Proceedings, IEEE AUTOTESTCON

17-17 Oct. 2002

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Displaying Results 1 - 25 of 84
  • 2002 IEEE AUTOTESTCON Proceedings. Systems Readiness Technology Conference. 'The New Millennium Challenge - Transforming Test' (Cat. No.02CH37350)

    Publication Year: 2002
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    Freely Available from IEEE
  • Author index

    Publication Year: 2002, Page(s):xxii - xxiii
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    Freely Available from IEEE
  • UUT test requirements capture in any language you like... and still compliant with the IEEE Signal definition and test description standard

    Publication Year: 2002, Page(s):411 - 433
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1011 KB) | HTML iconHTML

    This paper examines how to create consistent, portable, usable UUT requirement specifications utilizing COTS computer languages such as Basic, Java, C or C++. It goes on to describe the benefits of using standard, common building blocks that represent signals, and identifies the importance of allowing users to extend their own signal components. It concludes by showing several examples of the same... View full abstract»

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  • Overview and applications of the IEEE P1451.4 smart sensor interface standard

    Publication Year: 2002, Page(s):777 - 786
    Cited by:  Papers (2)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (454 KB) | HTML iconHTML

    With the goal of promoting the development and adoption of smart transducers, the IEEE 1451 family of smart sensor interface standards defines a set of standardized interfaces for different categories of smart sensors and smart actuators. One member of this family, the IEEE P1451.4 standard, defines a mixed-mode interface that combines that traditional analog sensor signal with a digital interface... View full abstract»

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  • Rollout strategies for sequential fault diagnosis

    Publication Year: 2002, Page(s):269 - 295
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1091 KB) | HTML iconHTML

    Test sequencing is a binary identification problem wherein one needs to develop a minimal expected cost testing procedure to determine which one of a finite number of possible failure sources, if any, is present. The problem can be solved optimally using dynamic programming or AND/OR graph search methods (AO*, CF and HS). However, for large systems, the associated computation with dynamic programm... View full abstract»

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  • RF Measurement Synthetic Instrumentation - 26.5 GHz and beyond

    Publication Year: 2002, Page(s):74 - 81
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (490 KB) | HTML iconHTML

    Synthetic Instrumentation is a class of test devices implemented primarily with software and supported with minimal hardware conditioning for the test signals. This philosophy permits frequent reuse of the hardware elements (processors, A/Ds, D/As, signal conditioners and switches) when commanding different instrument functions. Substantially lower purchase and life cycle costs are therefore achie... View full abstract»

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  • Integrated circuit failure detection using IR laser

    Publication Year: 2002, Page(s):737 - 744
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (699 KB) | HTML iconHTML

    This paper presents unique research efforts related to the use of infrared (IR) laser beams for detecting failures in integrated circuits. The transparency of the silicon substrate of ICs to radiation in the near infrared (NIR) spectrum permits a noninvasive method for imaging the component circuitry of the IC. A laser test fixture consisting of a 1064 nm continuous wave laser, CCD camera, and ima... View full abstract»

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  • Naval test equipment, following in the shadow of the weapons systems

    Publication Year: 2002, Page(s):261 - 268
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (474 KB) | HTML iconHTML

    The need for a rigorous testing program is, in fact, greater today than in the past. Weapons systems. are considerably more complex than in the 1970s. These systems are also much more capable and greater reliance is placed on each individual weapon each firing. "One shot, one kill" is now a requirement. The long draw down on US DoD funding has had an effect on weapon system readiness and an equall... View full abstract»

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  • A practical solution to instrument obsolescence in test systems

    Publication Year: 2002, Page(s):468 - 480
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (697 KB) | HTML iconHTML

    Obsolescence of instruments in Automatic Test Systems (ATS) presents significant problems for test system users, and an important challenge for test system manufacturers. A solution is required which allows replacement of obsolete instruments, whilst protecting investment in test program development. This paper considers the forms that such solutions might take, and discusses one method of solutio... View full abstract»

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  • Flexible digital demodulation/integrating simulation software with measurement hardware

    Publication Year: 2002, Page(s):58 - 73
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (998 KB) | HTML iconHTML

    Digitally modulated signals are now an important part of most modern RF/microwave communications systems. Analysis and troubleshooting of digitally modulated signals in the presence of high frequency effects typically require specialized hardware and firmware/software. In the past decade, the commercial wireless industry has evolved with a number of standards specifications and a rich set of digit... View full abstract»

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  • Integrated logistics, maintenance, and operational support

    Publication Year: 2002, Page(s):727 - 735
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (577 KB) | HTML iconHTML

    BAE SYSTEMS is developing an integrated application framework to support Logistics, Operations, Support, and Maintenance of Air Force assets from O-Level to D-Level, and from the Maintenance Operations Center (MOC) to the Air Operations Center (AOC). As we develop the framework, we are integrating the functionality of two existing products: Logistics Control and Information Support (LOCIS) and Agi... View full abstract»

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  • Building test applications using timing and triggering with PXI

    Publication Year: 2002, Page(s):227 - 240
    Cited by:  Papers (3)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (705 KB) | HTML iconHTML

    The PXI platform provides sophisticated synchronization capabilities for automated test applications. This paper provides a technical overview of triggering and synchronization capabilities of PXI, including the PXI Trigger Bus, the Star Trigger Bus, and the back-plane clock. The test applications of triggering and synchronization are discussed and demonstrated, including: synchronization of multi... View full abstract»

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  • Optimizing signal integrity, data throughput, and costs in mixed architecture systems

    Publication Year: 2002, Page(s):184 - 193
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (477 KB) | HTML iconHTML

    A test system design that is limited to a single hardware architecture, whether it is rack-and-stack or an open-standard modular platform like VXI, may have considerable appeal for reasons of consistency. However, there are often compromises in performance or price that can be avoided by mixing and matching the best of both worlds. This paper describes a systematic approach to making the best inst... View full abstract»

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  • Results using trend analysis for predicting automotive maintenance needs

    Publication Year: 2002, Page(s):809 - 817
    Cited by:  Papers (2)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (371 KB) | HTML iconHTML

    This organization supports the US Army Test Measurement and Diagnostic Equipment Product Manager in a project called ADIP, Army Diagnostic Improvement Program. We provide engineering support by gathering and analyzing data from several vehicles. Such measurements as oil pressure, fuel pressure, compression unbalance, starter current, battery internal resistance, etc, are made. Our aim is to predic... View full abstract»

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  • Synthesis of complex signals on test equipment

    Publication Year: 2002, Page(s):394 - 410
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (769 KB) | HTML iconHTML

    A traditional signal definition exhaustively lists every attribute and condition that it was thought the signal could possibly have. However, it is often the case that we are only interested in controlling a limited number of signal attributes and conditions. The traditional method is inflexible in this respect, leading to problems when trying to map different capabilities in a signal standard, as... View full abstract»

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  • Strategies for mitigating risk related to the obsolescence of HP 8566/68 spectrum analyzers in ATE systems

    Publication Year: 2002, Page(s):608 - 620
    Cited by:  Papers (2)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (666 KB) | HTML iconHTML

    The Hewlett-Packard 8566 and 8568 were the first RF and microwave spectrum analyzers offering remote control and data transfer through the GPIB interface. These analyzers have been widely deployed in automated test equipment (ATE) systems and the majority of units produced since introduction 24 years ago are in active use. These instruments were discontinued five years ago, and Agilent Technologie... View full abstract»

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  • Enveloping test requirements across product life cycle phases

    Publication Year: 2002, Page(s):306 - 315
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (560 KB) | HTML iconHTML

    With the total cost of test increasing over the life cycle of a product, there is an urgent need to "reduce the cost of test". This concept does not just address the high cost of test equipment, but rather looks at all aspects of test from requirements generation, to development, production, and post-production support at a depot or in the field. These aspects must be integrated together using a s... View full abstract»

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  • Optimal instrument selection

    Publication Year: 2002, Page(s):249 - 260
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (546 KB) | HTML iconHTML

    Optimal instrument selection requires selection of a comparison methodology and conversion of instrument parameters to a common basis. Life cycle cost is an ideal comparison methodology because the conversion to cost/benefit (dollars) is familiar to most engineers. Examples of life cycle cost difference studies are given. View full abstract»

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  • Test station configuration and health management

    Publication Year: 2002, Page(s):2 - 10
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (653 KB) | HTML iconHTML

    This paper discusses how the test station health and care play an important part in minimizing no fault found (NFF) cases on units under test (UUTs). The paper presents successfully tested methods to collect and analyze test results, and display test information for test station instruments, interface test adapters (ITAs), and UUTs. The technology is currently being prototyped for the Ogden F-16 a... View full abstract»

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  • Modeling complex signals using basic signal components

    Publication Year: 2002, Page(s):434 - 444
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (420 KB) | HTML iconHTML

    One of the fundamental problems encountered by test engineers is that of balancing the desire to use standard signal descriptions against the flexibility offered by those tailored to a specific application. This paper looks at a new approach to providing the flexibility of a tailored description but by using standard, mathematically rigorous, building blocks; the aim of this approach is to provide... View full abstract»

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  • Adopting IVI: an incremental approach [Interchangeable Virtual Instruments]

    Publication Year: 2002, Page(s):324 - 336
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (651 KB) | HTML iconHTML

    Interchangeable Virtual Instruments (IVI) instrument driver technology offers the test system developer many benefits over existing implementations. As instruments become obsolete, or as newer higher performance or lower cost instruments become available, the significant investment expended on the Test Program Set (TPS) will not be impacted. Lockheed Martin Information Systems (LMIS) is encouraged... View full abstract»

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  • Leveraging LRU TPS diagnostic data for use in SRU TPS development

    Publication Year: 2002, Page(s):30 - 41
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (611 KB) | HTML iconHTML

    This paper explores how a model-based diagnostic reasoning tool and run time engine can be used during line replaceable unit (LRU) test program set (TPS) development to diagnose to the sub-shop replaceable unit (SRU) level and how the LRU diagnostic session file can be leveraged during SRU TPS development. This multi-tiered diagnostics approach is enabled by the Diagnostic Profiler tool, used to e... View full abstract»

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  • Draft standard for test industry metadata (TIM)

    Publication Year: 2002, Page(s):456 - 466
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (472 KB) | HTML iconHTML

    The Test Industry Metadata (TIM) standard is being developed to aid the test and measurement industry in organizing itself. TIM will include a common means of defining a product or service using standard industry terminology. The result will be a standard way to define products and their related resources for every test and measurement company and configure products both inter and intra company. A... View full abstract»

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  • CASS upgrade COSSI-a systematic approach to incorporating NxTest technology into legacy military ATE

    Publication Year: 2002, Page(s):49 - 57
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (512 KB) | HTML iconHTML

    The Consolidated Automated Support System (CASS) Upgrade Commercial Operations and Support Savings Initiative (COSSI) is a multi-year cooperative development agreement to insert commercial off the shelf (COTS) based NxTest technology into the existing US Navy CASS test station to provide operations and support (O&S) cost savings which was started in August 2000 and is scheduled to finish this year... View full abstract»

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  • Collaborative testing and support using the Internet

    Publication Year: 2002, Page(s):912 - 919
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (496 KB) | HTML iconHTML

    The Internet and its current infrastructure provide many opportunities to exploit improved electronics testing by increasing collaboration among individuals worldwide. This paper proposes several ways to take advantage of the ubiquitous Internet infrastructure, its applications, and increasing network bandwidth to better share knowledge between engineering and test technicians, and to build and ma... View full abstract»

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