Date 8-12 Nov. 1992
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Displaying Results 1 - 25 of 110
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A comparative study of design for testability methods using high-level and gate-level descriptions
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PDF (542 KB)
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Behavioral synthesis for testability
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PDF (436 KB)
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Area minimization for general floorplans
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PDF (435 KB)
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COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits
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PDF (703 KB)
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Valid clocking in wavepipelined circuits
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PDF (638 KB)
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Exploiting multi-cycle false paths in the performance optimization of sequential circuits
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PDF (734 KB)
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Design of system interface modules
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PDF (463 KB)


