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17-17 Oct. 2002

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Displaying Results 1 - 25 of 84
  • 2002 IEEE AUTOTESTCON Proceedings. Systems Readiness Technology Conference. 'The New Millennium Challenge - Transforming Test' (Cat. No.02CH37350)

    Publication Year: 2002
    Request permission for commercial reuse | PDF file iconPDF (366 KB)
    Freely Available from IEEE
  • Author index

    Publication Year: 2002, Page(s):xxii - xxiii
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    Freely Available from IEEE
  • UUT test requirements capture in any language you like... and still compliant with the IEEE Signal definition and test description standard

    Publication Year: 2002, Page(s):411 - 433
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1011 KB) | HTML iconHTML

    This paper examines how to create consistent, portable, usable UUT requirement specifications utilizing COTS computer languages such as Basic, Java, C or C++. It goes on to describe the benefits of using standard, common building blocks that represent signals, and identifies the importance of allowing users to extend their own signal components. It concludes by showing several examples of the same... View full abstract»

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  • Overview and applications of the IEEE P1451.4 smart sensor interface standard

    Publication Year: 2002, Page(s):777 - 786
    Cited by:  Papers (2)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (454 KB) | HTML iconHTML

    With the goal of promoting the development and adoption of smart transducers, the IEEE 1451 family of smart sensor interface standards defines a set of standardized interfaces for different categories of smart sensors and smart actuators. One member of this family, the IEEE P1451.4 standard, defines a mixed-mode interface that combines that traditional analog sensor signal with a digital interface... View full abstract»

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  • Reducing No Fault Found using statistical processing and an expert system

    Publication Year: 2002, Page(s):872 - 878
    Cited by:  Papers (3)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (418 KB) | HTML iconHTML

    This paper describes a method for capturing avionics test failure results from Automated Test Equipment (ATE) and statistically processing this data to provide decision support for software engineers in reducing No Fault Found (NFF) cases at various testing levels. NFFs have plagued the avionics test and repair environment for years at enormous cost to readiness and logistics support. The costs in... View full abstract»

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  • Knowledge representation considerations for integration of diagnostic maturation information

    Publication Year: 2002, Page(s):855 - 871
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (929 KB) | HTML iconHTML

    With increasing frequency engineers, systems analysts, and software application developers are obliged to quickly acquire broad-based knowledge in unfamiliar information domains. Often requisite information sources are embodied in a stream of open source data, such as a network of World Wide Web sites or a proprietary customer document or data repository. When this occurs, the principal impediment... View full abstract»

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  • A reference architecture for remote diagnostics and prognostics applications

    Publication Year: 2002, Page(s):842 - 853
    Cited by:  Papers (2)  |  Patents (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (692 KB) | HTML iconHTML

    This paper describes a reference architecture for developing and implementing software applications that perform remote vehicle diagnostics and prognostics. The reference architecture incorporates emerging standard server technologies at the application level to ensure portability across a broad range of server platforms and to promote reuse of core application components across diverse end user d... View full abstract»

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  • How the Internet is transforming test and measurement

    Publication Year: 2002, Page(s):498 - 502
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (297 KB) | HTML iconHTML

    The Internet will have a profound effect on the future of the test and measurement industry. Web-based communication of data will become more commonplace and more important to engineers as they are required to share such information. The Internet not only automates measurement procedures but also allows the information to be shared on a global scale. Users can achieve efficiency that has not exist... View full abstract»

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  • Real-time, embedded diagnostics and prognostics in advanced artillery systems

    Publication Year: 2002, Page(s):818 - 841
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (986 KB) | HTML iconHTML

    This paper explores an integrated modeling and reasoning approach to real-time, embedded diagnostics and prognostics called the Armament Diagnostic And Prognostic Tool (ADAPT). In addition, an approach for using the real-time diagnostic and prognostic information for degraded operation control of armament systems is described. The application focus of this paper is on advanced armament system gun ... View full abstract»

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  • Partnering for test - does it work?

    Publication Year: 2002, Page(s):490 - 497
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (521 KB) | HTML iconHTML

    Government partnering with industry for operational flight program (OFP) software test and evaluation is not a new concept. The intent of this paper is to show how the focus of the US Air Force has changed to meet the demand of a more responsive and affordable logistics system through revised partnering concepts and how it applies to software test. To understand what, why and how changes in the lo... View full abstract»

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  • Nanotechnology impact on aircraft design and maintenance

    Publication Year: 2002, Page(s):769 - 776
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (630 KB) | HTML iconHTML

    This paper describes unique research efforts relating to the development of nanoscale devices to replace standard integrated circuits, and eventually entire electronic systems. Standard integrated circuits (IC) have limitations or restrictions in size, speed, reliability, complexity and finding suitable replacements for discontinued items. Nanoscale device development and understanding has dramati... View full abstract»

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  • Evaluation of economics of testing in a manufacturing environment

    Publication Year: 2002, Page(s):481 - 489
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (387 KB) | HTML iconHTML

    In the manufacture of complex electro-mechanical devices, testing operations are instituted at many points in the process. The primary purpose of these test operations is to ensure a minimum number of faulty products propagate to the next level of assembly and that the corresponding test yield at that level of assembly is sufficient. The recurring and non-recurring expense of each of these test op... View full abstract»

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  • A case for flight line testing of EW suites meeting the war fighter's need "a strike mission situational awareness issue"

    Publication Year: 2002, Page(s):761 - 768
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (473 KB) | HTML iconHTML

    The Electronic Warfare Operational Advisory Group (EW, OAG) presented {again, this year} that a significant need has arisen from the war-fighter and user community to test and confirm the various EW systems in our operational platforms in a quick, efficient and cost effective manor. There are at least eleven (11) discrete threats identified which are 100% lethal against US tactical aircraft. Situa... View full abstract»

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  • A practical solution to instrument obsolescence in test systems

    Publication Year: 2002, Page(s):468 - 480
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (697 KB) | HTML iconHTML

    Obsolescence of instruments in Automatic Test Systems (ATS) presents significant problems for test system users, and an important challenge for test system manufacturers. A solution is required which allows replacement of obsolete instruments, whilst protecting investment in test program development. This paper considers the forms that such solutions might take, and discusses one method of solutio... View full abstract»

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  • An electrical current flow technology for the next generation of automated testing equipment

    Publication Year: 2002, Page(s):745 - 760
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (769 KB) | HTML iconHTML

    This paper presents a technology to measure and analyze electrical current (EC) flow in units-under-test (UUT). The paper discusses the results of preliminary investigations and high-level design specifications that will lead to the development of a prototype to demonstrate the concepts and the benefits of using EC data and information. Non-intrusive and intrusive sensor technology, and experiment... View full abstract»

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  • Optimal instrument selection

    Publication Year: 2002, Page(s):249 - 260
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (546 KB) | HTML iconHTML

    Optimal instrument selection requires selection of a comparison methodology and conversion of instrument parameters to a common basis. Life cycle cost is an ideal comparison methodology because the conversion to cost/benefit (dollars) is familiar to most engineers. Examples of life cycle cost difference studies are given. View full abstract»

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  • Draft standard for test industry metadata (TIM)

    Publication Year: 2002, Page(s):456 - 466
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (472 KB) | HTML iconHTML

    The Test Industry Metadata (TIM) standard is being developed to aid the test and measurement industry in organizing itself. TIM will include a common means of defining a product or service using standard industry terminology. The result will be a standard way to define products and their related resources for every test and measurement company and configure products both inter and intra company. A... View full abstract»

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  • Integrated circuit failure detection using IR laser

    Publication Year: 2002, Page(s):737 - 744
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (699 KB) | HTML iconHTML

    This paper presents unique research efforts related to the use of infrared (IR) laser beams for detecting failures in integrated circuits. The transparency of the silicon substrate of ICs to radiation in the near infrared (NIR) spectrum permits a noninvasive method for imaging the component circuitry of the IC. A laser test fixture consisting of a 1064 nm continuous wave laser, CCD camera, and ima... View full abstract»

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  • Modular test architectures for the aerospace industry

    Publication Year: 2002, Page(s):241 - 247
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (460 KB) | HTML iconHTML

    This paper lays the ground work for a common test platform architecture being adopted by a number of organizations in the aerospace industry. Test engineers realize that integration is not a one time event. This paper discusses an architecture based on a modular hardware and software platform that ensures design freedom and the ability to upgrade test systems without rearchitecting the entire test... View full abstract»

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  • Enveloping test requirements across product life cycle phases

    Publication Year: 2002, Page(s):306 - 315
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (560 KB) | HTML iconHTML

    With the total cost of test increasing over the life cycle of a product, there is an urgent need to "reduce the cost of test". This concept does not just address the high cost of test equipment, but rather looks at all aspects of test from requirements generation, to development, production, and post-production support at a depot or in the field. These aspects must be integrated together using a s... View full abstract»

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  • Non-invasive current measurement pulsed electron system and measurement techniques

    Publication Year: 2002, Page(s):541 - 550
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (485 KB) | HTML iconHTML

    This paper explains the theory, manufacture, and techniques for practical use of a non-invasive measurement sensor for electrical current in wires, cables, component leads, and traces in printed circuit boards. All current established technologies used for this purpose exhibit technical weaknesses, as well as the technical strengths for which they are chosen. Some technical weaknesses exhibited in... View full abstract»

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  • The IVI open architecture driver specifications

    Publication Year: 2002, Page(s):357 - 366
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (510 KB) | HTML iconHTML

    This paper describes the IVI open architecture standard which provides the basic driver standardization that makes IVI drivers easy to learn and use. It provides an overview of the open architecture specifications and describes how they impact the tasks of system developers. View full abstract»

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  • An integrated view of test and diagnostic information standards

    Publication Year: 2002, Page(s):445 - 455
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (568 KB) | HTML iconHTML

    In this paper, we discuss the technical issues related to defining a coordinated view of integrated diagnostic information. Our objective is to define a process and modeling framework for solving the information integration problem. The process discussed is based on formal modeling methods that have been used for years in various contexts but rarely combined. Specifically, the approach applies a "... View full abstract»

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  • Integrated logistics, maintenance, and operational support

    Publication Year: 2002, Page(s):727 - 735
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (577 KB) | HTML iconHTML

    BAE SYSTEMS is developing an integrated application framework to support Logistics, Operations, Support, and Maintenance of Air Force assets from O-Level to D-Level, and from the Maintenance Operations Center (MOC) to the Air Operations Center (AOC). As we develop the framework, we are integrating the functionality of two existing products: Logistics Control and Information Support (LOCIS) and Agi... View full abstract»

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  • Building test applications using timing and triggering with PXI

    Publication Year: 2002, Page(s):227 - 240
    Cited by:  Papers (3)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (705 KB) | HTML iconHTML

    The PXI platform provides sophisticated synchronization capabilities for automated test applications. This paper provides a technical overview of triggering and synchronization capabilities of PXI, including the PXI Trigger Bus, the Star Trigger Bus, and the back-plane clock. The test applications of triggering and synchronization are discussed and demonstrated, including: synchronization of multi... View full abstract»

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