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Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. International Conference on

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Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. International Conference on

Date 3-5 Sept. 2003

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2003 IEEE International Conference on Simulation of Semiconductor Processes and Devices (Cat. No.03TH8679)

Modeling and characterization of copper interconnects for SoC design

Experimental studies of dopant diffusion in strained Si and SiGe

Experimental study on carrier transport mechanism in ultrathin-body SOI MOSFETs

Quantum-dot cellular automata: an architecture for molecular computing

Microstructure development and evolution

CLIMATE (chip-level intertwined metal and active temperature estimator)

Scaling laws for the resistivity increase of sub-100 nm interconnects

Non-destructive inverse modeling of copper interconnect structure for 90nm technology node

Simple wide-band on-chip inductor model for silicon-based RF ICs

A novel technique for full-wave modeling of large-scale three-dimensional high-speed on/off-chip interconnect structures

Photoresist flow simulation using the viscous flow model

A new remote Coulomb scattering model for ultrathin oxide MOSFETs

Mobility in UTB-SOI PFETS: local coordinate-based modeling with the density gradient method

Substrate orientation-dependence of electron mobility in strained SiGe layers

Topography and Schottky contact models applied to NiSi SALICIDE process [MOSFET applications]

Reformulation of macroscopic transport models based on the moments of the scattering integral [semiconductor device modeling applications]

Analysis of gate currents through high-k dielectrics using a Monte Carlo device simulator [MOSFET applications]

Calibration of hole scattering rates in silicon with a large set of experimental data including high voltage quantum yield, drain disturb and substrate hole injection

The physical and numerical implications of the noise modeling method: IFM, CPM, and ERS

Thermal noise modeling for short-channel MOSFETs

Simulation of noise characteristics caused by discretized traps in MOSFETs

Hydrodynamic simulation of RF noise in deep-submicron MOSFETs

Random dopant fluctuation modelling with the impedance field method

Analysis of fluctuations in ultra-small semiconductor devices

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