IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

25-28 Sept. 1989

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  • AUTOTESTCON '89 Conference Record: 'The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century' (Cat. No.89CH2568-4)

    Publication Year: 1989
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    Freely Available from IEEE
  • VHSIC phase 2 test requirements for the depot

    Publication Year: 1989, Page(s):289 - 295
    Cited by:  Papers (1)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (452 KB)

    The recently released Phase 2 very high speed integrated circuits (VHSIC) standards show that VHSIC will operate up to 100 MHz. The author examines the ATE (automatic test equipment) test capability that will be required for these high-performance digital circuits and whether new ATE capability will be required or whether present technology will be sufficient. His analysis shows that using the VHS... View full abstract»

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  • ATE self test

    Publication Year: 1989, Page(s):284 - 288
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (448 KB)

    The ability of automatic test equipment (ATE) to introspectively assess its own well-being as well as assess the well-being of the UUTs (units under test) external to itself has long been understood to be a major advantage of offline ATE. The author argues that this inherent potential ATE system capability has not been used effectively. It has been treated as an afterthought and implemented by the... View full abstract»

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  • IFTE RF path loss compensation at run time enhances system self-maintenance

    Publication Year: 1989, Page(s):277 - 283
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (540 KB)

    The US Army Integrated Family Test Equipment (IFTE) provides RF stimulus and measurement from -100 dBm to +40 dBm over a frequency range of 100 Hz to 22 GHz. A power-plane technique is used to compensate for system path loss at test program set (TPS) runtime. This technique has been utilized successfully on a number of automatic test equipment programs to enhance system capability and simplify cal... View full abstract»

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  • A digital maintenance information (DMI) system for ATE

    Publication Year: 1989, Page(s):272 - 276
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (256 KB)

    The proposed DMI system provides a paperless information system in a personal computer (PC) environment and aids the service technician with synchronized video and graphic demonstrations. The user's need for a generic DMI system is considered, and a pilot program is discussed for the evaluation of a DMI system. It is concluded that the DMI system will cut the time, cost, and volume of paper now as... View full abstract»

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  • Testability: the state of the art-automatic testing in the next decade and the 21st century

    Publication Year: 1989, Page(s):168 - 174
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (596 KB)

    The use of MIL-STD-2165 is a requirement on all new DoD weapon systems contracts. The authors discuss the major highlights of implementing a design-for-testability program, with particular attention paid to the 200 Series tasks for shop replacement assemblies, and describe the standard's effects on actual weapon systems designs. They outline specific approaches that can be used by the weapon syste... View full abstract»

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  • System level BIT: a tool for MATE test station self maintenance

    Publication Year: 1989, Page(s):267 - 271
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (300 KB)

    The author examines what can be done in a MATE environment to reduce self-test runtime and at the same time provide increased fault detection and isolation. His solution involves the integration of VMEbus extension for instrumentation (VXI bus) technology and existing BIT (built-in-test) techniques. This integration produces a system-level BIT capable of utilizing integrated test station resources... View full abstract»

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  • Instrument interchangeability through software resource descriptions

    Publication Year: 1989, Page(s):340 - 346
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (448 KB)

    IEEE Committee P981 has been actively defining a language and methodology for writing RDs (resource descriptions). The author discusses the makeup and role of RDs, the language used for describing them, and their application in a prototype open-architecture ATE (automatic test equipment) system. It is noted that RDs are intended to describe the interfaces, i.e. the external views, of an instrument... View full abstract»

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  • Diagnostic tree design with model-based reasoning

    Publication Year: 1989, Page(s):161 - 167
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (484 KB)

    A reasoning procedure using quantitative models of connectivity and function has been developed to generate automatically multibranched diagnostic trees which can isolate faults within feedback loops and in the presence of multiple faults. The authors describe how the model-based reasoning system is used to generate automatically diagnostic trees that can have variable degrees of branching, from b... View full abstract»

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  • Intelligent built-in test and stress management

    Publication Year: 1989, Page(s):261 - 266
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (440 KB)

    The authors describe two areas of technology, time stress measurement devices (TSMDs) and smart built-in test (smart BIT), which offer a combined approach to meeting future BIT needs. With reference to TSMD, one or more microelectronic packages are being developed with the capability of providing programmable and environmental stress measurement and recording. Smart BIT is an enhancement to tradit... View full abstract»

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  • A standardized instrument programming language based on IEEE STD 488.2

    Publication Year: 1989, Page(s):335 - 339
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (492 KB)

    The author describes the features of the Test and Measurement System Language (TMSL) and how they relate to compatibility. TMSL implements a tree-structured command set, rather than a traditional flat instrument language, allowing keywords to be reusable and identifiable in context. Reusable keywords allow for simple and regular mnemonic generation rules. TMSL has also addressed parameters through... View full abstract»

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  • Portability issues in MATE software

    Publication Year: 1989, Page(s):155 - 160
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (492 KB)

    The MATE software has been ported onto a variety of different computer architectures under a number of different operating systems. Several of these projects are taken as case studies to illustrate the difficulties encountered and the techniques used to deal with them. Four types of projects are considered: rehosting the MOS (MATE operating system) to a new 1750 A platform with various peripheral ... View full abstract»

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  • Decision criteria for the application of artificial intelligence in two-level maintenance

    Publication Year: 1989, Page(s):37 - 44
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (452 KB)

    The authors present decision criteria for applying artificial intelligence (AI) technologies (in particular, expert and model-based systems) in two-level maintenance. They present a three-step process that describes a problem in the terminology of two-level maintenance, correlate this description with AI technology-based decision criteria, and evaluate the identified decision criteria to determine... View full abstract»

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  • A test and maintenance architecture demonstrated on SEM-E modules for fiber optic networks

    Publication Year: 1989, Page(s):255 - 260
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (664 KB)

    The authors describe a general-purpose test and maintenance architecture for electronic subsystems and its demonstration in several avionics SEM-E modules for fiber-optic networking of the Advanced Tactical Fighter, A-12, and other modern aircraft. The results of applying this test and maintenance architecture are delineated in terms of payoff, penalty, and problems encountered. Industry efforts n... View full abstract»

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  • A software architecture for VXIbus systems

    Publication Year: 1989, Page(s):327 - 334
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (540 KB)

    The VXIbus standard defines the basic hardware and communications protocols for instrument-on-a-card systems. One important systems architecture that builds on VXI is based on local area network, UNIX-related technologies and an object-oriented software bus. The heart of the system is an embedded VXIbus processor for controlling the test system and implementing virtual instruments. The software bu... View full abstract»

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  • On the evaluation of real life test expert systems

    Publication Year: 1989, Page(s):150 - 154
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (352 KB)

    The authors consider the factors affecting the successful integration of expert systems (ESs) in testing and maintenance environments. The first factor considered has to do with the communication between the ES and the UUT (unit under test) expert and between the ES and the test technician. The authors discuss the importance of embedding in the expert system basic understanding of electronic terms... View full abstract»

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  • System engineering considerations and methodology for effecting a cohesive functional/parametric testing strategy

    Publication Year: 1989, Page(s):1 - 8
    Cited by:  Patents (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (460 KB)

    The authors consider RFI (ready for issue) methodologies and techniques that can be used to effect a cohesive functional/parametric testing strategy. A number of functional/parametric testing scenarios are discussed from the viewpoint of assessing diagnostic accuracy, functional/parametric test correlation, test data maturation, and testing throughput. It is concluded that the key to establishing ... View full abstract»

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  • An investigation of neural networks for F-16 fault diagnosis. I. System description

    Publication Year: 1989, Page(s):351 - 357
    Cited by:  Papers (4)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (496 KB)

    The authors report results of ongoing research exploring the use of artificial neural networks (ANNs) for F-16 flight line diagnostics. ANNs hold the promise of solving difficult logistics problems such as multiple fault diagnosis, prognostication, changing configurations and environments, and inaccurate diagnosis attributable to incomplete and/or flawed rules. The authors tested three representat... View full abstract»

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  • Two levels vs. three levels of maintenance: the cost

    Publication Year: 1989, Page(s):19 - 25
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (504 KB)

    The authors describe level-of-repair analyses for four major US Army weapon/communication systems using the Optimum Supply and Maintenance Model (OSAMM). The four systems are: Single Channel Objective Tactical Terminal (SCOTT); Global Positioning System (GPS); Single Channel Ground and Airborne Radio System (SINCGARS); and Hawk guided missile. The analyses compare the costs associated with a stric... View full abstract»

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  • Logistics impacts and influences of ATE designed to meet the TLM concept

    Publication Year: 1989, Page(s):32 - 36
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (392 KB)

    The two-level maintenance (TLM) concept is being advocated as a means of increasing support capability and reducing the total cost of system maintenance. Traditionally, the Air Force has used a three level maintenance concept, with a heavy emphasis on base level, in-shop repair. In the 1970s and 1980s, this approach to maintenance and the expanding technology of automated test systems resulted in ... View full abstract»

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  • BIT and testability for millimeter wave systems

    Publication Year: 1989, Page(s):249 - 254
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (544 KB)

    The authors provide a basis for understanding BIT related and MMW (millimeter wave) system attributes which offer potential for transportability of current RF/microwave BIT concepts. A comparison of MMW and microwave technology provides a basis for identifying areas where there may be opportunity for the transfer of microwave BIT technology and testability techniques to MMW as well as areas where ... View full abstract»

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  • Measuring system performance characteristics of infrared systems (MRT, MTF, NETD) using automatic test equipment

    Publication Year: 1989, Page(s):236 - 241
    Cited by:  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (288 KB)

    A project is described whose goal is to develop and test image signal processing algorithms and techniques that allow automation of MRT (minimum resolvable temperature) testing. The basis of the automated test system is the premise that the system MTF (modulation transfer function) is a product of the MTFs of each subsystem component. The MTF of the lens and detector are the major factors affectin... View full abstract»

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  • Extending VXIbus systems across multiple-mainframe

    Publication Year: 1989, Page(s):225 - 230
    Cited by:  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (416 KB)

    There are currently three system configuration approaches to integrating a host CPU into a VXIbus mainframe system. These approaches involve the use of the standard general-purpose interface bus (GPIB), embedding a CPU module directly on the VXIbus, and use of a transparent, high-speed communication link. The author discusses each technique in detail and how each can be extended into a multimainfr... View full abstract»

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  • Now we have ATE: who's going to maintain it?

    Publication Year: 1989, Page(s):323 - 326
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (344 KB)

    The authors discuss original equipment manufacturer maintenance and self-maintenance with emphasis on hardware maintenance of in-circuit ATE (automatic test equipment). Issues such as software and fixture maintenance are also addressed. Maintenance is analyzed from an economics standpoint, and issues of jeopardy and practicality are discussed View full abstract»

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  • Two-level maintenance concept for advanced avionics architectures

    Publication Year: 1989, Page(s):75 - 79
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (296 KB)

    The advanced avionic architecture for next-generation military aircraft will feature common signal- and data-processing modules. The common modules will incorporate VHSIC technology and feature extensive built-in-test (BIT) and error logging capabilities. These new technologies present an opportunity to eliminate the intermediate level of maintenance because self-diagnosed modules can be routed di... View full abstract»

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