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Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on

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Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on

Date 21-23 March 2005

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Title History

Proceedings. 6th international symposium on quality electronic design

Table of contents

Welcome Notes

Organizing Committee

Technical Subcommittees

Steering/Advisory Committee

Conference at a Glance

Design of sub-90 nm circuits and design methodologies

Modeling and design of chip-package interface

IP Creation and Use What Roadblocks are Ahead or it is Just Clear and Bumpy Road?

Enabling true design for manufacturability

Recent progress and remaining challenges in pattern transfer technologies for advanced chip designs

Shifting perspectives on DFM

Toward quality EDA tools and tool flows through high-performance computing

Noise library characterization for large capacity static noise analysis tools

Two-dimensional layout migration by soft constraint satisfaction

Domain strategy and coverage metric for validation

Power supply noise-aware scheduling and allocation for DSP synthesis

Reducing power consumption during TLB lookups in a PowerPC™ embedded processor

TFT-LCD application specific low power SRAM using charge-recycling technique

Error analysis for the support of robust voltage scaling

Analytical study of impact ionization and subthreshold current in submicron n-MOSFET

Analysis and optimization of static power considering transition dependency of leakage current in VLSI circuits

Controlled-load limited switch dynamic logic circuit

Dynamically pulsed MTCMOS with bus encoding for total power and crosstalk minimization

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