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17-17 Oct. 2002

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Displaying Results 1 - 25 of 84
  • 2002 IEEE AUTOTESTCON Proceedings. Systems Readiness Technology Conference. 'The New Millennium Challenge - Transforming Test' (Cat. No.02CH37350)

    Publication Year: 2002
    Request permission for commercial reuse | PDF file iconPDF (366 KB)
    Freely Available from IEEE
  • Author index

    Publication Year: 2002, Page(s):xxii - xxiii
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    Freely Available from IEEE
  • UUT test requirements capture in any language you like... and still compliant with the IEEE Signal definition and test description standard

    Publication Year: 2002, Page(s):411 - 433
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1011 KB) | HTML iconHTML

    This paper examines how to create consistent, portable, usable UUT requirement specifications utilizing COTS computer languages such as Basic, Java, C or C++. It goes on to describe the benefits of using standard, common building blocks that represent signals, and identifies the importance of allowing users to extend their own signal components. It concludes by showing several examples of the same... View full abstract»

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  • Overview and applications of the IEEE P1451.4 smart sensor interface standard

    Publication Year: 2002, Page(s):777 - 786
    Cited by:  Papers (2)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (454 KB) | HTML iconHTML

    With the goal of promoting the development and adoption of smart transducers, the IEEE 1451 family of smart sensor interface standards defines a set of standardized interfaces for different categories of smart sensors and smart actuators. One member of this family, the IEEE P1451.4 standard, defines a mixed-mode interface that combines that traditional analog sensor signal with a digital interface... View full abstract»

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  • Mass interconnect approach takes full advantage of VXI capabilities in support of the Air Force C-17 upgrade program

    Publication Year: 2002, Page(s):175 - 176
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (245 KB) | HTML iconHTML

    Designing and deploying a VXI-based functional tester which incorporates a multiple array of test operations can be challenging. A VXI test system is an incredibly powerful hardware platform that requires a wide range of signal propagation choices and possibilities. With the addition of a mass interconnect solution integrated as part of the overall design, a complex program such as testing a sophi... View full abstract»

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  • Smart weapon BIT and reprogramming: A management update

    Publication Year: 2002, Page(s):164 - 173
    Cited by:  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (857 KB) | HTML iconHTML

    This paper offers insight into the challenges of modern day Navy and Marine Corp smart weapon Built In Test (BIT) and reprogramming. With the land-based organic depot quickly becoming a scarce commodity in today's environment of downsizing and streamlining, Navy and Marine Corp personnel are assuming more of the duties and responsibilities of the depot. The Common Munitions BIT Reprogramming Equip... View full abstract»

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  • Test Markup Language (TML)

    Publication Year: 2002, Page(s):585 - 596
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (506 KB) | HTML iconHTML

    This paper will briefly cover the Test Markup Language (TML) currently under development at The Boeing Company. TML is built on the commercial eXtensible Markup Language (XML) specification. View full abstract»

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  • Naval test equipment, following in the shadow of the weapons systems

    Publication Year: 2002, Page(s):261 - 268
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (474 KB) | HTML iconHTML

    The need for a rigorous testing program is, in fact, greater today than in the past. Weapons systems. are considerably more complex than in the 1970s. These systems are also much more capable and greater reliance is placed on each individual weapon each firing. "One shot, one kill" is now a requirement. The long draw down on US DoD funding has had an effect on weapon system readiness and an equall... View full abstract»

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  • Missile test confidence via test systems certification and associated data analysis

    Publication Year: 2002, Page(s):687 - 702
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (805 KB) | HTML iconHTML

    This paper discusses missile data analysis from production and fleet return test runs. This data can be used to detect a wide array of potential problems. The author looks at how this data can be used by the manufacturers and depots that collect it. I will also examine data analysis visual display chart types and how to effectively group the results. Future trends in the use of the analysis progra... View full abstract»

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  • Signal modeling focused on resource configuration and information acquisition

    Publication Year: 2002, Page(s):563 - 575
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (490 KB) | HTML iconHTML

    Some accessorial and peripheral work has often been considered burdensome in preparing a complicated test assignment when operating ATE. Since the signal is one of the most important objects for investigation, it is necessary to acquire the elaborate information of resource and channels in order to contribute to the subsequent configuration. Nevertheless it is difficult and inconvenient to deduce ... View full abstract»

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  • Partnering for test - does it work?

    Publication Year: 2002, Page(s):490 - 497
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (521 KB) | HTML iconHTML

    Government partnering with industry for operational flight program (OFP) software test and evaluation is not a new concept. The intent of this paper is to show how the focus of the US Air Force has changed to meet the demand of a more responsive and affordable logistics system through revised partnering concepts and how it applies to software test. To understand what, why and how changes in the lo... View full abstract»

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  • Concurrent test systems using the structured distributed-programming paradigm

    Publication Year: 2002, Page(s):152 - 163
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (515 KB) | HTML iconHTML

    Traditionally developers in the automatic testing community have had no viable paradigm for handling concurrent systems. Test suites that could be processed in one hour using concurrency are being processed in 24 hours sequentially. The structured distributed programming paradigm (SDPP) is a non-traditional paradigm that allows developers to conceive viable distributed/concurrent/parallel systems ... View full abstract»

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  • PXI: the future of test

    Publication Year: 2002, Page(s):205 - 214
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (509 KB) | HTML iconHTML

    As commercial and military electronic technology evolves, so does the need for more sophisticated, reliable, and cost-effective test equipment. The new PXI platform fills this gap and provides the ultimate test solution for field, laboratory, or manufacturing test applications. This paper discusses the evolution of test that led to the development of the PXI standard and provides technical informa... View full abstract»

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  • Optimal instrument selection

    Publication Year: 2002, Page(s):249 - 260
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (546 KB) | HTML iconHTML

    Optimal instrument selection requires selection of a comparison methodology and conversion of instrument parameters to a common basis. Life cycle cost is an ideal comparison methodology because the conversion to cost/benefit (dollars) is familiar to most engineers. Examples of life cycle cost difference studies are given. View full abstract»

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  • A design pattern to encapsulate measurement uncertainty in reusable instrumentation modules

    Publication Year: 2002, Page(s):678 - 686
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (454 KB) | HTML iconHTML

    A method of encapsulating and propagating measurement uncertainty information in modular instrumentation systems is described. The technique is simple to implement and fully compliant with international best practice. Measurement uncertainty is a fundamental aspect of any measurement system and is currently difficult to manage when systems are subjected to configuration changes. The technique coul... View full abstract»

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  • Modeling complex signals using basic signal components

    Publication Year: 2002, Page(s):434 - 444
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (420 KB) | HTML iconHTML

    One of the fundamental problems encountered by test engineers is that of balancing the desire to use standard signal descriptions against the flexibility offered by those tailored to a specific application. This paper looks at a new approach to providing the flexibility of a tailored description but by using standard, mathematically rigorous, building blocks; the aim of this approach is to provide... View full abstract»

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  • Development of an automatic test set for an air-to-ground weapon system

    Publication Year: 2002, Page(s):296 - 305
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (544 KB) | HTML iconHTML

    This paper discusses the design and development of the Services Weapon Test Set (SWTS); an automated test set that is designed to be used at the Second Line Maintenance Facility for the troubleshooting and certification of the Brimstone Weapon System. This test set is designed to be operated by Royal Air Force personnel with little or no system unique training, and without the use of Technical Pub... View full abstract»

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  • ATE life extension using emulated peripheral devices

    Publication Year: 2002, Page(s):503 - 507
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (299 KB) | HTML iconHTML

    The old super-minicomputer systems that are tucked away inside many of the world's Automatic Test Equipment (ATE) workstations are often 10 to 30 years old. These sturdy and reliable legacy computers - built in an era when the cost of a system regularly exceeded a half million dollars - tend to run reasonably well and in most cases, spare system parts are still available. One glaring weakness that... View full abstract»

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  • What are the important factors affecting prognostics?

    Publication Year: 2002, Page(s):801 - 807
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (297 KB) | HTML iconHTML

    Trend analysis mathematics and data interactions are studied. Investigation of the tolerances on the projection of the linear trend line is undertaken. Importance of the number of measurements is discussed. It is shown that the best estimate of time to exceedance requires 8 to 9 measurements. Several examples of test data are presented. The relationship between requirements and test equipment perf... View full abstract»

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  • Draft standard for test industry metadata (TIM)

    Publication Year: 2002, Page(s):456 - 466
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (472 KB) | HTML iconHTML

    The Test Industry Metadata (TIM) standard is being developed to aid the test and measurement industry in organizing itself. TIM will include a common means of defining a product or service using standard industry terminology. The result will be a standard way to define products and their related resources for every test and measurement company and configure products both inter and intra company. A... View full abstract»

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  • IVI comes of age: an overview of IVI specifications with current status

    Publication Year: 2002, Page(s):317 - 323
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (368 KB) | HTML iconHTML

    IVI stands for Interchangeable Virtual Instruments. The IVI Foundation was formed in 1997 and is a consortium founded to promote standard specifications for programmable test instruments The IVI Foundation focuses on the needs of users who build high performance test systems. By building on existing industry standards such as VXIplug&play driver concepts, the Foundation's goal is to deliver specif... View full abstract»

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  • Evaluation of economics of testing in a manufacturing environment

    Publication Year: 2002, Page(s):481 - 489
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (387 KB) | HTML iconHTML

    In the manufacture of complex electro-mechanical devices, testing operations are instituted at many points in the process. The primary purpose of these test operations is to ensure a minimum number of faulty products propagate to the next level of assembly and that the corresponding test yield at that level of assembly is sufficient. The recurring and non-recurring expense of each of these test op... View full abstract»

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  • Extending your test without extending your test system

    Publication Year: 2002, Page(s):42 - 47
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (345 KB) | HTML iconHTML

    Often a test system developer discovers that there is a need for just a bit more capability than the original specifications called for. This paper looks at ways of pulling out that little bit extra, using the spare, but less obvious capabilities that are built into all systems. View full abstract»

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  • Combined virtual and physical hardware performance analysis

    Publication Year: 2002, Page(s):551 - 562
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (748 KB) | HTML iconHTML

    In today's fast-paced design environment, it is often necessary to design systems where no physical hardware yet exists and still take into account the "real world" effects that can adversely degrade its field performance. In this paper it will be shown how "yet-to-be-physically-realized" designs can be combined with measurements of physical hardware, as it becomes available, to help ensure the su... View full abstract»

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  • FPGAs in digital testing

    Publication Year: 2002, Page(s):11 - 29
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (617 KB) | HTML iconHTML

    This paper describes the techniques used to design an interface device (ID) for digital testing, based on field programmable gate arrays (FPGAs). The application reviewed comes from a CASS TPS development program, where 31 digital shop replaceable assemblies (SRAs) were grouped in a single ID. The ID consists of a set of FPGAs interconnected in an optimum mode to match each particular UUT interfac... View full abstract»

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