IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

25-28 Sept. 1989

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  • AUTOTESTCON '89 Conference Record: 'The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century' (Cat. No.89CH2568-4)

    Publication Year: 1989
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    Freely Available from IEEE
  • A software architecture for VXIbus systems

    Publication Year: 1989, Page(s):327 - 334
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (540 KB)

    The VXIbus standard defines the basic hardware and communications protocols for instrument-on-a-card systems. One important systems architecture that builds on VXI is based on local area network, UNIX-related technologies and an object-oriented software bus. The heart of the system is an embedded VXIbus processor for controlling the test system and implementing virtual instruments. The software bu... View full abstract»

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  • Now we have ATE: who's going to maintain it?

    Publication Year: 1989, Page(s):323 - 326
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (344 KB)

    The authors discuss original equipment manufacturer maintenance and self-maintenance with emphasis on hardware maintenance of in-circuit ATE (automatic test equipment). Issues such as software and fixture maintenance are also addressed. Maintenance is analyzed from an economics standpoint, and issues of jeopardy and practicality are discussed View full abstract»

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  • Two levels vs. three levels of maintenance: the cost

    Publication Year: 1989, Page(s):19 - 25
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    The authors describe level-of-repair analyses for four major US Army weapon/communication systems using the Optimum Supply and Maintenance Model (OSAMM). The four systems are: Single Channel Objective Tactical Terminal (SCOTT); Global Positioning System (GPS); Single Channel Ground and Airborne Radio System (SINCGARS); and Hawk guided missile. The analyses compare the costs associated with a stric... View full abstract»

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  • Tester-assisted built in test

    Publication Year: 1989, Page(s):319 - 322
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (260 KB)

    It is noted that board makers invest considerable time and money writing extensive self-tests and that this investment can be multiplied by selecting ATE (automatic test equipment) that complements and extends the power of the self-test. The tester can diagnose boards in situations where a fault prevents the self-test from running. If the tester monitors such resources as processor, memory, and I/... View full abstract»

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  • Test program development using multiple test strategies

    Publication Year: 1989, Page(s):9 - 18
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (584 KB)

    Multistrategy testing allows the test developer to choose the appropriate combination of test approaches to meet the test requirements given the economic and timescale constraints. After describing the goals of test program development, the author discusses major styles of testing, connectivity tests, digital and analog functional tests, analog and digital in-circuit tests, emulation tests, and st... View full abstract»

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  • The two level maintenance-I level dilemma

    Publication Year: 1989, Page(s):63 - 66
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (236 KB)

    Previous attempts at implementing the two-level maintenance philosophy for Navy aircraft did not prove to be workable, and an `I' level capability was added at a later stage in at least one major program. In this work, an attempt is made to define the real requirements for a workable two-level system, and some actual cases of what can be done on some major weapon systems in the Navy are shown. Rec... View full abstract»

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  • Built in test (BIT) in a commercial signal generator

    Publication Year: 1989, Page(s):314 - 318
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (332 KB)

    The implementation of internal diagnostics in Hewlett-Packard's newest series of RF signal generator products is described. Using an assembly-level repair support strategy, it is possible to repair most instrument failures quickly without the use of external test equipment. Testing of individual assemblies in the instrument is done with a series of analog multiplexers, an internal voltmeter with A... View full abstract»

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  • System engineering considerations and methodology for effecting a cohesive functional/parametric testing strategy

    Publication Year: 1989, Page(s):1 - 8
    Cited by:  Patents (5)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (460 KB)

    The authors consider RFI (ready for issue) methodologies and techniques that can be used to effect a cohesive functional/parametric testing strategy. A number of functional/parametric testing scenarios are discussed from the viewpoint of assessing diagnostic accuracy, functional/parametric test correlation, test data maturation, and testing throughput. It is concluded that the key to establishing ... View full abstract»

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  • New directions in loaded board testing

    Publication Year: 1989, Page(s):212 - 216
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (284 KB)

    The author discusses some of the advances in computer technology that have made possible new techniques for loaded board testing. Two entirely new measurement techniques are discussed, both based on advanced computer technology and both suitable for implementation in a second-generation MDA (manufacturing defects analyzer) instrument. These techniques are mathematical guarding and passive chip dia... View full abstract»

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  • IFTE RF path loss compensation at run time enhances system self-maintenance

    Publication Year: 1989, Page(s):277 - 283
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (540 KB)

    The US Army Integrated Family Test Equipment (IFTE) provides RF stimulus and measurement from -100 dBm to +40 dBm over a frequency range of 100 Hz to 22 GHz. A power-plane technique is used to compensate for system path loss at test program set (TPS) runtime. This technique has been utilized successfully on a number of automatic test equipment programs to enhance system capability and simplify cal... View full abstract»

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  • Downsizing with VXIbus: opportunities and limitations in factory, field, and portable environments

    Publication Year: 1989, Page(s):55 - 62
    Cited by:  Papers (3)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (380 KB)

    The author examines the technical constraints of downsizing for factory, field, and portable environments and develops metrics for comparing functional densities. Two examples of downsized VXIbus systems are evaluated. One is a C-size system with DC to microwave capability for factory floor or transportable ATE (automatic test equipment) applications. The second is a B-size system that is a lower ... View full abstract»

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  • Reasoning from uncertain data: a bit enhancement

    Publication Year: 1989, Page(s):146 - 149
    Cited by:  Papers (1)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (228 KB)

    It is proposed that artificial intelligence (AI) principles, coupled with powerful Bayesian statistical inference techniques, can be successfully applied to built-in-test (BIT) technology and can significantly contribute to the improvement of avionics BIT diagnostic capabilities. The goal is to extract more information from available data provided by the BIT, rather than to expand its testing capa... View full abstract»

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  • Interfacing to boundary scan chips for system level BIT

    Publication Year: 1989, Page(s):310 - 313
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (224 KB)

    The author describes a system-level built-in test architecture and illustrates how system designers can interface to boundary (and other) scan devices on boards to facilitate line replaceable unit and system-level built-in test, online monitoring, and fault isolation using both serial and real-time techniques. He also shows how to bridge the protocol gaps between the various scan design devices (e... View full abstract»

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  • MATE compliant portable test technology emerges

    Publication Year: 1989, Page(s):206 - 211
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (364 KB)

    The author begins by presenting an overview of the original MATE (modular automatic test equipment) standards and their purpose in driving ATE (automatic test equipment) design. He then highlights new or otherwise pending standards and provides a systems overview of their impact, permitting the realization of a small, transportable and more powerful configuration of ATE. He notes that newly define... View full abstract»

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  • Modular software for VME/VXI subsystems

    Publication Year: 1989, Page(s):124 - 131
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (564 KB)

    As part of a standardization effort, a software architecture was designed to control high-speed devices within an ATE (automatic test equipment) system. Devices that require real-time responses were located in a subsystem controlled by a dedicated processor. A host computer communicates with the subsystem using a communications bus (referred to as the host bus). The hardware chosen to implement th... View full abstract»

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  • Measuring system performance characteristics of infrared systems (MRT, MTF, NETD) using automatic test equipment

    Publication Year: 1989, Page(s):236 - 241
    Cited by:  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (288 KB)

    A project is described whose goal is to develop and test image signal processing algorithms and techniques that allow automation of MRT (minimum resolvable temperature) testing. The basis of the automated test system is the premise that the system MTF (modulation transfer function) is a product of the MTFs of each subsystem component. The MTF of the lens and detector are the major factors affectin... View full abstract»

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  • A digital maintenance information (DMI) system for ATE

    Publication Year: 1989, Page(s):272 - 276
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (256 KB)

    The proposed DMI system provides a paperless information system in a personal computer (PC) environment and aids the service technician with synchronized video and graphic demonstrations. The user's need for a generic DMI system is considered, and a pilot program is discussed for the evaluation of a DMI system. It is concluded that the DMI system will cut the time, cost, and volume of paper now as... View full abstract»

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  • Fast, real-time, DFT instrument based on VMEbus

    Publication Year: 1989, Page(s):49 - 54
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (744 KB)

    An emerging class of VMEbus-based test and measurement instruments is benchmarked by a recently introduced digital spectrum analyzer. The instrument performs real-time spectrum analysis in the DC-to-10 MHz range at 5000 spectrums per second. Its architecture is based on the VMEbus and is partly adapted for high-speed pipeline processing. The keyboard and color graphic displays suit basic spectrum ... View full abstract»

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  • Two-level maintenance concept for advanced avionics architectures

    Publication Year: 1989, Page(s):75 - 79
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (296 KB)

    The advanced avionic architecture for next-generation military aircraft will feature common signal- and data-processing modules. The common modules will incorporate VHSIC technology and feature extensive built-in-test (BIT) and error logging capabilities. These new technologies present an opportunity to eliminate the intermediate level of maintenance because self-diagnosed modules can be routed di... View full abstract»

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  • VHSIC phase 2 test requirements for the depot

    Publication Year: 1989, Page(s):289 - 295
    Cited by:  Papers (1)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (452 KB)

    The recently released Phase 2 very high speed integrated circuits (VHSIC) standards show that VHSIC will operate up to 100 MHz. The author examines the ATE (automatic test equipment) test capability that will be required for these high-performance digital circuits and whether new ATE capability will be required or whether present technology will be sufficient. His analysis shows that using the VHS... View full abstract»

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  • Digital Maintenance Information (DMI) system

    Publication Year: 1989, Page(s):138 - 145
    Cited by:  Papers (4)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (860 KB)

    The objective of the digital maintenance information (DMI) system is to improve the capabilities of maintenance organization by providing generic techniques with an integrated electronic deliverable information system for use with ATE (automatic test equipment). The system integrates multiple maintenance information sources into a single easy-to-use information system. Integrated diagnostics relat... View full abstract»

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  • BIT and testability for millimeter wave systems

    Publication Year: 1989, Page(s):249 - 254
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (544 KB)

    The authors provide a basis for understanding BIT related and MMW (millimeter wave) system attributes which offer potential for transportability of current RF/microwave BIT concepts. A comparison of MMW and microwave technology provides a basis for identifying areas where there may be opportunity for the transfer of microwave BIT technology and testability techniques to MMW as well as areas where ... View full abstract»

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  • TPS evolution and test software development in the two-level maintenance environment

    Publication Year: 1989, Page(s):302 - 309
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (448 KB)

    Two-level maintenance and BIT/software intensive line replaceable module architectures will be driven by the dual imperatives of harmonizing online UUT BIT/BIST (unit under test built-in test/built-in self-test) with offline ATS/TPS (automatic test system/test program set) test capability and of improving the approach to software specification and development in both areas. It is suggested that th... View full abstract»

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  • Unique vehicle technology in active support of two level maintenance [aircraft equipment testing]

    Publication Year: 1989, Page(s):201 - 205
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (312 KB)

    The author challenges the ATE (automatic test equipment) industry to apply micro-miniature techniques to the next generation of ATE. He notes that having a large enough transport vehicle is no longer an obstacle. He describes a vehicle that is capable of transporting an ATE shop set to the flight line or remote field site via a C-130 transport aircraft View full abstract»

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