
Toward a model-based Bayesian theory for estimating and recognizing parameterized 3-D objects using two or more images taken from different positions

Cernuschi-Frias, B.; Cooper, D.B.; Hung, Y.-P.; Belhumeur, P.N.
Page(s): 1028-1052
Digital Object Identifier 10.1109/34.42835
Abstract  | Full Text: PDF (2396 KB)
Rights and Permissions
3-D moment forms: their construction and application to object identification and positioning

Lo, C.-H.; Don, H.-S.
Page(s): 1053-1064
Digital Object Identifier 10.1109/34.42836
Abstract  | Full Text: PDF (964 KB)
Rights and Permissions
Geometric precision in noise-free digital images

Havelock, D.I.
Page(s): 1065-1075
Digital Object Identifier 10.1109/34.42837
Abstract  | Full Text: PDF (1056 KB)
Rights and Permissions
Skeletonization via the realization of the fire front's propagation and extinction in digital binary shapes

Xia, Y.
Page(s): 1076-1086
Digital Object Identifier 10.1109/34.42838
Abstract  | Full Text: PDF (960 KB)
Rights and Permissions
Estimation of classifier performance

Fukunaga, K.; Hayes, R.R.
Page(s): 1087-1101
Digital Object Identifier 10.1109/34.42839
Abstract  | Full Text: PDF (960 KB)
Rights and Permissions
Obstacle avoidance using flow field divergence

Nelson, R.C.; Aloimonos, J.
Page(s): 1102-1106
Digital Object Identifier 10.1109/34.42840
Abstract  | Full Text: PDF (636 KB)
Rights and Permissions
Localization and noise in edge detection

De Micheli, E.; Caprile, B.; Ottonello, P.; Torre, V.
Page(s): 1106-1117
Digital Object Identifier 10.1109/34.42841
Abstract  | Full Text: PDF (1236 KB)
Rights and Permissions
Line-drawing interpretation: bilateral symmetry

Nalwa, V.S.
Page(s): 1117-1120
Digital Object Identifier 10.1109/34.42842
Abstract  | Full Text: PDF (452 KB)
Rights and Permissions
 


 
Pattern Analysis and Machine Intelligence, IEEE Transactions on
 
Learn more about IEEE Journal & Magazine subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved