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2-5 Nov. 2015

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Displaying Results 1 - 25 of 84
  • [Front cover]

    Publication Year: 2015, Page(s): c1
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    Freely Available from IEEE
  • [Copyright notice]

    Publication Year: 2015, Page(s): ii
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  • Table of contents

    Publication Year: 2015, Page(s):iii - xiii
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  • Messages

    Publication Year: 2015, Page(s):xiv - xxx
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  • Utilizing the SETR process in the procurement of TPSs on the CASS Family of Testers

    Publication Year: 2015, Page(s):1 - 8
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1154 KB) | HTML iconHTML

    The acquisition of Operational Test Program Sets (OTPSs) has been a recurring effort requiring standardization, refinement, and continuous process improvement. Established in 1989, by the `Red Team' integrated product team (IPT) and updated in 2005 as the NAVAIR Generic OTPS Request for Proposal (NGOR), the NGOR acquisition package is used as a Government template in the procurement of OTPSs being... View full abstract»

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  • Test program and ATE station dependencies: Have we learned anything from the past, or are we doomed to repeat it?

    Publication Year: 2015, Page(s):9 - 11
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (668 KB) | HTML iconHTML

    Early test systems were designed for manual operation where the user had to select front panel buttons and knobs to set-up and run tests. This method of testing was time consuming, expensive and prone to error. Automatic Test Equipment (ATE) was originally developed to take manual test scenarios and automate the repetitive procedures that technicians performed while conducting tests on Units Under... View full abstract»

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  • It's Just STE: Understanding the pitfalls of treating STE as second class equipment

    Publication Year: 2015, Page(s):12 - 14
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (679 KB) | HTML iconHTML

    In many organizations, development of Special Test Equipment (STE) is taken as an afterthought. Often, this is based on the assumption that, since the equipment will be on-site in the company's factory, correction of minor issues that might be caused by a non-robust development process can be easily addressed. In addition, STE development is sometimes viewed as a discipline not requiring special s... View full abstract»

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  • Designing factory support equipment for field use

    Publication Year: 2015, Page(s):15 - 18
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (791 KB) | HTML iconHTML

    One problem that continues to plague test equipment is the fact that the factory, depot and field are all different environments, creating a scenario where the Unit Under Test (UUT) is being tested under variable circumstances. Additionally, the amount of testing available to the field is often limited to the extent that the field test equipment is only capable of determining a most likely Line Re... View full abstract»

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  • Predicting field performance of on-board diagnostics using statistical methods

    Publication Year: 2015, Page(s):19 - 26
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (946 KB) | HTML iconHTML

    On-Board Diagnostics will play a crucial role in the emerging era of the Internet of Things. With billions of devices deployed, traditional manual preventive maintenance approaches will be cost prohibitive. As we make these small autonomous devices intelligent, it is critical that we also give them a very advanced ability to assess and report their own health. Of course, on-board diagnostics are n... View full abstract»

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  • High speed Shared Memory Networks in hardware in the loop applications

    Publication Year: 2015, Page(s):27 - 32
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (259 KB) | HTML iconHTML

    As aircraft avionics systems become more and more integrated and complex, the overall costs and duration of system verification and validation efforts continue to increase and contribute to the rising costs of new system design. In order to control costs, reduce schedules, and improve overall quality, Distributed Hardware-in-the-Loop (HIL) simulations are increasingly being used to verify integrat... View full abstract»

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  • Hardware-based whitelisting for automated test system cybersecurity and configuration management

    Publication Year: 2015, Page(s):33 - 37
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (705 KB) | HTML iconHTML

    To reap the benefits of prognostic health management, intelligent Test Program Set (TPS) diagnostic reasoning, and remote TPS configuration management Automated Test Systems (ATSs) must be networked in spite of increasing cybersecurity concerns. Traditional cybersecurity tools such as Intrusion Prevention Systems (IPS), firewalls and antivirus software are continuously proven vulnerable to the inc... View full abstract»

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  • Performance based logistics sustainment of automated test equipment systems

    Publication Year: 2015, Page(s):38 - 44
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (800 KB) | HTML iconHTML

    The development and expanding use of Automated Test Equipment (ATE) systems has had a number of positive impacts across numerous segments of industry. As ATE systems continue to mature, more and more versatile and complex ATE systems are becoming mainstays in production and product sustainment environments. Maintaining these ever more complex ATE systems presents a number of challenges that can be... View full abstract»

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  • Mitigating the Impact of False Alarms and No Fault Found events in military systems

    Publication Year: 2015, Page(s):45 - 46
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1040 KB) | HTML iconHTML

    False Alarms (FAs) and No Fault Founds (NFFs) impose a devastating impact on aircraft systems. An entire aircraft can be grounded because of a single avionics for which there are insufficient spares available. If a FA or NFF causes a particular Line Replaceable Unit (LRU) to be called out incorrectly, that same LRU could be called out in many aircraft, possibly shutting down the entire fleet. We w... View full abstract»

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  • Processor Controlled Test development: A case study with an Intel i7 processor board

    Publication Year: 2015, Page(s):47 - 51
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1168 KB) | HTML iconHTML

    Military computers have been widely used for Defense System Technologies projects during the last decade in ASELSAN, the leading defense industry company of Turkey. A military computer design is reused for new projects as long as it meets the requirements, but as processor technology evolves and different project requirements arise, the need for a new design becomes inevitable. View full abstract»

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  • Wrapper scan chains balance algorithm base on twice assigned by difference and mean value

    Publication Year: 2015, Page(s):52 - 57
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (843 KB) | HTML iconHTML

    The core test application time is based on the maximum scan-in/scan-out chains. To design a well balance wrapper scan chains is an important approach to reduce the test application time and test cost. We propose a wrapper scan chains balance algorithm base on twice-assigned algorithm by the chains difference and mean value. By selecting a standard chain with its length L, calculating the mean valu... View full abstract»

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  • Developing built in test to meet the demands of the product test lifecycle

    Publication Year: 2015, Page(s):58 - 64
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1007 KB) | HTML iconHTML

    Companies are incorporating Built-In-Test (BIT) capabilities into their products to 1) reduce the need for external Special Test Equipment (STE), 2) incorporate test capability for all levels of manufacturing test from Circuit Card Assembly (CCA) to the finished product, 3) decrease the test/diagnostics cycle time, and 4) product logistics test needs in the field. Customer BIT requirements are typ... View full abstract»

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  • Strategies for extending the life of ATE systems for another 10 or 20 years

    Publication Year: 2015, Page(s):65 - 70
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1782 KB) | HTML iconHTML

    The proverbial question of how to increase the life of an ATE system for another 10 or 20 years is echoed in program meetings across the Aerospace industry daily. The fact is that the life spans for test and measurement equipment are undoubtedly expected to last longer than any other part of a program, even sometimes longer than the suppliers themselves or the employment of many technicians. The c... View full abstract»

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  • Supporting a product's life cycle utilizing reusable ATML compliant test documentation

    Publication Year: 2015, Page(s):71 - 79
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (958 KB) | HTML iconHTML

    The IEEE SCC20 Automatic Test Markup Language (ATML) standards form a basis for achieving reuse of Automatic Test System (ATS) products causing a reduction in logistic support costs. The process described in this paper builds upon these standards to address a broader scope of the data requirements from a product's life cycle. To date, much of the effort for utilizing these standards has concentrat... View full abstract»

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  • Human-machine interface: A framework for contingency management of complex aerospace systems

    Publication Year: 2015, Page(s):80 - 86
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (6797 KB) | HTML iconHTML

    This paper introduces a novel architecture for human-machine interface focusing primarily on the human aspects as applied to aircraft and unmanned systems. There is a need to explore new human-machine interface strategies stemming from the proliferation over the past years of accidents due to system complexity, failure modes and human errors. Concepts of autonomy establish the foundational element... View full abstract»

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  • Proactively managing obsolescence with test system architecture

    Publication Year: 2015, Page(s):87 - 92
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (938 KB) | HTML iconHTML

    The test equipment life-cycle spectrum has two opposing ends. On one end, test equipment focused toward consumer products often outlives any one of the products that it is charged with testing. On the other end, the aerospace/defense industry demands that test systems work with many types of devices under test (DUTs). Furthermore, the test systems themselves must remain in service and often outliv... View full abstract»

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  • Multiple Test Executives in ATE

    Publication Year: 2015, Page(s):93 - 96
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1001 KB) | HTML iconHTML

    In modern systems there is a desire to create Test Program Sets (TPSs) in multiple languages. However, most Automatic Test Equipment (ATE) is designed with only one test executive in mind and the exclusion of all others. This paper discusses a proven design to allow for Multiple Test Executives (MTE) on a single system. In addition, the test executives are divorced from the operator or maintainer ... View full abstract»

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  • An ideal TPS relational analysis

    Publication Year: 2015, Page(s):97 - 102
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (758 KB) | HTML iconHTML

    The collection and analysis of Test Program Set (TPS) historical data has been a need for developers looking to reduce call-out and cost; and improve diagnostics test times. This paper will discuss the ideal TPS and runtime data required in order to reduce development cost and speed End to End (ETE) runtime by having a simple TPS results historic database. This historic database that we introduce ... View full abstract»

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  • Software plug-ins for flexible test cell automation

    Publication Year: 2015, Page(s):103 - 107
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (856 KB) | HTML iconHTML

    Traditional approaches for test cell automation are inefficient and insufficient for today's fast paced, ever-changing testing requirements. Future test cell environments will utilize software plug-ins that are easily accessible and configurable by test engineers; they will also include automated test systems that provide for easy integration and quick development of these plug-ins. Consequently, ... View full abstract»

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  • An adaptive real-time outlier detection algorithm based on ARMA model for radar's health monitoring

    Publication Year: 2015, Page(s):108 - 114
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (840 KB) | HTML iconHTML

    To guarantee the data quality is of the first importance in the research of monitoring and management of the health of large complex electronic systems such as radars, and tracking the working performance. Influenced by the combined effect of all kinds of interfering factors, the observation series reflecting the health of a radar usually includes variety of outliers and noise, which ought to be d... View full abstract»

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  • Understanding optimal performance of electronic circuitry

    Publication Year: 2015, Page(s):115 - 120
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1727 KB) | HTML iconHTML

    How do we evaluate automatically the optimal performance measurements of electronic circuitry? There are many new and interesting techniques for testing which crop up quite regularly. However, there must be a road map to better understand optimal performance of electronic circuitry. Optimal performance means the circuit is functioning at its' peak performance which means its' “Mean Time Bet... View full abstract»

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